Download Manuals, Datasheets, Software and more:




Using SiC and GaN for your power conversion design?

Design a better product. Get to market faster.

Faster time to market for your power conversion designs

Market trends like SiC and GaN introduce new complexities into your power conversion circuits with faster switching speeds to get reduction in passive (induction and capacitance) component sizes, requiring the need to be precise in circuit timing. You need to deal with higher sensitivity for gate threshold voltage and timing. You also need a more robust PCB design for EMI/EMC issues due to higher switching frequencies.

Performing double pulse tests on SiC and GaN power devices

Double Pulse Testing is the standard method for measuring the switching parameters of MOSFETs or IGBT power devices. Historically, setting up and performing these measurements has been a time-consuming manual process.

Oscilloscopes are used to make energy and timing measurement per industry standards. The Wide Bandgap Double Pulse Test application (Option WBG-DPT) automates standard measurements on 4, 5 or 6 Series MSOs to accurately analyze the switching and reverse recovery energy of a switching device (MOSFET, IGBT). The application provides edge conditioning and navigation designed especially for double-pulse testing on wide bandgap devices. Measurements may also be controlled using programming commands.

A signal source is also required, and the AFG31000 Arbitrary/Function Generator is an excellent source of gate drive signals for double-pulse testing. It offers a built-in software application that facilitates double pulse testing right from its touchscreen interface.

These automated applications reduce test times, increase confidence, and provide flexibility.

Wide Bandgap measurements being performed on double pulse test waveforms

Wide Bandgap measurements being performed on double pulse test waveforms

Overcome high common mode voltages

Floating differential measurements (such as high-side Vgs) are difficult or impossible to make due to high frequency (fast turn on and turn offs), and the presence of high common mode voltages (such as Vds) because oscilloscope probes do not have sufficient common mode rejection at high bandwidth. The poor common mode rejection leads to the measurement being dominated by the common mode error instead of the actual differential signal.

Tektronix has the only solution offering an isolated probe (ISOVu) that does not de-rate with frequency at the operating requirements of GaN and SiC devices, allowing you to make accurate differential measurements. This allows you to precisely calculate and prove conduction losses, dead time losses, switching losses. Additionally, if you are not using an integrated gate driver, the ability to make floating differential measurements allows you to precisely measure and control dead-time for turn-on and turn-off of your device. You can also now avoid overestimation of high-frequency emissions from power converters due to the transient voltage (dv/dt) and current generated during hard switching.


Overcome common sources of measurement error using IsoVu.

Simultaneously measure multiple control and timing signals

With faster switching frequencies, you need to simultaneously monitor multiple signals while working on controls and the timing circuit for the power converter (for e.g. high side Vgs, low side Vgs, high side Vds, low side Vgs, Id, IL and Iload, control signals etc.). You also need to measure low voltage signals (Vgs) signals in the presence of high voltage signals (Vds). You need an oscilloscope with a high channel count and high vertical resolution.


Measurement points for time and control signals.

Faster automated power measurements


Switching loss shows power dissipation in a FET. Waveforms are annotated with color-coded markers showing the measurement regions for Ton, Toff, and Total cycle, corresponding to values in the results badge. Controls in the results badge let you easily traverse from cycle to cycle.

Accurate and repeatable switching and conduction loss measurements on high frequency SiC and GaN devices require resolution, multiple acquisition averaging, and complex waveform math. You need to make automated measurements for power quality, harmonics, safe operating area, and switching losses. 5 Series MSO oscilloscopes with 5-PWR and probing solution provide automated measurement capabilities along with the ability to troubleshoot problems.

Don't fail compliance

Regulations and market requirements for power efficiency, stand by power, harmonics, and EMI are getting more stringent. Performing early pre-compliance is now becoming more critical for passing compliance later, saving time to market and money if designs fail compliance later. You need power analyzers with pre-compliance software for automated and accurate power efficiency, harmonics and stand by pre-compliance. You also need spectrum analyzers with pre-compliance software for easy and accurate EMI pre-compliance.


Affordable pre-compliance testing can easily be setup to uncover potential problems so that you can minimize test time in more expensive compliance test facilities.