High Speed Serial Communications
High-speed digital standards are quickly evolving to support the performance demands of our data driven world. Next generation serial standards and data communication requirements are bringing new test challenges, pushing the limits of today’s compliance and debug tools. From design and simulation, analysis, debug, and compliance testing, Tektronix provides advanced, automated measurement solutions to optimize performance, speed up validation cycles and accelerate time-to-market.
- SERIAL STANDARDS
- PCI Express (PCIe)
- DATA COMMUNICATIONS TECHNOLOGIES
- 100G Optical and Electrical TX/RX Testing
- 400G PAM4 Testing
- Coherent Optical
- ADVANCED MEASUREMENTS
- Jitter Measurement and Timing Analysis
- Serial Data Link Analysis (SDLA)
- Signal Integrity
Accelerate PCIe, SAS, SATA Test and Debug
Keeping pace with the next generation of data rates and storage standards requires end-to-end solutions that can scale to 32Gb/s while providing current-gen capabilities.
Discover how to accelerate your design testing and debug.
Consumer Standards over Type-C
The Type-C connector provides consolidation of consumer standards USB 3.1, DisplayPort 1.4, and Thunderbolt. This translates to new design challenges making it difficult to keep design costs low while maintaining optimal electrical margins on your products.
Discover how to tackle these new challenges.
e-Guide to High Speed Interface Standards
This FREE e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. You get quick access to technical resources that will help you understand design challenges and pick the right solution for your test needs.
PCI Express® Transmitter PLL Testing — A Comparison of Methods
There are several methods of measuring PLL loop response, based on the type of test instrumentation used. As expected, the various methods trade off test accuracy, test speed (throughput), ease of us...
Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces. Included is a test and characterizati...
High Speed Interface Standards
This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical ...
Fast+ Efficient Solutions for DVI Conformance Measurement Challenges
Tektronix provides all the DVI measurement solutions you need, ranging from high-bandwidth digital phosphor oscilloscopes (DPO) to probes to application-specific software. Tektronix has solved tough m...
Probing Tips for High Performance Design and Measurement
When a high performance system or component needs to be verified, it often requires attaching an oscilloscope probe. For high speed circuits, the effect of attaching a probe often cannot be ignored. ...
Remote Head Acquisition Improves High Speed Serial Measurement
As high speed serial data rates continue to increase, the need to maximize margin in measurements increases. Coaxial cables, even good quality ones can impact the measurement margin. Remote heads for ...
Demystify MIPI D-PHY and C-PHY Transmitter and Receiver Physical Layer Test
During this webinar, you'll gain an understanding of MIPI test challenges for both MIPI high-speed physical layers. You'll also get useful tips and technical insights into characterizing and validatin...
How to Address Your Toughest Serial Bus Design Challenges with EDA and Measurement Correlation
This Tektronix webinar will teach engineers how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using the DPO/MSO70000 Series Oscillo...