DSA8300 Digital Sampling Oscilloscope

DSA8300 Digital Sampling Oscilloscope

With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.

Features

Benefits

Electrical module signal measurement accuracy:
  • Ultra-low system jitter (<100 fs, typical)
  • > 70GHz
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec).
Industry’s lowest system noise at all bandwidths:
  • 600 µV max (450 µV typ.) @ 60 GHz
  • 380 µV max (280 µV typ.) @ 30 GHz
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure.
Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels.
Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet. Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm.
Superior acquisition throughput with up to 300 kS/s maximum sample rate. Reduced manufacturing or device characterization test-time by 4X with superior system throughput.
Ability to place the samplers adjacent to the device under test (DUT). Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed.
Independent calibrated channel de-skew. Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing.

 


Models

Model Analog Bandwidth Sample Rate Record Length Analog Channels List Price
DSA8300 70 GHz Electrical, 80 GHz Optical Up to 300 kS/s 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) Determined by the sampling modules used, up to 8 channels
-
Configure & Quote
Model DSA8300
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
Model Analog Bandwidth Sample Rate Record Length Analog Channels List Price
DSA8300 70 GHz Electrical, 80 GHz Optical Up to 300 kS/s 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) Determined by the sampling modules used, up to 8 channels
-
Configure & Quote
Model DSA8300
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
Data SheetSoftware Package / Software OptionDescriptionConfigure and Quote
100G-SR4

Automated Compliance and Debug Testing Solution for 100GBASE-SR4 and Transmitter and Dispersion Eye Closure (TDEC)

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80SICMX ICONNECT AND MEASUREXTRACTOR SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE Configure & Quote
80SICON ICONNECT SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE Configure & Quote
80SJNB PAM4

Comprehensive tools for PAM4 Modulation Analysis

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80SJNB, 80SJARB

Jitter, Noise, and BER Analysis Software.

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80SJNB01

Jitter, Noise, and BER Analysis Advanced

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80SJNB02

Jitter, Noise, and BER Analysis Software with SDLA Visualizer

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80SSPAR ICONNECT S-PARAMETERS AND Z-LINE SOFTWARE Configure & Quote
CEI-VSR

Automated Compliance and Debug Solution for CEI-28G-VSR testing software.

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Opt. 400G-M4

400G Optical Manufacturing analysis software, 4 channel TDECQ

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Datasheet LinkProbeDescriptionConfigure and Quote
DVT30-1MM GigaProbe

30 GHz TDR probe available from GigaProbes.

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P8018 HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT Configure & Quote
P80318 Probe kit,18GHz 100 Ohm Differential Hand Probe Configure & Quote
Data SheetModuleDescriptionConfigure and Quote
80A02 EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT Configure & Quote
80A03 TEKCONNECT PROBE INTERFACE MODULE Contact Us
80C07B OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH Configure & Quote
80C08D Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode Configure & Quote
80C10C Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3) Configure & Quote
80C11B Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode Configure & Quote
80C12B 12 GHz, Broad WaveLength, Amplified Optical Sampling Module Configure & Quote
80C14 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module Configure & Quote
80C15 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm Configure & Quote
80C17 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm Configure & Quote
80C18 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm Configure & Quote
80C20

