Keithley 2010 Series: 7.5 Digit Multimeter with Scanning
The 7.5 digit 2010 Series Low Noise Multimeter combines cost effectiveness and high resolution with the throughput and accuracy needed for high speed DMM applications such as testing precision sensors, transducers, A/D and D/A converters, regulators, references, connectors, switches, and relays. Based on the same high speed, low noise A/D converter technology as the 2000, 2001, and 2002 Series, the 2010 Series adds four unique resistance measurement functions that make it ideal for characterizing the resistance, linearity, or isolation of contacts, connectors, switches, or relays.
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|100nV rms noise floor||Characterizes low voltage components quickly and accurately.|
7ppm DCV repeatability
|Enhances confidence in the accuracy of your measurements.|
|Low-power ohms measurement mode||Measures low resistances with source current as low as 100μA, minimizing device self-heating.|
Dry circuit test function.
|Controls the test voltage when making resistance measurements on contacts or connectors to avoid puncturing any oxides or films that may have formed.|
|Offset compensated ohms function||Eliminates thermal effects that can create errors in low-level resistance measurements in system environments.|
|10Ω resistance measurement range||Delivers more precise measurements of low resistances.|
|15 measurement functions include support for RTD and thermocouple temperature measurements||Minimizes added equipment costs when building systems.|
|Optional plug-in switch cards for multipoint measurements||Simplifies creating a self-contained, multipoint switch and measure solution.|
|View Datasheet||2000-SCAN||SCANNER BOARD|
|View Datasheet||2001-TCSCAN||THERMCPL/GEN PURPOSE SCAN CARD|
|View Datasheet||4288-1||SINGLE FIXED RACK MOUNTING KIT|
|View Datasheet||4288-2||DUAL FIXED RACK MOUNTING KIT|
|View Datasheet||5805||KELVIN PROBES, 0.9M (3FT)|
|View Datasheet||5805-12||KELVIN PROBES, 3.6M (12 FT)|
|View Datasheet||KPCI-488LPA||LOW PROFILE IEEE-488 INTERFACE BOARD|
|View Datasheet||KUSB-488B||IEEE-488.2 USB-TO-GPIB INTERFACE ADAPTER|
Control your instruments from your PC
Drive innovation through faster test & measurement with KickStart Software. KickStart instrument control software for the PC enables quick test setup, text execution and data visualization. By plotting data immediately and offering quick statistical summaries of the data in the reading table, KickStart allows you to gather insights faster and make the decisions you need to make.
- Run tests on multiple types of bench instruments independently or simultaneously
- Auto export data for long term logging
- Replicate tests quickly using saved test configurations
- Use built-in plotting, comparison and statistical tools to quickly discover measurement anomalies and trends
- Configure tests using simulated instruments and swap in real instruments when available
Automated Control from Lab to Fab
Keithley's Automated Characterization Suite (ACS) offers complete control of your equipment. Whether you need to control a few instruments on your bench, or automate an entire test rack for production, ACS offers a flexible, interactive environment for device characterization, parametric test, reliability test, and simple functional test.
- Perform simple 1-off tests or build complex project trees
- Code with Python inside ACS for unlimited flexibility and control
- Manual or automated wafer prober control
- Data management and statistical analysis capabilities