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Viewing 8 of 8 Results

Webinar

Challenges and Solutions for Multi-channel, Multi-domain (Time and Frequency) Analysis

On Demand

Explore solutions for multi-channel, time- and frequency-correlated analysis, with real-world demonstrations of the benefits of these measurements across different RF signals with their own distinct settings.

Application / Industry

Americas

Region

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Webinar

Applying Fast & Frequent Link Health Evaluation for Root Cause Analysis & Real-World Simulation

On Demand

In this webinar you will see several real-world examples where a new tool for evaluating PCIe® link health, the Tektronix TMT4 Margin Tester, enabled root cause analysis or real-world simulation testing for both transmit and receive signal paths in less than an hour.

Datacenter & Telecom

Application / Industry

Americas

Region

WATCH NOW
Webinar

Managing AI Data Center Energy Demands

On Demand

As AI models become more complex, power distribution networks (PDNs) face unprecedented challenges. In this webinar, experts will discuss critical considerations for powering AI infrastructure, including power cooling challenges, power design requirements, and the impact of real-time insights on power quality and usage.

Application / Industry

Americas

Region

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Modern Test Engineer- More Software Developer than Electrical Engineer
Webinar

Modern Test Engineer: More Software Developer than Electrical Engineer

On Demand

Test automation is reshaping how engineers work. Join Rick Kuhlman, GM of Software at Tektronix, to explore how software-first workflows are transforming test strategies in industry, research, and education.

Education

Application / Industry

Americas

Region

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Solutions for electrification projects- Power supply, load, and scenario emulations
Webinar

Solutions for electrification projects: Power supply, load, and scenario emulation

On Demand

Explore how advanced test and emulation strategies accelerate electrification initiatives. In this webinar, we’ll demonstrate how Tektronix instruments can emulate realistic power loads and operating scenarios—whether for EVs, batteries, fuel cells, or renewable systems—so you can prototype, validate, and optimize system behavior with confidence. Presented in Spanish.

Industrial

Application / Industry

Americas

Region

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Forced Current Quasistatic C-V Technique for SiC MOSFETs and MOScaps
Webinar

Forced Current Quasistatic C-V Technique for SiC MOSFETs and MOScaps

On Demand

Learn about Tektronix’s patent-pending low-frequency C-V method for SiC MOS devices, designed to reveal trapped charges overlooked by traditional techniques. Gain deeper insights into device behavior and reliability. Presented with thanks to PowerAmerica for originally hosting this session.

Semiconductor

Application / Industry

Americas

Region

Watch Now
Challenges and Solutions for Multi-Channel, Mixed-Domain Analysis
Webinar

Challenges and Solutions for Multi-Channel, Mixed-Domain Analysis

On Demand

Modern systems often combine multiple RF interfaces, synthesizers, and embedded functions that must be tested together. This webinar explores solutions for multi-channel, time- and frequency-correlated signal acquisition—helping engineers measure, analyze, and interpret complex signals across domains.

Wireless & RF

Application / Industry

Americas

Region

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New!

PCI Express 5.0 Update: Keys to Addressing an Evolving Specification
Webinar

EMC Live: Management of Noise Sources on IoT Designs

On Demand

Chris Loberg and Kenneth Wyatt delve into use cases where poorly designed coupling and/or PCB layout issues lead to decreased receiver sensitivity. We share techniques on how to use an oscilloscope and probing techniques to identify and validate these issues, along with tips on how to minimize the receiver sensitivity impact.

Power Supply Design

Application / Industry

Americas

Region

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DPO70000SX ATI performance oscilloscope

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Webinar

Got Jitter? Diagnosing Power Integrity and Signal Integrity Problems

Are the bit errors in your data caused by the power supply or sources inside the digital channel? Let's end the dispute.

Webinar

SiC/GaN Components: 5 Key Tests

Learn techniques for high power characterization of Silicon Carbide (SiC) and Gallium Nitride (GaN) components.

Learn more