8000 Series Optical Module: single channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm

Configure & Quote
80C21

8000 Series Optical Module: dual channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm

Configure & Quote
80E03 SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD Configure & Quote
80E04 SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD Configure & Quote
80E07B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1) Configure & Quote
80E08B 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) Configure & Quote
80E09B 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1) Configure & Quote
80E10B 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) Configure & Quote
80E11 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) Configure & Quote
80E11X1 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) Configure & Quote
82A04B 8000 Series, Phase Reference Module (includes D1) Configure & Quote
This webinar covers new technologies and techniques for 100G/400G optical transmitter (TX) testing that will help you accelerate your product development and maximize your manufacturing test efforts.
0h 18m 32s
At OFC 2018 it’s not just about speed but also interoperability both between standards and among equipment vendors.
0h 3m 26s
Learn how more margin and higher yields are made possible with lowest optical noise, highest sensitivity solution available today. 
0h 1m 33s
At this booth, we're demonstrating our DS8300 Digital Sampling Oscilloscope including new PAM4 software modules.
0h 2m 9s
Watch Tektronix experts as they provide a brief overview of test technologies being demonstrated on 100G components, transceivers and systems for the Datacom and Long Haul Networking Design Segments.
0h 2m 15s
During ECOC 2014, Tektronix demonstrated 56 Gb/s Eye Diagram analysis on a DSA8300 Sampling Oscilloscope.
0h 2m 9s
See how to conduct PAM-4 Analysis using PPG3204 Pattern Generator and DSA8300 Sampling Oscilloscope on multi-level eye diagrams.
0h 2m 5s
Watch Tektronix experts as they provide a brief overview of test technologies being demonstrated on 100G components, transceivers and systems for the Datacom and Long Haul Networking Design Segments.
0h 2m 7s
Watch Tektronix experts as they provide a brief overview of test technologies being demonstrated on 100G components, transceivers and systems for the Datacom and Long Haul Networking Design Segments.
0h 4m 36s
View this demonstration of interoperability at OFC2013 using Tektronix DSA8300 Sampling Oscilloscope and BSA286C BERTScope. Tektronix assisted the Optical Internetworking Forum (OIF) and member…
0h 4m 55s
80SJNB, 80SJARB, SDLA Visualizer and Scope Noise Characterization Application Software Release - V4.5.9.0, V4.0.4.0, V2.2.0.4, V 1.0.0.64
80SJNB, 80SJARB, SDLA Visualizer, and Scope Noise Characterization software run on the DSA8300 instruments with Windows 7 Operating System. This release of 80SJNB adds updates to TDECQ measurements in support of 100 ? 400 Gbps, PAM4 signal analysis, with…
Part number: 066134713
Application
DSA8300 Digital Serial Analyzer, 80C00/80E00/80A00 modules Specifications
This document lists the warranted and typical specifications for the DSA8300 Digital Serial Analyzer, 80C00 Series Optical Sampling Modules, 80E00 Series Electrical Sampling Modules, and 80A00 Modules.
Part number: 077057104
Performance Verification
2019 Tektronix and Keithley Product Catalog
Browse the new Tektronix and Keithley Product Catalog and explore our complete line of test and measurement solutions. You will find over 90 pages of key product details and specifications, application information, quick-reference selection guides and…
Selection Guide 24 Feb 2019
Oscilloscope Selection Guide
From basic signal-checking to high-performance analysis, this selection guide gives an overview of the complete range of oscilloscopes from Tektronix.
Literature number: 46W-31080-4
Selection Guide 16 Jan 2019
NRZ-M4 Optical Manufacturing TDEC Analysis Software for Tektronix DSA8300 - V1.1.0.37
Tektronix NRZ-M4 is a PC based application which offers optical NRZ signaling analysis, including TDEC(Transmitter and Dispersion Eye Closure) measurement. The application brings together NRZ optical measurements in a simple and easy to use application.…
Part number: 066199900
Application
PAM4 Signaling in High Speed Serial Technology: Test, Analysis, and Debug
PAM4 Testing for Electrical and Optical SignalsLearn valuable information on testing PAM4 technology and approaches for validating PAM4 signals.  This application note describes: PAM4 technology for 50-400G applications Provides details of PAM4 signaling Outlines important aspects of evaluating…
Literature number: 55W-60273-2
Application Note 04 Jan 2019
DSA8300 Datasheet
Digital Serial Analyzer Sampling Oscilloscope The DSA8300 is a state-of-the-art Equivalent Time Sampling Oscilloscope that provides the highest fidelity measurement and analysis capabilities for Communications Signal Analysis, Serial Data Network Analysis, and Serial Data Link Analysis applications…
Literature number: 85W-26988-21
Datasheet
XYZs of Oscilloscopes Primer
After reading this primer, you will be able to: Describe how oscilloscopes work, Describe the differences between analog, digital storage, digital phosphor, and digital sampling oscilloscopes, describe electrical waveform types, understand basic…
Literature number: 03Z-8605-7
Primer 05 Dec 2018
80SJNB, 80SJARB and SDLA Visualizer Application Software Release - v4.3.2.0 and v4.0.4.0 and V2.2.0.4
80SJNB, 80SJARB, and SDLA Visualizer software run on the DSA8300 instruments with Windows 7 Operating System. This release of 80SJNB adds a TDECQ option in support of 100 – 400 Gbps, PAM4 signal analysis, with focus on the TDECQ (Transmitter and…
Part number: 066134710
Application
Effects of Infiniband Fixture Crosstalk on Synthesized Eye Diagram
Application note for de-embedding fixture crosstalk from synthesized eye diagrams working on characterization of Infiniband designs.
Literature number: 61W-19673-0
Application Note 11 Nov 2018
Programmable Interface Changes Between Tektronix DSA8200 and DSA8300 Sampling
This document contains the summary of changes to the Programmable Interface (PI).Comments on GPIB and TekVisa
Literature number: 85W-27063-0.pdf
Whitepaper 11 Nov 2018
80A00, 80C00, 80E00, and 82A00 Series
This document describes proper sampling module handling and installation instructions, and the instrument operating systems and TekScope application versions needed to support specific modules.
Part number: 071138611
User
80A00, 80C00, 80E00, and 82A00 Series
This document describes installation procedures and software compatibility information for the 80A00, 80C00, 80E00, and 82A00 Sampling Modules for the DSA8300 and TDS/CSA8000, TDS/CSA8000B, and TDS/CSA/DSA8200 series instruments.
Part number: 071138612
User
DSA8300
This document lists the warranted and typical specifications for the DSA8300 mainframe instrument as well as for the 80AXX, 80CXX, and 80EXX sampling modules.
Part number: 077057100
Performance Verification
DSA8300
Supports TekScope version 6.1.X and greater. This PDF file is a printable version of the DSA8300 Series online help content.
Part number: 077056901
Online Help
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