Semiconductor test engineers are under constant pressure to increase throughput and coverage without compromising measurement accuracy or device safety. Adding channel count can help address throughput -- by testing multiple DUTs in parallel, and also coverage. However, several engineering challenges stand out as engineers scale multi-channel, high-precision test systems:
• Managing more channels …
ATE or the Automotive Testing Expo is a leading international trade show for every aspect of automotive testing, development, and validation technologies, held annually in Detroit, Shanghai, and Stuttgart. ATE is important to the industry because it gives attendees the ability to see the latest and greatest products and solutions under one roof for the various technologies and services available …
