Keithley Electrometers for Ultra-High Resistance/Ultra-Low Current Measurements

Exceptional measurement integrity for a range of functions

Choose from three sensitive options for precision high resistance and low current measurements. The 5½-digit Model 6514 and Model 6517B Electrometers offer 1fA sensitivity, >200TΩ input impedance on voltage measurements, and charge measurements down to 10fC. The 6½-digit Model 6430 Sub-Femtoamp Remote SourceMeter SMU Instrument can measure current with 1aA sensitivity. Its low noise and drift performance make it ideal for research on single electron devices, highly resistive nanowires and nanotubes, polymers, and electrochemical applications.

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Price starting from
US $5,570 - US $15,900
LIST PRICE
US $5,570
Current
Voltage
Resistance
Voltage
Charge
Source

100aA - 20mA

10µV - 200V

10mΩ - 200GΩ

10µV - 200V

10fC - 20μC

LIST PRICE
US $8,270
Current
Voltage
Resistance
Voltage
Charge
Source

100aA - 20mA

10µV - 200V

100Ω - 10PΩ

10µV - 200V

10fC - 2μC

0 - ±1000V

LIST PRICE
US $15,900
Current
Voltage
Resistance
Voltage
Source

10aA - 100mA

1µV - 200V

1µΩ - >20TΩ

1µV - 200V

0 - ±200V
0 - ±100mA

Features

Benefits

Extremely low noise (0.4fAp-p for 6430, <1fA for 6517B and 6514) Ensures more accurate measurements of the extremely low currents common in device and materials research.
Resistance measurements up to 1016Ω (6517B) Measures resistance on ultra-high resistance materials and insulators accurately.
Remote PreAmp can be located at the signal source (6430) Allows making a direct or very short connection to the signal source, minimizing noise sources such as cable noise.
Low burden voltage Eliminates errors that affect the accuracy of low current measurements.
Built-in ±1kV voltage source with sweep capability (6517B) Simplifies performing leakage, breakdown, and resistance testing, as well as volume (Ω-cm) and surface resistivity (Ω/square) measurements on high resistivity materials.
Optional Model 8009 Resistivity Chamber for measuring volume and surface resistivities of sample materials (6517B) Protects you from contact with potentially hazardous voltages —opening the lid of the chamber automatically turns off the instrument’s voltage source.
High measurement speeds even on low-level signals Allows faster low-level component testing.
Programmable digital I/O and built-in interfaces Simplifies building automated component test systems.
Data SheetAccessoryDescription
1681 CLIP-ON TEST LEADS
2000-BENCHKIT MULTI MODEL BENCH CONVERSION KIT
237-ALG-15 LOW NOISE TRIAX CABLE 15M(50FT)
237-ALG-2 LOW NOISE TRIAX CABLE
237-BNC-TRX 2-SLOT M BNC TO 3 LUG F TRIAX
237-TRX-NG TRIAX 3S M/3L F GRD DISC
4288-1 SINGLE FIXED RACK MOUNTING KIT
4288-2 DUAL FIXED RACK MOUNTING KIT
4288-5 RACK KIT
4804 MALE BNC TO FEMALE TRIAX ADAPT
6517-ILC-3 INTERLOCK CABLE, 4 PIN
6517-TP TEMPERATURE PROBE
6521. SCANNER CARD
7009-5 5 FT. SHIELDED RS-232 CABLE
8009 RESISTIVITY TEST FIXTURE
8607 1KV SOURCE BANANA CABLES
TitleType
Keithley Instrumentation for Electrochemical Test Methods and Applications

This Application Note discusses electrochemistry disciplines in which Keithley instrumentation is used.

Application Note
Touch, Test, Invent with the Next Generation Current and Voltage Source-Measure InstrumentsFact Sheet
Maximize Speed and Throughput for Semiconductor MeasurementsPoster
Maximize Speed and Throughput for Semiconductor Measurements Using Source Measure Units (SMUs)Poster
#1138 Switching in Multipoint TestingApplication Note
Making High Resistance Measurements on Small Crystals in Inert Gas or High Vacuum w/ the Model 6517AApplication Note
#2615 Determining Resistivity and Conductivity Type using a Four-Point Collinear Probe and the Model 6221 Current Source

This application note explains how to measure resistivity and determine conductivity type of semiconductor materials with a four-point collinear probe and the 6221 DC and AC Current Source.

Application Note
#315 Capacitor Leakage Measurements Using a Model 6517A ElectrometerApplication Note
Methods to Achieve Higher Currents from I-V Measurement EquipmentApplication Note
Device Characterization Techniques Using Keithley SourceMeter Instruments with LabTracer SoftwareApplication Note
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