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Semiconductor Test Systems

Application Notes

DC I-V and AC Impedance Testing of Organic FETs

8/31/2020

This application note outlines how to optimize DC I-V and AC impedance measurements on OFETs using the 4200A-SCS Parameter Analyzer. Timing parameters, noise reduction, shielding, proper cabling, and other important measurement considerations for achieving the best results will be discussed.

Solution Briefs

Evolving Materials and Testing for Emerging Generations of Power Electronics Design

8/31/2020

Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increasing MOSFET switching speed and energy efficiency. As competitive pressures make these design parameters more critical, design engineers must reevaluate their approaches to validation and testing.

Webinars
Sensors and Semiconductors Testing Materials for Tomorrows Smart Devices

Sensors and Semiconductors Testing Materials for Tomorrows Smart Devices

5/24/2019

Listen to our panel discuss three measurement applications where the properties of new materials have influenced how measurements are made.