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應用摘要

Forced Current Quasistatic C-V Method for SiC Devices

Forced Current Quasistatic C-V Method for SiC Devices
Blog

什麼是示波器?

示波器 (先前稱為示波記錄器,非正式說法包括 scope、oscope 或 o-scope) 儀器會以圖形方式顯示電子訊號,並顯示訊號隨時間出現的變化。它透過與感應器連接來測量這些訊號,感應器是一種對聲音 …
規格摘要表

Enhanced Instrument Automation with Test Script Processor Technology

Learn about the TSP command set and programming language and the TSP Toolkit test script editor.
應用摘要

Keithley Instrumentation for Electrochemical Test Methods and Applications

This application note discusses a variety of electrochemical applications, including voltammetry, low and high …
應用摘要

Measuring MOSFET Gate Charge with the 4200A-SCS Parameter Analyzer

This application note describes how to measure gate charge on a MOSFET based on the JEDEC Gate Charge Test Method using …
Blog

Simulate Batteries with the EA Battery Simulator

As the demand for reliable and efficient battery technologies grows, so does the need for advanced battery simulation …
應用摘要

Utilizing Segment Arb Waveform for High Speed IV Measurements Using the 4225-PMU

This application note describes the Segment Arb waveform feature of the 4225-PMU Ultra-Fast Pulse Measure Unit.
規格摘要表

TekScope PC Waveform Analysis Flyer

TekScope software puts the analysis capabilities of Tektronix oscilloscopes on your PC.  This flyer offers information …
Blog

RSA7100B Wideband RF Signal Analyzer and Streaming Recorder Targets Challenging Real …

The new RSA7100B wideband RF signal analyzer and streaming recorder is now available, giving engineers a powerful …
Video

DMM6500 Trailer

Analyze graphs and trends directly on the DMM6500 touchscreen
白皮書

Compensating for Series Inductance in Shunt Resistors for High Frequency Measurements

Learn about a technique for defining a simple RC filter to enable shunt-based current measurements beyond 1 MHz.
Blog

Challenges in High-Speed Pulse Testing

High-speed pulse testing is at the forefront of modern research, playing a critical role in areas such as Photonic …
應用摘要

Long Term Data Collection and Breakdown Testing Using the 4200A-SCS Parameter Analyzer

This application note provides an overview of the Data Compression feature introduced in Clarius V1.14 for the 4200A-SCS …
應用摘要

Forced Current Quasistatic C-V Methods for SiC Devices

This application note describes the Force-I QSCV technique and explains how to use the tests with Clarius Software V1.14 …
Blog

Bench Power Supply for Your Application

A benchtop DC power supply is a standard piece of test and measurement equipment used by electrical engineers and …
Blog

DC Bench Power Supply Fundamentals

DC Bench Power Supplies - 6 Things You Must Know Bench power supplies have always been a staple of the test engineer’s …
Blog

Calibration Methods & Best Practices: Ensuring Quality and Efficiency

As a Tektronix we understand the critical role that calibration plays in maintaining the accuracy and reliability of …
應用摘要

有效的位元測試評估數位化儀器的動態效能

不論您是數位化系統的設計者或購買者,皆需要一些方法來判斷實際的數位化效能。
白皮書

Achieve Higher Vertical Resolution for More Precise Measurements

Introduction Higher vertical resolution has long been a goal of oscilloscope designers, driven by the …
Blog

Ensuring Measurement Compliance in the Semiconductor Industry

Introduction In the semiconductor industry, precision and accuracy are paramount. Engineers across various …

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