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Jitter Measurement and Timing Analysis
Understanding timing jitter has become a mandatory part of high-speed communications system design as today’s serial data standards require extensive jitter compliance tests. Tektronix' comprehensive test instrumentation portfolio enables you to meet your design goals and compliance requirements – fast.
- DPOJET Jitter & Timing Analysis for Real-Time Oscilloscopes: DPOJET enables engineers to debug and characterize timing, jitter, and noise in computer, mobile, and data communication system designs.
- TekScope AnywhereTM Waveform Analysis: Users now have the flexibility to perform timing, eye, and jitter analysis outside the lab that can easily be shared between team members in a networked environment.
- 80SJNB Jitter, Timing, and SDLA Visualizer Analysis for Sampling Oscilloscopes: 80SJNB is an all-purpose tool that enables engineers to specify a de-embed filter, Time Domain Waveform or S-Parameter for channel embedding. 80SJNB also performs timing, noise and mask testing analysis to get a 3-D view of the eye diagram performance for deep, accurate evaluation on signals with speeds beyond 50GHz.
- JMAP Jitter Mapping and Decomposition Analysis for BERTScope BSA Series: Unlike a traditional BERT, BERTScope utilizes unique JMAP analysis to provide jitter decomposition into its random and deterministic components for a deeper understanding of errors on long patterns.
Featured Content
Whether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve problems and meet your design goals and compliance requirements.
Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems.
This webinar describes the different categories and types of jitter; the origins and interrelationships and how they can be used to diagnois, characterize and debug system hardware. Plus, explain how these various jitter measurements are applicable to your specific application.
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Understanding and Characterizing Timing Jitter Primer
Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. Historically, electrical systems have lessened the ill effects of …
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Stressed Eye Primer
In addition to an introduction to stressed eye testing, this primer discusses some of the high-speed standards that use it, and how a receiver test using stressed eye is constructed.
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Clock Recovery Primer, Part 1
Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.
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Clock Recovery Primer, Part 2
Part 2 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.
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The Basics of Serial Data Compliance and Validation Measurements
High-speed serial bus architectures are the new norm in today’s high-performance designs. While parallel bus standards are undergoing some changes, serial buses are established across multiple markets …
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Evaluating Stress Components using BER-Based Jitter Measurements
This primers describes how jitter measurements can be self-verified using a BER-based Jitter Peak measurement and how to simplify the jitter measurement challenge by using a pattern that does not …
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Dual-Dirac+ Scope Histograms and BERTScan Measurements
This primer discusses how the dual-Dirac relates to practical measurements that can be made with sampling scopes and BER-based instruments.
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Choose the Right Platform for Your Jitter Measurements
This document will explain some essential jitter terms, and then go on to discuss jitter measurements and the tools best suited for evaluating and quantifying jitter, when working with serial data …
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DesignCon 2015 Paper - Statistical Principles and Trends in Mask Testing
This paper relates mask testing on these models with that ultimate figure of merit, the system BER as measured against a mask. It includes a new method that determines the BER of a mask from an eye …
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Paper presented 8/9/05 at the T11.2 FC-MSQS Ad Hoc Meeting: Impact of Noise on BER Estimation
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Advanced Jitter and Noise Analysis
As serial data speeds increase, the need to perform accurate timing and jitter measurements is key to staying current in your design role. Check out this new webinar that covers advances in the …
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Enabling PAM4 for Emerging Requirements in Data Communications
This webinar presents measurement techniques for PAM4 Data Communications and is useful for engineers involved in designing and developing 28G, 56G or 100G components, modules and systems. Find out …
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How to Address Your Toughest Serial Bus Design Challenges with EDA and Measurement Correlation
This Tektronix webinar will teach engineers how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using the DPO/MSO70000 Series …
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Jitter Fundamentals
View this recorded webinar to get a solid overview of jitter components as well as jitter characterization and visualization. Learn how to control Jitter during system design and improve timing …
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Choosing the Right Platform for Jitter Measurements
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