DSA8300 Digital Sampling Oscilloscope
DSA8300 Digital Sampling Oscilloscope
With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.
Features |
Benefits |
Electrical module signal measurement accuracy:
|
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec). |
Industry’s lowest system noise at all bandwidths:
|
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure. |
| Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. | High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels. |
| Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet. | Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm. |
| Superior acquisition throughput with up to 300 kS/s maximum sample rate. | Reduced manufacturing or device characterization test-time by 4X with superior system throughput. |
| Ability to place the samplers adjacent to the device under test (DUT). | Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed. |
| Independent calibrated channel de-skew. | Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing. |
Models
| Model | Analog Bandwidth | Sample Rate | Record Length | Analog Channels | List Price |
|---|---|---|---|---|---|
| DSA8300 | 70 GHz Electrical, 80 GHz Optical | Up to 300 kS/s | 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) | Determined by the sampling modules used, up to 8 channels | Configure & Quote |
ModelDSA8300
List PriceConfigure & Quote
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
| Model | Analog Bandwidth | Sample Rate | Record Length | Analog Channels | List Price |
|---|---|---|---|---|---|
| DSA8300 | 70 GHz Electrical, 80 GHz Optical | Up to 300 kS/s | 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) | Determined by the sampling modules used, up to 8 channels | Configure & Quote |
ModelDSA8300
List PriceConfigure & Quote
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
| Data Sheet | Software Package / Software Option | Description | Configure and Quote |
|---|---|---|---|
| 100G-SR4 | Automated Compliance and Debug Testing Solution for 100GBASE-SR4 and Transmitter and Dispersion Eye Closure (TDEC) | Contact Us | |
| 80SICMX | ICONNECT AND MEASUREXTRACTOR SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE | Configure & Quote | |
| 80SICON | ICONNECT AND MEASUREXTRACTOR SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE | Configure & Quote | |
| 80SJNB PAM4 | Comprehensive tools for PAM4 Modulation Analysis | Contact Us | |
| 80SJNB, 80SJARB | Jitter, Noise, and BER Analysis Software. | Contact Us | |
| 80SJNB01 | Jitter, Noise, and BER Analysis Advanced | Contact Us | |
| 80SJNB02 | Jitter, Noise, and BER Analysis Software with SDLA Visualizer | Contact Us | |
| 80SSPAR | ICONNECT S-PARAMETERS AND Z-LINE SOFTWARE | Configure & Quote | |
| CEI-VSR | Automated Compliance and Debug Solution for CEI-28G-VSR testing software. | Contact Us | |
| Opt. 400G-M4 | 400G Optical Manufacturing analysis software, 4 channel TDECQ | Contact Us |
| Datasheet Link | Probe | Description | Configure and Quote |
|---|---|---|---|
| DVT30-1MM GigaProbe | 30 GHz TDR probe available from GigaProbes. | Contact Us | |
| DVT30-1MM GigaProbe | 30 GHz TDR probe available from GigaProbes. | Contact Us | |
| View Datasheet | P8018 | HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | Configure & Quote |
| View Datasheet | P80318 | Probe kit,18GHz 100 Ohm Differential Hand Probe | Configure & Quote |
| Data Sheet | Accessory | Description |
|---|---|---|
| 80A02 | EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | |
| 80A03 | TEKCONNECT PROBE INTERFACE MODULE | |
| 80B28G | 8000 Series - Electrical Sampling Scope Bundle to Support 25/28 Gb/s standards (includes 80E09B, 82A04B, CR286A and accessories) | |
| 80C07B | OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH | |
| 80C08D | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode | |
| 80C10C | Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3) | |
| 80C11B | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode | |
| 80C12B | 12 GHz, Broad WaveLength, Amplified Optical Sampling Module | |
| 80C14 | 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module | |
| 80C15 | 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | |
| 80C17 | 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | |
| 80C18 | 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | |
| 80C20 | 8000 Series Optical Module: single channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm | |
| 80C21 | 8000 Series Optical Module: dual channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm | |
| 80E03 | SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | |
| 80E04 | SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | |
| 80E07B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1) | |
| 80E08B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | |
| 80E09B | 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1) | |
| 80E10B | 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | |
| 80E11 | 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | |
| 80E11X1 | 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | |
| 82A04B | 8000 Series, Phase Reference Module (includes D1) |
| Data Sheet | Module | Description | Configure and Quote |
|---|---|---|---|
| 80A02 | EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | Configure & Quote | |
| 80A03 | TEKCONNECT PROBE INTERFACE MODULE | Contact Us | |
| 80B28G | 8000 Series - Electrical Sampling Scope Bundle to Support 25/28 Gb/s standards (includes 80E09B, 82A04B, CR286A and accessories) | Configure & Quote | |
