DSA8300 Digital Sampling Oscilloscope
DSA8300 Digital Sampling Oscilloscope
With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.
Features |
Benefits |
Electrical module signal measurement accuracy:
|
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec). |
Industry’s lowest system noise at all bandwidths:
|
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure. |
| Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. | High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels. |
| Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet. | Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm. |
| Superior acquisition throughput with up to 300 kS/s maximum sample rate. | Reduced manufacturing or device characterization test-time by 4X with superior system throughput. |
| Ability to place the samplers adjacent to the device under test (DUT). | Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed. |
| Independent calibrated channel de-skew. | Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing. |
Models
| Model | Analog Bandwidth | Sample Rate | Record Length | Analog Channels | List Price |
|---|---|---|---|---|---|
| DSA8300 | 70 GHz Electrical, 80 GHz Optical | Up to 300 kS/s | 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) | Determined by the sampling modules used, up to 8 channels | - |
Model
DSA8300
List Price
-
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
| Model | Analog Bandwidth | Sample Rate | Record Length | Analog Channels | List Price |
|---|---|---|---|---|---|
| DSA8300 | 70 GHz Electrical, 80 GHz Optical | Up to 300 kS/s | 50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB) | Determined by the sampling modules used, up to 8 channels | - |
Model
DSA8300
List Price
-
Analog BandwidthSample RateRecord Length
70 GHz Electrical, 80 GHz OpticalUp to 300 kS/s50 points - 16,000 points (1M points with IConnect®, 10M points for 80SJNB)
Analog Channels
Determined by the sampling modules used, up to 8 channels
| Data Sheet | Software Package / Software Option | Description | Configure and Quote |
|---|---|---|---|
| 100G-SR4 | Automated Compliance and Debug Testing Solution for 100GBASE-SR4 and Transmitter and Dispersion Eye Closure (TDEC) | Contact Us | |
| 80SICMX | ICONNECT AND MEASUREXTRACTOR SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE | Configure & Quote | |
| 80SICON | ICONNECT SIGNAL INTEGRITY AND FAILURE ANALYSIS SOFTWARE | Configure & Quote | |
| 80SJNB PAM4 | Comprehensive tools for PAM4 Modulation Analysis | Contact Us | |
| 80SJNB, 80SJARB | Jitter, Noise, and BER Analysis Software. | Contact Us | |
| 80SJNB01 | Jitter, Noise, and BER Analysis Advanced | Contact Us | |
| 80SJNB02 | Jitter, Noise, and BER Analysis Software with SDLA Visualizer | Contact Us | |
| 80SSPAR | ICONNECT S-PARAMETERS AND Z-LINE SOFTWARE | Configure & Quote | |
| CEI-VSR | Automated Compliance and Debug Solution for CEI-28G-VSR testing software. | Contact Us | |
| Opt. 400G-M4 | 400G Optical Manufacturing analysis software, 4 channel TDECQ | Contact Us |
| Datasheet Link | Probe | Description | Configure and Quote |
|---|---|---|---|
| DVT30-1MM GigaProbe | 30 GHz TDR probe available from GigaProbes. | Contact Us | |
| P8018 | HANDHELD TDR PROBE, PASSIVE; 20 GHZ, SINGLE-ENDED, 50 OHM, SMA CONNECTOR WITH 20 GHZ SMA CABLE; DESIGNED TO WORK WITH 80A02 EOS/ESD PROTECTION MODULE; STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | Configure & Quote | |
| P80318 | Probe kit,18GHz 100 Ohm Differential Hand Probe | Configure & Quote |
| Data Sheet | Module | Description | Configure and Quote |
|---|---|---|---|
| 80A02 | EOS/ESD PROTECTION MODULE FOR ELECTRICAL STATIC ISOLATION OF TEKTRONIX ELECTRICAL SAMPLING MODULES;STATEMENT OF COMPLIANCE INCLUDED WITH THIS PRODUCT | Configure & Quote | |
| 80A03 | TEKCONNECT PROBE INTERFACE MODULE | Contact Us | |
| 80C07B | OPTICAL SAMPLING MODULE; 2.488 GB/S OC48/STM16,2.500 GB/S 2GBE,2.500 GB/S INFINIBAND;2.5 GHZ OPTICAL BANDWIDTH | Configure & Quote | |
| 80C08D | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode | Configure & Quote | |
| 80C10C | Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3) | Configure & Quote | |
| 80C11B | Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode | Configure & Quote | |
| 80C12B | 12 GHz, Broad WaveLength, Amplified Optical Sampling Module | Configure & Quote | |
| 80C14 | 14+ GHz, Broad WaveLength, Amplified Optical Sampling Module | Configure & Quote | |
| 80C15 | 8000 Series Optical Module: single channel, 32GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | Configure & Quote | |
| 80C17 | 8000 Series Optical Module: single channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | Configure & Quote | |
| 80C18 | 8000 Series Optical Module: dual channel, 30GHz optical bandwidth, single/multi-mode, 800nm to 1600nm | Configure & Quote | |
| 80C20 | 8000 Series Optical Module: single channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm | Configure & Quote | |
| 80C21 | 8000 Series Optical Module: dual channel, 53GHz optical bandwidth, single-mode, 1200nm to 1650nm | Configure & Quote | |
| 80E03 | SAMPLING MODULE; DUAL,20 GHZ ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | Configure & Quote | |
| 80E04 | SAMPLING MODULE; DUAL,20 GHZ W/TDR ELECTRICAL SAMPLING MODULE - CERTIFICATE OF TRACEABLE CALIBRATION STANDARD | Configure & Quote | |
| 80E07B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1) | Configure & Quote | |
| 80E08B | 8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | Configure & Quote | |
| 80E09B | 8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1) | Configure & Quote | |
