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Webinar

On-demand Webinar : Beyond AI-Copy-Paste Engineering: Advanced AI-Integration Success …

Most engineers have tried AI by copying code snippets into their workflows. Useful—but that’s not where the real value …
アプリケーション・ノート

LVDS: Low Voltage Differential Signaling Guide & Automated Measurements

Low Voltage Differential Signaling (LVDS) is a popular signaling system for applications requiring high speed data …
アプリケーション・ノート

How to Perform DC Current Gain Testing on Bipolar Junction Transistors with a Two …

Read how the KickStart Software IV Characterizer App provides a simple, reliable way to measure BJT DC current gain (hFE …
ホワイトペーパー

High-Efficiency Power Supply Testing for Next-Generation Data Centers

This white paper discusses how the Tektronix line of EA Elektro-Automatik products combine extreme efficiency (up to 95 …
ホワイトペーパー

雑音指数とは？仕組みとノイズ測定方法 | テクトロニクス

雑音指数測定の重要性 雑音（ノイズ）、またはより具体的には電子系における荷電粒子のランダムな運動によって引き起こされる電圧および電流の変動は、すべての電子システムに存在します。ノイズとその伝播の仕組みを理解することは …
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Video Asset

アプリケーション・ノート

2シリーズMSOのリモート制御／アクセス

はじめに リモート・ラーニング、在宅勤務、ハイブリッド・ワーク環境は、ここ数年、多くの教育機関、企業で新しい標準となっています。この新しいリモート・ワーク文化は、機器のリモート制御、機器の画面のチーム・メンバーとの共有 …
アプリケーション・ノート

Synchronizing Parallel Testing with the MP5000 Series

This application note demonstrates how to use the MP5000 Series Modular Precision Test System to synchronize six …
アプリケーション・ノート

How to Choose and Apply Source Measure Unit SMU Instruments

The popularity of souce measure unit (SMU) instruments has increased rapidly as more people discover that their tightly …
Webinar

Migrating from Silicon to Silicon Carbide in Power Designs

Ready to make the switch from Silicon to Silicon Carbide? Join experts from Tektronix, Wolfspeed, and PE Systems for a 3 …
Webinar

Migrating from Silicon to Silicon Carbide in Power Designs

Ready to make the switch from Silicon to Silicon Carbide? Join experts from Tektronix, Wolfspeed, and PE Systems for a 3 …
Webinar

Migrating from Silicon to Silicon Carbide in Power Designs

Ready to make the switch from Silicon to Silicon Carbide? Join experts from Tektronix, Wolfspeed, and PE Systems for a 3 …
アプリケーション・ノート

Accelerate Automation: Effortless Script Generation with TSP Toolkit

Adopting a new instrument or command set can be daunting and pose a unique set of challenges. Engineers, researchers …
アプリケーション・ノート

Simplifying Long-Term Reliability Testing with the KickStart Data Logger App

This application note shows how to easily automate long term data acquisition and analysis with the KickStart Data …
Product Demo

De-Embedding PCB Cable and Fixture Effects for Accurate Eye Diagram Measurements with …

This video demonstrates how you can easily de‑embed cables, connectors, and PCB traces, add virtual test points, and …
Resource Type

Video Asset

Resource Type

Video Asset

Resource Type

Video Asset

Blog

Understanding ENOB (Effective Number of Bits) in Test and Measurement Equipment

ENOB — the Practical Measure of ADC Accuracy Leading-edge electronic systems are becoming faster, denser, and more …
パンフレット

High Performance Computing Expanded Solutions

Discover how Tektronix solutions streamline high‑performance computing workflows with unified tools for high‑speed I/O …

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