| 80C07B | OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH | Configure & Quote | |
| 80C08D | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode | Configure & Quote | |
| 80C10C | Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3) | Configure & Quote | |
| 80C11B | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode | Configure & Quote | |
| 80C12B | 12 GHz, Broad WaveLength, Amplified Optical Sampling Module | Configure & Quote | |
| 80C14 | 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module | Configure & Quote | |
| 80C15 | 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | Configure & Quote | |
| 80C17 | 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | Configure & Quote | |
| 80C18 | 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | Configure & Quote | |
| 80C20 | 8000 Series Optical Module: single channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm | Configure & Quote | |
| 80C21 | 8000 Series Optical Module: dual channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm | Configure & Quote | |
| 80E03 | SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | Configure & Quote | |
| 80E04 | SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | Configure & Quote | |
| 80E07B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1) | Configure & Quote | |
| 80E08B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | Configure & Quote | |
| 80E09B | 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1) | Configure & Quote | |
| 80E10B | 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | Configure & Quote | |
| 80E11 | 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | Configure & Quote | |
| 80E11X1 | 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | Configure & Quote | |
| 82A04B | 8000 Series, Phase Reference Module (includes D1) | Configure & Quote | |
| 82A04B | 8000 Series, Phase Reference Module (includes D1) | Configure & Quote |
| Title | Type | Date |
|---|---|---|
| How do I use the programmer manual for my instrument? TekVISA Download Link: TEKVISA CONNECTIVITY SOFTWARE Hello and welcome to Tektronix, today I’m presenting the last part in the 3-part series on using TekVISA. I’ll be giving a basic overview of programmer manuals and how to use them to find the correct… | FAQ ID: 69186 | 17 May 2018 |
| 400G-M4 PAM4 Optical Manufacturing TDECQ Analysis Software for Tektronix DSA8300 - V1.0.0.31 PC based analysis software package provides up to 4 channel support enabling higher throughput rates through parallel channel acquisition and processing. Features in the DSA8300 400G-M4 Analysis include:• Support for 4 channel simultaneous acquisition•… Part number: 066134711 | Application | 08 May 2018 |
| Oscilloscope Selection Guide From basic signal-checking to high-performance analysis, this selection guide gives an overview of the complete range of oscilloscopes from Tektronix. Comparison tables give high-level specifications and features, and indicate the major differences… Literature number: 46W-31080-3 | Selection Guide | 25 Apr 2018 |
| DSA83UP Upgrades for DSA8300 Instrument
This kit provides upgrade instructions for the DSA8300 Digital Serial Analyzer instrument. The kit includes the instrument application software, documentation (as PDF files), and a hard disk drive assembly if ordered with option HDD8. Part number: 075103703 | Field Install Instructions | 23 Apr 2018 |
| 2018 Tektronix and Keithley Product Catalog Browse the new Tektronix and Keithley Product Catalog and explore our complete line of test and measurement solutions. You will find over 130 pages of key product details and specifications, application information, quick-reference selection guides and… | Selection Guide | 18 Apr 2018 |
| DSA8300 Datasheet Digital Serial Analyzer Sampling Oscilloscope The DSA8300 is a state-of-the-art Equivalent Time Sampling Oscilloscope that provides the highest fidelity measurement and analysis capabilities for Communications Signal Analysis, Serial Data Network Analysis, and Serial Data Link Analysis applications… Literature number: 85W-26988-21 | Datasheet | 17 Apr 2018 |
| China RoHS Supplemental, 071218307 Product Information Sheet for People‚s Republic of China
This sheet contains supplemental product information for the People‚s Republic of China. Part number: 071218307 | User | 11 Apr 2018 |
| 80SJNB Jitter, Noise, BER, and Serial Data Link Analysis Software for DSA8300; Help file (PDF)
This document provides operating and programming instructions for the 80SJNB software application. 80SJNB provides Jitter, Noise, and BER analysis and features for de-embedding of the fixture, channel emulation, and FFE/DFE equalizer support. This version… Part number: 077064105 | Primary User | 11 Apr 2018 |
| How To Create an Eye Diagram in DPOJET */ DPOJET is a powerful tool for Jitter and Timing analysis of high speed serial data signals. The eye diagram allows for quick visual inspection of the signal quality of high-speed serial signals. Creating an eye diagram in DPOJET is easy and can be… | FAQ ID: 467706 | 29 Mar 2018 |
| Optical Bandwidth Requirements for NRZ and PAM4 Signaling Until recently, both optical and electrical bandwidth produced similar results but this is no longer the case with the recent IEEE spec change. This paper clarifies these terms, mathematically shows how they are related, and provides the basis to… Literature number: 55W-61363-0 | Whitepaper | 05 Mar 2018 |