| 80E10B | 8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) | Configure & Quote | |
| 80E11 | 8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | Configure & Quote | |
| 80E11X1 | 8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) | Configure & Quote | |
| 82A04B | 8000 Series, Phase Reference Module (includes D1) | Configure & Quote |
| 400G-TXO support IEEE 802.3bs and 802.3cd: 50GBASE-FR/LR, 100GBASE-DR, 200GBASE-DR4/ LR4/FR4 and 400GBASE-LR8/FR8/DR4 Optical Conformance and Characterization Solution for DSA8300 V 1.0.2 The 400G-TXO application package is an automated conformance and characterization solution for IEEE 802.3bs and IEEE 802.3cd specifications. This package operates on DSA8300 sampling instrument with 80C10C optical module. The 80S400G-TXO offers a… Part number: 066191901 | Application | |
| Oscilloscope Selection Guide From basic signal-checking to high-performance analysis, this selection guide gives an overview of the complete range of oscilloscopes from Tektronix. Literature number: 46W-31080-5 | Selection Guide | 07 Apr 2019 |
| TekExpress RIN Automated Measurement Solution Software Application - V1.1.2 TekExpress RIN provides an automated, simple, and efficient way to take RIN (Relative Intensity Noise) and RINxOMA (Optical Modulation Amplitude) measurements on optical signals.-RIN and RINxOMA measurements can be performed on PRBS7, PRBS9,PRBS11, PRBS13… Part number: 066181602 | Application | |
| 100GBASE-SR4 and TDEC Measurement Solution for DSA8300 - V1.1.2 The TekExpress 100GBASE-SR4 / TDEC Automated Measurement Solution provides turnkey testing and characterization of Tx Optical properties key to the SR4 Short Reach EthernetSpecifications outlined in IEEE 802.3bm. Part number: 066179403 | Application | |
| 80SJNB, 80SJARB, SDLA Visualizer and Scope Noise Characterization Application Software Release - V4.5.9.0, V4.0.4.0, V2.2.0.4, V 1.0.0.64 80SJNB, 80SJARB, SDLA Visualizer, and Scope Noise Characterization software run on the DSA8300 instruments with Windows 7 Operating System. This release of 80SJNB adds updates to TDECQ measurements in support of 100 ? 400 Gbps, PAM4 signal analysis, with… Part number: 066134713 | Application | |
| DSA8300 Digital Serial Analyzer, 80C00/80E00/80A00 modules Specifications
This document lists the warranted and typical specifications for the DSA8300 Digital Serial Analyzer, 80C00 Series Optical Sampling Modules, 80E00 Series Electrical Sampling Modules, and 80A00 Modules. Part number: 077057104 | Performance Verification | |
| 2019 Tektronix and Keithley Product Catalog Browse the new Tektronix and Keithley Product Catalog and explore our complete line of test and measurement solutions. You will find over 90 pages of key product details and specifications, application information, quick-reference selection guides and… | Selection Guide | 24 Feb 2019 |
| NRZ-M4 Optical Manufacturing TDEC Analysis Software for Tektronix DSA8300 - V1.1.0.37 Tektronix NRZ-M4 is a PC based application which offers optical NRZ signaling analysis, including TDEC(Transmitter and Dispersion Eye Closure) measurement. The application brings together NRZ optical measurements in a simple and easy to use application.… Part number: 066199900 | Application | |
| PAM4 Signaling in High Speed Serial Technology: Test, Analysis, and Debug PAM4 Testing for Electrical and Optical SignalsLearn valuable information on testing PAM4 technology and approaches for validating PAM4 signals. This application note describes: PAM4 technology for 50-400G applications Provides details of PAM4 signaling Outlines important aspects of evaluating… Literature number: 55W-60273-2 | Application Note | 04 Jan 2019 |
| DSA8300 Datasheet Digital Serial Analyzer Sampling Oscilloscope The DSA8300 is a state-of-the-art Equivalent Time Sampling Oscilloscope that provides the highest fidelity measurement and analysis capabilities for Communications Signal Analysis, Serial Data Network Analysis, and Serial Data Link Analysis applications… Literature number: 85W-26988-21 | Datasheet | |
| XYZs of Oscilloscopes Primer After reading this primer, you will be able to: Describe how oscilloscopes work, Describe the differences between analog, digital storage, digital phosphor, and digital sampling oscilloscopes, describe electrical waveform types, understand basic… Literature number: 03Z-8605-7 | Primer | 05 Dec 2018 |
| 80SJNB, 80SJARB and SDLA Visualizer Application Software Release - v4.3.2.0 and v4.0.4.0 and V2.2.0.4 80SJNB, 80SJARB, and SDLA Visualizer software run on the DSA8300 instruments with Windows 7 Operating System. This release of 80SJNB adds a TDECQ option in support of 100 – 400 Gbps, PAM4 signal analysis, with focus on the TDECQ (Transmitter and… Part number: 066134710 | Application | |
| Effects of Infiniband Fixture Crosstalk on Synthesized Eye Diagram Application note for de-embedding fixture crosstalk from synthesized eye diagrams working on characterization of Infiniband designs. Literature number: 61W-19673-0 | Application Note | 11 Nov 2018 |
| Programmable Interface Changes Between Tektronix DSA8200 and DSA8300 Sampling This document contains the summary of changes to the Programmable Interface (PI).Comments on GPIB and TekVisa Literature number: 85W-27063-0.pdf | Whitepaper | 11 Nov 2018 |
| 80A00, 80C00, 80E00, and 82A00 Series This document describes proper sampling module handling and installation instructions, and the instrument operating systems and TekScope application versions needed to support specific modules. Part number: 071138611 | User |