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2601B-PULSE 10 µsec Pulser/SMU

The System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test.
Base Price
US $16,700 +
Channels

1 Pulser / 1 SMU

Pulser V/I Range

1 μA - 10 A
1 μV - 10 V

SMU V/I Range

100 fA - 10 A
100 nV - 40 V

Accuracy

Pulser: 0.05%
SMU: 0.015%

Max Speed

1 M readings/s

Achieve high pulse fidelity without manual pulse tuning

The 2601B-PULSE’s control loop system eliminates the need to manually tune for load changes up to 3 μH, ensuring your pulse has no overshoot and ringing when outputting pulses from 10 μs up to 500 μs at any current level up to 10 amps. With pulse rise times < 1.7 μs, you can properly characterize your device or circuit under test.

  • Output 10 A @ 10 V with a 10 μs pulse width
  • Pulse rise time <1.7 μs to characterize with confidence
  • High fidelity pulse output without tuning at any current level
KI10A RiseTime
2601B Pulse Pulser Plus SMU

Incorporates the functionality of a fast pulser and SMU in one instrument

The 2601B-PULSE adds pulser functionality to the superior measurement integrity, synchronization, speed, and accuracy you know from the industry-leading Keithley 2601B SMU instrument.

  • Pulser 0.05% basic measure accuracy with 1 MS/s digitizing
  • SMU 100 nA low current range with 100 fA sensitivity
  • Rear panel BNC connections for quick cable setup

Embedded scripting and connectivity for unmatched production throughput

Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion of up to 32 TSP-Link nodes for creating high-speed, SMU-per-pin parallel testing without a mainframe.

  • Eliminates time-consuming bus communications to and from the PC
  • Advanced data processing and flow control
  • Connect up to 32 TSP-Link nodes
  • Reconfigure easily as test requirements change
2601B PUlse Embedded Scripting
Model Channels Max Current Source/Measure Range Max Voltage Source/Measure Range Measurement Resolution (Current / Voltage) Power List Price Configure And Quote
2601B-PULSE 1 10 A 40 V 100 fA / 100 nV Pulser: 100 W instantaneous
SMU: 200 W instantaneous
US $16,700 Configure & Quote
Model Channels Max Current Source/Measure Range Max Voltage Source/Measure Range Measurement Resolution (Current / Voltage) Power List Price Configure And Quote
2601B-PULSE 1 10 A 40 V 100 fA / 100 nV Pulser: 100 W instantaneous
SMU: 200 W instantaneous
US $16,700 Configure & Quote
2601B-Pulse LIDAR

Laser Diode (VCSEL) Production Test for ToF/LIDAR Applications

The ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 μs Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL arrays, and laser diode modules. SMUs provide the most cost-effective LIV instrumentation with high system synchronization and throughput.

  • Programmable pulse current source up to 10 A and 10 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 100 fA
  • Built-in TSP® processing capability reduces PC-instrument bus communication

Failure Analysis and Quality Assurance

Semiconductor companies and semiconductor researchers are constantly looking for ways to make devices fail to prevent them in the field. Semiconductor failure analysis (FA) engineers spend countless hours trying to understand why a device failed and how it can be prevented in the future.

  • Streamline FA processes with SMU and Pulse testing
  • Digital I/O to trigger external IR cameras
  • Built-in timer function with 1 μs resolution and ±100 ppm accuracy.
2601B-Pulse Pulsed DC I-V LED Characterization

Simplified Pulsed/DC I/V Characterization of LEDs

The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.

  • Programmable current source up to 10 A and 10 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 100 fA
  • 1 Megasample/second digitizers for fast source and measure data collection
  • Built-in TSP processing capability reduces PC-instrument bus communication

On Wafer Semiconductor Testing

Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.

  • Built-in TSP processing capability reduces PC-instrument bus communication
  • TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments
2601B-Pulse On Wafer Semiconductor Testing

Keithley KickStart Instrument Control Software. No Programming Required.

