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Viewing 9 of 28 Results

New!

Webinar

Applying Fast & Frequent Link Health Evaluation for Root Cause Analysis & Real-World Simulation

12/8/2022

9:00 AM - 10:00 AM PT

In this webinar you will see several real-world examples where a new tool for evaluating PCIe® link health, the Tektronix TMT4 Margin Tester, enabled root cause analysis or real-world simulation testing for both transmit and receive signal paths in less than an hour.

Datacenter & Telecom

Application / Industry

Americas

Region

New!

Webinar

When to Use an Oscilloscope vs a DMM

On Demand

DMMs and oscilloscopes are two of the most widely used electrical measurement devices. Both are excellent for testing and diagnosing circuits, but it can be confusing to decide which one is the optimal tool for the job. Join Keithley applications engineer, Liz Makley, for a webinar on when to use each of these fundamental test instruments.

Automotive

Application / Industry

Americas

Region

Webinar

Thought Leadership Series: The Future of Automotive is Electric

On Demand

In this Tek Insights conversation, Cody Gough talks to Denis Solomon, Tektronix Automotive Market Segment Manager, about three key market trends driving the automotive industry including vehicle electrification & batteries, connected car & data, and the autonomous vehicle.

Automotive

Application / Industry

Americas

Region

Webinar

Troubleshooting in the Fast Lane: 100G Lanes for IEEE 802.3ck

On Demand

The IEEE 802.3 Ethernet standard body is readying the release of its fastest electrical standards, a collection of backplane, cable, and Attachment Unit Interface (AUI) specifications for signaling at 100 Gb/s per lane on widths of 1, 2, and 4 lanes. The discussion will include a review of the physical layer specification as well as compliance test and troubleshooting of this important new standard.

Optical Communications

Application / Industry

Americas

Region

New!

Webinar

The Need for Accredited Calibration for Compliance to IATF 16949

On Demand

IATF 16949:2016 is relatively new but included a significant change that provides specific requirements for calibration laboratories and vendors. It can be used by any supplier, large or small, and should be applied throughout the automotive supply chain.

What You'll Learn:

  • The Automotive Task Force Standard of IATF 16949, and how it affects semiconductor manufacturers
  • The requirements for internal and external labs regarding accreditation and other parameters
  • Strategies for creating a smart calibration strategy to pass IATF 16949 audit
  • Little-known factors to consider when selecting an accredited calibration vendor, including data security

Automotive

Application / Industry

Americas

Region

Making High Quality Open Circuit Voltage Measurements
Webinar

Making High Quality Open Circuit Voltage Measurements on Battery Cells

On Demand

Getting accurate open circuit voltage measurements is key to understanding a battery's performance. Join Keithley Applications Engineer, Liz Makley, to discuss what open circuit voltage is and how to get the best measurements possible.

Power Supply Design

Application / Industry

Americas

Region

Live Seminar

Tektronix Innovation Forum 2022 Americas

On Demand

Reserve your spot for our second year of the Global Tektronix Innovation Forum. Join our lineup of speakers across three tracks of content over two days.

Embedded Design

Application / Industry

Americas

Region

Webinar

NEXT GEN TEK

On Demand

Learn more about the 2 Series MSO.

Embedded Design

Application / Industry

Americas

Region

Webinar

Get to Know the 5 Series B MSO

On Demand

Get a complete view of your designs with high-fidelity waveforms, insightful measurements, unique spectrum analysis, and flexible probing solutions with the new 5 Series B MSO.

Power Supply Design

Application / Industry

Americas

Region

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DPO70000SX ATI performance oscilloscope

Learning Center

Visit the Learning Center to learn even more how to use Tek products, including oscilloscopes, digital multimeters, spectrum analyzers and more.
Webinar

Got Jitter? Diagnosing Power Integrity and Signal Integrity Problems

Are the bit errors in your data caused by the power supply or sources inside the digital channel? Let's end the dispute.

Webinar

SiC/GaN Components: 5 Key Tests

Learn techniques for high power characterization of Silicon Carbide (SiC) and Gallium Nitride (GaN) components.