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Watch On Demand

Un approccio diverso e innovativo all’analisi del dominio delle frequenza negli Oscilloscopi
Webinaire

On-Demand Webinar: Un approccio diverso e innovativo all’analisi del dominio delle frequenza negli Oscilloscopi (Italy)

À la demande

Presenteremo il nuovo approccio denominato "SpectrumVu" di Tektronix, di come questo si basi sulla flessibilità offerta dalla tecnologia proprietaria Flexchannel di Tektronix e di come le nuove macchine siano in grado di supportare in modo rapidissimo l'analisi multicanale.

Sans fil et RF

Application / Secteur

Europe, Moyen-Orient et Afrique

Région

Watch On Demand

On-Demand Webinar: Impatto sonde/sistema di misura sul circuito sotto test (Italy)
Webinaire

On-Demand Webinar: Impatto sonde/sistema di misura sul circuito sotto test (Italy)

À la demande

Tektronix presenta alcune novità in ambito sonde che possono essere estremamente interessanti sia per chi si occupa di power integrity sia per chi si occupa di signal integrity su linee seriali ad alta velocità.

Conception de systèmes embarqués

Application / Secteur

Europe, Moyen-Orient et Afrique

Région

Tek|Academy Webinars

Fundamentals of Probing
Webinaire

TekAcademy Webinar: Fundamentals of Probing

À la demande

Oscilloscopes are designed to faithfully measure various signal parameters, but they are only one part of the measurement system. In the means of getting the signal accurately from the device under test (DUT) to the oscilloscope input, the use of a suitable probe is essential. Even though the probe selection is the last consideration, that we usually take for granted, it vitally affects the fidelity of the entire measurement system. The result can be wrong or misleading measurements. Solely connecting a probe to a single test point can affect the behaviour of your PCB design, so that an oscilloscope would only see the distorted version of the actual signal. Thus ensuring a minimum impact on the probed circuit is imperative. In essence, the probe is the first link in the measurement chain and the fidelity relies as much on the probing as the oscilloscope.

Conception de systèmes embarqués

Application / Secteur

Europe, Moyen-Orient et Afrique

Région

Tek|Academy Webinars

Mastering MOSFET I-V Characterization
Webinaire

TekAcademy Webinar: Mastering latest practical solutions for MOSFET I-V characterization

À la demande

Precision DC parameters are crucial for you? A SMU is perfect choice.
Need to overcome special transitional conditions? Some models have a 1 MSa digitizing ADC for fast signal sampling (use it as an oscilloscope).
Multiple SMU channels can be utilized as a Parametric Semiconductor Test System for characterization, verification and optimization of electrical components.
Need to implement automated test scenarios in easy way? Design a complex measurement flow with data analysis using embedded Test Script Language.

Industrie

Application / Secteur

Europe, Moyen-Orient et Afrique

Région

Tek|Academy Webinars

Power Supply Design: Frequency Response Analysis
Webinaire

TekAcademy Webinar: Power Supply Design: Frequency Response Analysis

À la demande

Do you really need a spectrum analyzer for your frequency response analysis? Couldn’t you just use the oscilloscope that you use every day?
In this webinar you will learn basics about Frequency Response Analysis and which solutions you have in order to do it. We will focus on the oscilloscopebased solution.

Efficacité énergétique et IoT

Application / Secteur

Europe, Moyen-Orient et Afrique

Région

Watch On Demand

Webinaire

On-Demand Webinar: PCI Express - Solving Compliance and Validation Challenges for Transmitters and Receivers

À la demande

This on-demand webinar will provide an overview of the methods for solving some of the new test and measurement receiver challenges for PCIE® 4.0 at 16.0 GT/s and PCIE 5.0 at 32.0 GT/s.

Conformité et pré-conformité

Application / Secteur

Europe, Moyen-Orient et Afrique

Région

Watch On Demand

Insights into modern complex Radar & Electronic Warfare measurements
Webinaire

On-Demand Webinar: New Approach to Electronic Warfare / Radar Systems Measurements

À la demande

In this live event, our application expert you will have an overview of how to use Unique Triggers to debug the complex EW / Radar system, Pulse Measurements and Stress testing of Rx.

Sans fil et RF

Application / Secteur

Europe, Moyen-Orient et Afrique

Région

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DPO70000SX ATI performance oscilloscope

Centre de formation

Visitez le centre d'apprentissage pour en savoir plus sur l'utilisation des produits Tek, notamment les oscilloscopes, les multimètres numériques, les analyseurs de spectre, etc.
Webinar

Got Jitter? Diagnosing Power Integrity and Signal Integrity Problems

Are the bit errors in your data caused by the power supply or sources inside the digital channel? Let's end the dispute.

Webinar

SiC/GaN Components: 5 Key Tests

Learn techniques for high power characterization of Silicon Carbide (SiC) and Gallium Nitride (GaN) components.