PCI Express Gen5 Automated Multi-Lane Testing
Comprehensive characterization of high-speed links such as PCI Express® require performing measurements of the Transmitter (Tx) and Receiver (Rx) across multiple differential lanes for the link under test. This presents challenges for a fully automated test environment given the need to physically change coaxial connections between the different channels. Incorporating an RF switch matrix allows multi-lane testing with physical connection changes and enables automation software testing. This paper describes how to expand the test environment for automated multi-lane testing using an RF switch from Mini-Circuits® and can be extended to other RF switch modules and technologies.