Keithley Optical SourceMeter® Instruments
Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.
- Fiber Alignment Photodiode Meter 2502: High speed analog output enables LIV testing at the fiber alignment stage.
- Pulse Laser Diode Test System with optional Integrating Sphere 2520/KIT1: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
- TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler.
|Active temperature control||Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems.|
|50W TEC Controller||Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions.|
|Fully digital P-I-D control||Provides greater temperature stability and can be easily upgraded with a simple firmware change.|
|Autotuning capability for the thermal control loop (2510-AT)||Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients.|
|Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C)||Covers most of the test requirements for production testing of cooled optical components and sub-assemblies.|
|Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors||Works with the types of temperature sensors most commonly used in a wide range of laser diode modules.|
|AC Ohms measurement function||Verifies the integrity of the TEC device.|
|4-wire open/short lead detection for thermal feedback element||Eliminates lead resistance errors on the measured value, reducing the possibility of false failures or device damage.|
|Measuring Laser Diode Optical Power with an Integrating Sphere|
This white paper offers an overview on using an integrating sphere to measure the optical power of radiant sources in a production environment.
|Pulse Testing of Laser Diodes||Whitepaper|
|Optimizing TEC PID Coefficients Automatically with the Model 2510-AT||Application Note|
|#2214 High-Throughput DC Production Test of Telecommunications Laser Diode Modules||Application Note|
|Pulsed LIV Testing of Low Power Optical Devices with a Model 2520||Application Note|
|Keithley Pulse Solutions|
This guide is designed to help you identify Keithley solutions that include pulse sources that might suit your application's requirements.