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Technical Document - Application Note
Pulsed I-V Characterization of MOSFETs Using Keithley KickStart Software

This application note discusses the benefits of pulse-based testing for a semiconductor device, the application of pulsed test for MOSFET transistors, and how to use KickStart Software to establish automated tests for these devices.

1KW-73840-0 | Date: Tuesday, June 17 2025
Technical Document - Application Note
Pulsed Characterization of HBLEDs Using Keithley KickStart Software

This application note discusses the reasons why pulse-based testing might be beneficial for a semiconductor device and details the application of pulsed test for high-brightness LEDs. Specifics are provided for using Keithley KickStart Software to …

1KW-73839-0 | Date: Wednesday, July 09 2025
Technical Document - Application Note
Making Temperature Measurements with the Model 2110

Many Keithley electrometers, switch/multimeter systems, data acquisition systems, and digital multimeters include temperature measurement capabilities, making them quite useful in a variety of applications in which temperature measurements are …

Date: Wednesday, September 05 2012
Technical Document - Application Note
Measuring Low Resistance Devices with High Current Using the Model 2460 SourceMeter SMU Instrument

Source Measure Unit (SMU) instruments or SourceMeter® instruments can simplify making low resistance measurements with high current stimulus. A SourceMeter instrument is capable of sourcing and measuring both current and voltage.

1KT-60883-0 | Date: Friday, September 16 2016
Technical Document - Application Note
There's an Unsung Hero on Your Workbench: The SourceMeter SMU Instrument

Working as a design engineer or electronic technician is difficult. The products we build MUST be higher performance than those that they replace, or why bother? These complicated, high performance products require powerful design tools if they’re …

Date: Monday, April 27 2015
Technical Document - Application Note
How to Transition Code to TSP from SCPI

This application introduces Keithley’s Test Script Processor (TSP®) command set and scripting language as an alternative to “Standard Commands for Programmable Instrumentation” (SCPI) and traditional instrument programming. First, an overview of SCPI and TSP will be given, followed by several side-by-side examples to show analogous commands between both command sets.

1KW-61539-0 | Date: Thursday, March 11 2021
Technical Document - Application Note
Capacitance and Inductance Measurements Using an Oscilloscope and a Function Generator

This application note discusses how an oscilloscope and a function generator can be used to do a simple, transparent impedance measurement.

75W-28152-2 | Date: Tuesday, March 21 2023
Technical Document - Application Note
Harness the Power of TSP™ Toolkit Software

Introduction In an industry where rapid test development is crucial, the need for effective automation and easy code development has never been more pronounced. As businesses strive to enhance their quality while reducing time to market, the right …

1KW-74117-0 | Date: Monday, October 28 2024
Technical Document - Application Note
How to Test a Resistor with a Multimeter and the KickStart DMM App

The practical limitations of cost-effective device manufacture require that resistors be assigned a tolerance range by their manufacturers. As such, digital multimeters are often used to confirm whether a given resistor falls within its specified …

1KW-74121-0 | Date: Wednesday, January 15 2025
Technical Document - Application Note
Understanding and Performing USB 2.0 Electrical Testing and Debugging

This application note provided an overview of USB 2.0 physical layer testing including signal quality, in-rush current check, drop and droop tests, as well as tests for high-speed mode.

55W-61400-0 | Date: Thursday, June 06 2024