Jitter Measurement and Timing Analysis

Understanding timing jitter has become a mandatory part of high-speed communications system design as today’s serial data standards require extensive jitter compliance tests. Tektronix' comprehensive test instrumentation portfolio enables you to meet your design goals and compliance requirements – fast.

DPOJET Jitter & Timing Analysis for Real-Time Oscilloscopes: DPOJET enables engineers to debug and characterize timing, jitter, and noise in computer, mobile, and data communication system designs.

TekScope Anywhere^TM Waveform Analysis: Users now have the flexibility to perform timing, eye, and jitter analysis outside the lab that can easily be shared between team members in a networked environment.

80SJNB Jitter, Timing, and SDLA Visualizer Analysis for Sampling Oscilloscopes: 80SJNB is an all-purpose tool that enables engineers to specify a de-embed filter, Time Domain Waveform or S-Parameter for channel embedding. 80SJNB also performs timing, noise and mask testing analysis to get a 3-D view of the eye diagram performance for deep, accurate evaluation on signals with speeds beyond 50GHz.

JMAP Jitter Mapping and Decomposition Analysis for BERTScope BSA Series: Unlike a traditional BERT, BERTScope utilizes unique JMAP analysis to provide jitter decomposition into its random and deterministic components for a deeper understanding of errors on long patterns.

Jitter Fact Sheet

Whether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve problems and meet your design goals and compliance requirements.

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Understanding and Characterizing Timing Jitter Primer

Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems.

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Anatomy of Jitter

This webinar describes the different categories and types of jitter; the origins and interrelationships and how they can be used to diagnois, characterize and debug system hardware. Plus, explain how these various jitter measurements are applicable to your specific application.

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Evaluating Stress Components using BER-Based Jitter Measurements This primers describes how jitter measurements can be self-verified using a BER-based Jitter Peak measurement and how to simplify the jitter measurement challenge by using a pattern that does not …
Clock Recovery Primer, Part 1 Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.
The Basics of Serial Data Compliance and Validation Measurements High-speed serial bus architectures are the new norm in today’s high-performance designs. While parallel bus standards are undergoing some changes, serial buses are established across multiple markets …
Stressed Eye Primer In addition to an introduction to stressed eye testing, this primer discusses some of the high-speed standards that use it, and how a receiver test using stressed eye is constructed.
Understanding and Characterizing Timing Jitter Primer Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. Historically, electrical systems have lessened the ill effects of …
Dual-Dirac+ Scope Histograms and BERTScan Measurements This primer discusses how the dual-Dirac relates to practical measurements that can be made with sampling scopes and BER-based instruments.
Clock Recovery Primer, Part 2 Part 2 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.
Choose the Right Platform for Your Jitter Measurements This document will explain some essential jitter terms, and then go on to discuss jitter measurements and the tools best suited for evaluating and quantifying jitter, when working with serial data …
DesignCon 2015 Paper - Statistical Principles and Trends in Mask Testing This paper relates mask testing on these models with that ultimate figure of merit, the system BER as measured against a mask. It includes a new method that determines the BER of a mask from an eye …
Paper presented 8/9/05 at the T11.2 FC-MSQS Ad Hoc Meeting: Impact of Noise on BER Estimation Page content will go here.
Jitter Fact Sheet Regardless whether you need a quick clock jitter measurement, or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve …
Bridging the Gap Between BER and Eye Diagrams — A BER Contour Tutorial BER Contour Measurement - What it is, how it is constructed, and why it is a valuable way of viewing parametric performance at gigabit speeds.
Clock Recovery’s Impact on Test and Measurement As clock recovery becomes increasingly common in more systems and test setups, its effects on measurements must be considered. Many outside influences can disturb the relationship between data and …
Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester Six sigma is a form of mask testing that provides for critical insight when mask testing depth specification are important for pass/fail testing or deeper evaluation on high-speed signaling standards …
Anatomy of an Eye Diagram: How to Construct & Trigger Abstract This paper describes what an eye diagram is, how it is constructed, and common methods of triggering used to generate one. It then describes different ways that information from an …
Characterizing Phase Locked Loops Using Tektronix Real-Time Spectrum Analyzers This application note shows measurements of linear and non-linear effects in both the time and frequency domains using Tektronix Real-Time Spectrum Analyzers.
Controlled Jitter Generation for Jitter Tolerance and Jitter Transfer Testing This application note explores how (and how not) to generate controlled jitter. It also reviews a few cases where you might use a jittered source, such as Jitter Tolerance testing, Jitter Transfer …
Comparing Jitter Using a BERTScope® Bit Error Rate Testing Comparison of DCD and F/2 Jitter.
Ultra-low Jitter Performance with Phase-Reference Module 82A04 & TDS/CSA8200 Sampling Oscilloscope
BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood” Delve into jitter problems in new ways, such as examining Random Jitter on each edge of the data pattern, separating out the jitter caused by transmitter pre-emphasis, and performing jitter …
Characterize Phase-Locked Loop Systems Using Real Time Oscilloscopes Introduction Phase-locked loops (PLL) are frequently used in communication applications. For example, they recover the clock from digital data signals (CDR), recover the carrier from …

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How to Address Your Toughest Serial Bus Design Challenges with EDA and Measurement Correlation This Tektronix webinar will teach engineers how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using the DPO/MSO70000 Series …
Jitter Fundamentals View this recorded webinar to get a solid overview of jitter components as well as jitter characterization and visualization. Learn how to control Jitter during system design and improve timing …
Enabling PAM4 for Emerging Requirements in Data Communications This webinar presents measurement techniques for PAM4 Data Communications and is useful for engineers involved in designing and developing 28G, 56G or 100G components, modules and systems. Find out …
Choosing the Right Platform for Jitter Measurements
Advanced Jitter and Noise Analysis As serial data speeds increase, the need to perform accurate timing and jitter measurements is key to staying current in your design role. Check out this new webinar that covers advances in the …