Unlocking the Potential of New Materials
Today’s consumers are demanding smaller, lighter, cheaper, and more capable electronics than ever before with ever-longer operating times. To address these conflicting demands, researchers need to develop new materials, miniaturize existing devices, and enhance device efficiencies. The effort to boost device density and performance while reducing power consumption has led to research into graphene and other two-dimensional (2-D) solids with high carrier mobility, as well as organic semiconductors and nano-scale devices.
High efficiency batteries based on new electrolyte and electrode materials will be critical to extending operating times. Advanced fuel cell technologies designed to make the next generation of electric vehicles more efficient and affordable are also under investigation. The desire for greener power generation solutions is spurring investigation into higher temperature superconductors and the power semiconductors essential to power conversion. Materials like gallium arsenide (GaAs) and silicon carbide (SiC) will be crucial to future power transmission technologies. Materials research is also central to boosting the conversion efficiency and power output of solar cells. Boosting the efficiency of laser diodes to increase data transmission capacity requires studying new materials and structures.
Ultra-sensitive measurements are central to materials characterization, from measuring femtoamp-level leakage currents to micro-ohm-level resistance measurements for assessing the resistivity of high carrier mobility materials. On the other end of the scale, characterizing the latest insulators often entails teraohm measurements. Superconductor or nanomaterials research performed at near 0⁰K requires reducing the level of power applied to prevent self-heating, which can affect the device’s or material’s response or damage it. That calls for sourcing very low DC currents or current pulses.
Hall Effect Measurements for Materials Characterization
Learn why Hall effect measurements are so widely used in materials characterization applications.
Ultra-High Resistance and Resistivity Measurements
Discover why background currents can complicate measuring resistance and resistivity accurately.
Performing Cyclic Voltammetry Measurements
This application note outlines using a potentiostat to perform cyclic voltammetry with a built-in test script and electrochemistry translation cable accessory kit.
KickStart Instrument Control Software
Learn how to characterize your devices and materials quickly and easily without programming
The 2182A/622X combination is ideal for resistance, pulsed I-V, and differential conductance measurements, and nanotechnology applications. Measure resistance while minimizing the power input to avoid error-generating self-heating and potential destruction of the test sample.
The 4200A-SCS is a fully integrated parameter analyzer that provides synchronized insight into I-V, C-V), and ultra-fast pulsed I-V electrical characterization. This system also performs automated van der Pauw resistivity measurements.
The 6485 Picoammeter can measure currents from 20 fA to 20 mA at speeds up to 1000 readings per second. The 6487 Picoammeter/Voltage Source adds a 500 V source and a damping function to perform insulation resistance measurements.
Sensors and Semiconductors Testing Materials for Tomorrows Smart Devices
Listen to our panel discuss three measurement applications where the properties of new materials have influenced how measurements are made.
Tips and Techniques to Simplify MOSFET-MOSCAP Device Characterization
This webinar presents a new process that makes characterization and parameter extraction easier and quicker. We'll be discussing the extraction of common parameters as well as which tests to run to …
Use Hall Effect Measurements for the Characterization of New and Existing Materials
The webinar covers semiconductor and other material characterization using Hall Effect and van der Pauw measurements for calculating sample resistivity and mobility among other parameters as well as …