Making measurements is easy with KickStart. Characterize your devices and materials quickly and easily without programming. Visualize real-time results in graphical and tabular format. Export data tables or graphs for quick reporting or additional analysis in Excel.

  • Create single or sweep pulse tests quickly
  • Generate linear, log, list, and dual sweeps of voltage and current source with simultaneous measurement
  • I-V characterization application to support up to 4 source measure unit (SMU) instruments
  • GPIB, USB, Ethernet connectivity on Windows OS
Keithley Kickstart IV Characterization Plot

Automated Control from Lab to Fab

Keithley's Automated Characterization Suite (ACS) offers complete control of your equipment. Whether you need to control a few instruments on your bench, or automate an entire test rack for production, ACS offers a flexible, interactive environment for device characterization, parametric test, reliability test, and simple functional test.

  • Perform simple 1-off tests or build complex project trees
  • Code with Python inside ACS for unlimited flexibility and control
  • Manual or automated wafer prober control
  • Data management and statistical analysis capabilities

Start Automating

FREE script developer environment to maximize instrument performance

Test Script Builder (TSB) is a software tool that simplifies building test scripts for Keithley’s Test Script Processor (TSP®)-enabled instruments.

  • Send commands and receive responses from the instrument
  • Create, manage, and run user scripts
  • Debug scripts
  • Import factory scripts to view or edit and convert to user scripts

Download TSB Software

Keithley Test Script Builder
Accessory 2600-BAN
Datasheet Description
BANANA JACK INTERFACE CABLE
Accessory 2600-KIT
Datasheet Description
2600 SERIES SCREW TERMINAL CONNECTOR KIT
Accessory 2601B-PULSE-CA1
Datasheet Description
2601B-PULSE 1.2 meter 50 Ohm BNC to BNC cable kit
Accessory 2601B-PULSE-CA2
Datasheet Description
2601B-PULSE 3 meter 50 Ohm BNC to BNC cable kit
Accessory 2601B-PULSE-CA3
Datasheet Description
2601B-PULSE 3.0 meter 15 Ohm BNC to BNC cable kit
Accessory 4299-1
Datasheet Description
HEAVY DUTY RACK MOUNT KIT 2600 SERIES SINGLE UNIT
Accessory 4299-2
Datasheet Description
HEAVY DUTY RACK MOUNT KIT FOR TWO UNITS
Accessory 7078-TRX-GND
Datasheet Description
3-SLOT MALE TRIAX TO BNC ADAPTER (GUARD REMOVED)
Accessory 8101-PIV
Datasheet Description
PIV DEMO FIXTURE
Accessory KPCI-488LPA
Datasheet Description
LOW PROFILE IEEE-488 INTERFACE BOARD
Accessory KUSB-488B
Datasheet Description
IEEE-488.2 USB-TO-GPIB INTERFACE ADAPTER
Datasheet Accessory Description
View Datasheet 2600-BAN BANANA JACK INTERFACE CABLE
View Datasheet 2600-KIT 2600 SERIES SCREW TERMINAL CONNECTOR KIT
View Datasheet 2601B-PULSE-CA1 2601B-PULSE 1.2 meter 50 Ohm BNC to BNC cable kit
View Datasheet 2601B-PULSE-CA2 2601B-PULSE 3 meter 50 Ohm BNC to BNC cable kit
View Datasheet 2601B-PULSE-CA3 2601B-PULSE 3.0 meter 15 Ohm BNC to BNC cable kit
View Datasheet 4299-1 HEAVY DUTY RACK MOUNT KIT 2600 SERIES SINGLE UNIT
View Datasheet 4299-2 HEAVY DUTY RACK MOUNT KIT FOR TWO UNITS
View Datasheet 7078-TRX-GND 3-SLOT MALE TRIAX TO BNC ADAPTER (GUARD REMOVED)
View Datasheet 8101-PIV PIV DEMO FIXTURE
View Datasheet KPCI-488LPA LOW PROFILE IEEE-488 INTERFACE BOARD
View Datasheet KUSB-488B IEEE-488.2 USB-TO-GPIB INTERFACE ADAPTER