Learn about a new method for measuring dynamic on-state resistance (RDS(on)) in SiC/GaN devices using Tektronix oscilloscopes, without the need for traditional clamping circuits.
Dynamic RDS(on) is important for understanding charge trapping in power converters. Traditional measurement techniques often rely on diode clamping circuits, which can be inconvenient and introduce parasitic elements.
This new method eliminates the need for external clamping circuits, enhancing measurement efficiency. It uses two high voltage differential probes to measure VDS at different sensitivities. Wide Bandgap Analysis software, available on the 4, 5 and 6 Series MSO, combines these signals to derive an RDS(on) waveform and measurement.