Keithley Series 2650 High Power SourceMeter® SMU Instruments

Power semiconductor and component characterization solutions

The 2650 Series High Power SourceMeter SMU Instruments are designed specifically for characterizing and testing high voltage/current electronics and power semiconductors, such as diodes, FETs, and IGBTs, high brightness LEDs, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies. They deliver unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D, production test, and reliability environments. Two instruments are available offering up to 3000V or up to 2000W of pulse current power.

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Price starting from
US $18,100 - US $22,300
Manual
LIST PRICE
US $18,100
Channels
Max Current Source/Measure Range
Max Voltage Source/Measure Range
Measurement Resolution (Current / Voltage)
Power

1

50A

40V

100fA / 100nV

2000 W

LIST PRICE
US $22,300
Channels
Max Current Source/Measure Range
Max Voltage Source/Measure Range
Measurement Resolution (Current / Voltage)
Power

1

120mA

3000V

1fA / 100nV

180 W

Features

Benefits

Highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters Offers best-in-class performance with 6½-digit resolution.  
Source or sink (2651A) up to 2,000W of pulsed power (±40V, ±50A) or up to 200W of DC power (±[email protected]±20A, ±[email protected]±10A, ±[email protected]±5A); easily connect two units (in series or parallel) to create solutions up to ±100A or ±80V Supports characterization/testing of power semiconductors, HBLEDs, optical devices, solar cells, and GaN, SiC, and other compound materials and devices. Applications include semiconductor junction temperature characterization; high speed, high precision digitization; electromigration studies; and high current, high power device testing.
Source or sink (2657A) up to 180W of DC or pulsed power (±[email protected], ±[email protected]) Provides the high voltage required for power semiconductor device characterization and testing, including GaN, SiC, and other compound materials and devices, breakdown and leakage testing to 3kV, and characterization of sub-millisecond transients.
Built-in web browser based software Allows for remote control through any browser, on any computer, from anywhere in the world.
Choice of digitizing or integrating measurement modes Supports characterizing transient and steady-state behavior precisely, including rapidly changing thermal effects.
TSP (Test Script Processing) technology Allows easy system integration with Model 2657A and Series 2600B models.
TSP-Link channel expansion bus Enables multiple 2651As and 2657As and selected Series 2600B SMU instruments to be combined to form an integrated system with up to 32 channels.
Compatible with Model 8010 High Power Device Test Fixture and Model 8020 High Power Interface Panel Provides safe and easy connections for testing high power devices at either the packaged part or wafer level.
Free Test Script Builder software tool Helps you create, modify, debug, and store TSP test scripts.
Optional ACS Basic semiconductor component characterization software Maximizes productivity when performing packaged part characterization during development, quality verification, or failure analysis.
Data SheetAccessoryDescription
2651A-KIT-1 LOW IMPEDANCE HI CURRENT COAX CABLE KIT ASSY, 1-METER LG
2651A-KIT-2 LOW IMPEDANCE HI CURRENT COAX CABLE KIT ASSY, 2-METERS LG
2651A-KIT-3 LOW IMPEDANCE HI CURRENT COAX CABLE KIT ASSY, 3-METERS LG
2657A-LIM-3 LOW INTERCONNECT MODULE
2657A-PM-200 HI-VOLTAGE 200V PROTECTION MODULE
4299-6 UNIVERSAL FULL RACK MOUNT KIT
7007-3 SHIELDED GPIB CABLE,3M (10FT)
8010 TEST FIXTURE FOR 265xA
HV-CA-554-.5 HV TRIAX CABLE, 0.5 M, MALE TO MALE
HV-CA-554-1 HV TRIAX CABLE, 1 M, MALE TO MALE
HV-CA-554-2 HV TRIAX CABLE, 2 M, MALE TO MALE
HV-CA-554-3 HV TRIAX CABLE, 3 M, MALE TO MALE
HV-CA-571-3 HV TRIAX FEMALE BKHD UNTERM CABLE, 3 M
HV-CS-1613 HV TRIAX FEMALE FEEDTHROUGH CONN
SHV-CA-553-1 SHV TO HV TRIAX, 1M, MALE TO MALE
SHV-CA-553-2 SHV TO HV TRIAX CABLE, 2 M, MALE TO MALE
SHV-CA-553-3 SHV TO HV TRIAX CABLE, 3 M, MALE TO MALE
TitleType
Touch, Test, Invent with the Next Generation Current and Voltage Source-Measure InstrumentsFact Sheet
VDS Ramp and HTRB Reliability Testing of High Power Semiconductor DevicesApplication Note
Maximize Speed and Throughput for Semiconductor MeasurementsPoster
FOUR KEY TESTS: Validating MOSFET Performance in Power Supply Designs

If you need to evaluate MOSFET devices, download our poster to learn the test specification and technique, test configuration and the typical results for the four key MOSFET tests.

Poster
Testing a New Switch Mode Power Supply Design Poster

This poster gives an overview of key measurements on a new switch mode power supply (SMPS) design, from initial startup, to optimizing switching and magnetic losses, to validating overall performance  and getting ready for regulatory compliance.

Poster
Automotive Solutions Brochure

Keeping up with today's rapidly changing automotive technologies is challenging. See the Tektronix solutions for analyzing data communications, power, sensors, lighting and RF technologies in the evolving automotive market.

Brochure
The Next Big LED Testing Challenge: High Power LED ModulesWhitepaper
Rapidly Expanding Array of Test Applications Continues to Drive Source Measurement Unit Instrument Technology (also Applicable to Series 2600B)Whitepaper
Using the Arbitrary Waveform Capabilities of the Series 2600B and Series 2650A System SourceMeter SMU Instruments to Perform Ford EMC Power Cycling Testing

Learn how to use a Source Measure Unit (SMU) with high-current arbitrary waveform capability for automotive power cycling testing. This app note describes a detailed procedure for performing Ford EMC-CS-2009.1 CI 230 Power Cycling Testing using the Keithley Series 2600B or Series 2650A System SourceMeter SMU instruments. 

Application Note
Creating Multi-SMU Systems with High Power System SourceMeter Instruments Application NoteApplication Note
TitleType
Source Meters Selection GuideSelection Guide
In our webinar we look at ten common applications, from LEDs and Laser Diodes to measuring power efficiency of power management ICs and solar cells. Each case highlights how a Source Measure Unit (…
0h 59m 14s
In our webinar we look at ten common applications, from LEDs and Laser Diodes to measuring power efficiency of power management ICs and solar cells. Each case highlights how a Source Measure Unit (…
0h 59m 14s
Characterizing semiconductor devices using source measure units and graphical user interfaces is a crucial part of the design process. In this webinar, you will learn how SMUs can characterize…
0h 33m 4s
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