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Viewing 9 of 24 Results

New!

Live Seminar

Tektronix Innovation Forum 2022 Americas

6/14/2022 - 6/15/2022

10:00 AM - 3:00 PM PT

Reserve your spot for our second year of the Global Tektronix Innovation Forum. Join our lineup of speakers across three tracks of content over two days.

Embedded Design

Application / Industry

Americas

Region

New!

Webinar

Get to Know the 5 Series B MSO

On Demand

Get a complete view of your designs with high-fidelity waveforms, insightful measurements, unique spectrum analysis, and flexible probing solutions with the new 5 Series B MSO.

Power Supply Design

Application / Industry

Americas

Region

Next  Level Precision
Webinar

Next-Level Precision: When a DMM is Not Enough

On Demand

Join Keithley Applications Engineer, Liz Makley, to learn when you should consider more sensitive equipment, and discuss the tricks and pitfalls when moving to sensitive equipment.

Production

Application / Industry

Americas

Region

Webinar

Physical Layer Characterization of PCI Express 6.0 PAM4 SerDes Designs

On Demand

Join Tektronix in a discussion of the latest Rev 1.0 requirements for validation of a 6.0 capable SerDes including SNDR and RLM measurements of transmitters, stressed eye calibration required for receiver jitter tolerance-based validation, and enhanced and newly defined measurement methods.

Datacenter & Telecom

Application / Industry

Americas

Region

Calculating ROI for a Smarter Calibration Strategy
Webinar

Calculating ROI for a Smarter Calibration Strategy

On Demand

Tektronix expert Alek Arzdorf will share his extensive semiconductor calibration program management experience to help you understand how to calculate the ROI of your program, how to identify the gaps, and how to identify new strategic opportunities for reducing calibration time.

Calibration & Testing Service

Application / Industry

Americas

Region

The Cost of Poor Quality Calibration On-Demand Webina
Webinar

The Cost of Poor Quality Calibration

On Demand

Our calibration expert Chris Ten Hoeve will discuss the pitfalls of low quality calibration and how to avoid them. As your lab looks to ramp up production after COVID-19, make sure you are not making decisions that can save money in the short term, but cost you in the long run.

Calibration & Testing Service

Application / Industry

Americas

Region

Surviving an Audit Preparing Your Lab for Success
Webinar

Surviving an Audit: Preparing Your Lab for Success

On Demand

By attending this webinar, you will learn what you should be doing before your next audit. Whether you are facing internal or external audits, there are steps you can take to make your next audit less stressful.

Calibration & Testing Service

Application / Industry

Americas

Region

Webinar

AS9100 – Optimizing Test & Measurement Equipment Calibrations for Passing Audit

On Demand

Gain guidance and learn from AS9100 experts about the standard, planned revisions, and insights specific to calibration, as well as common challenges, best practices, and real-world examples of calibrations that pass audit by Tektronix AS9100 Auditor and Calibration Lab Manager Guy Robinson.

Calibration & Testing Service

Application / Industry

Americas

Region

Increase Measurement Confidence: 7 Proven Methods
Webinar

3 Challenges of RF Sensing for System Design and Integration

On Demand

Tektronix Product Manager Dylan Stinson reviews technologies for RF sensing, providing an overview of the limitations and advantages of traditional monitoring receivers, low-cost SDRs, and real-time spectrum analyzers.

Aerospace & Defense

Application / Industry

Americas

Region

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DPO70000SX ATI performance oscilloscope

Learning Center

Visit the Learning Center to learn even more how to use Tek products, including oscilloscopes, digital multimeters, spectrum analyzers and more.
Webinar

Got Jitter? Diagnosing Power Integrity and Signal Integrity Problems

Are the bit errors in your data caused by the power supply or sources inside the digital channel? Let's end the dispute.

Webinar

SiC/GaN Components: 5 Key Tests

Learn techniques for high power characterization of Silicon Carbide (SiC) and Gallium Nitride (GaN) components.