2600B Series SMU

Complete production test without sacrificing footprint

Meet all your production test needs with two completely isolated channels of wide dynamic source and measure within the same footprint. Each 40 W channel provides 6½-digit precision resolution source and measure from 10 A pulse to 0.1 fA and 200 V to 100 nV at less than 100 µs pulse width and within 0.1% of settled value.

Simplifying FET Testing with 2600B

Highlights

• Up to 2 channels in the same footprint
• Widest dynamic range of voltage and current
• Highly accurate 100 µs pulse expanding DC production test capabilities

System performance, without a mainframe

TSP-Link® technology enables expansion up to 64 channels for high-speed, SMU-per-pin parallel testing without a mainframe. All channels are simultaneously and independently controlled at a tight <500 ns.

Increasing Production Throughput of Multi-pin Devices with Keithley Series 2600B

Highlights

• Supports <500 ns channel-to-channel synchronization
• Up to 32 SMUs or 64 independent SMU channels
• Reconfigure easily as test requirements change

Learn more. Gain more.

Source Measure Unit Tutorial Learning Center brings together a wealth of information on Keithley SMUs and other products in an all-in-one, convenient location. We provide links to a wide variety of content related to the applications and industries we serve.

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2601B, 2602B, 2604B System Sourcemeter SMU Instruments

The 2601B, 2602B, and 2604B are 40W DC / 200W Pulse SMUs with 10 A pulse, 3A to 100 fA and 40 V to 100 nV DC capabilities. They combine the capabilities of a precision power supply, true current source, 6½-digit DMM, arbitrary waveform generator, pulse generator, and electronic load – all into one tightly integrated instrument. The 2601B is a single model where the 2602B and 2604B are dual channel models.

Simplifying FET Testing with Series 2600B System SourceMeter SMU Instruments

Diode Production Testing with Series 2600B

Optimizing Switched Measurements with the Series 3700 System Switch/Multimeter and Series 2600 System SourceMeter® Instruments Through the Use of TSP

Highlights

• 0.015% basic measure accuracy with 6½-digit resolution
• Value priced 2604B does not include TSP-Link, Digital I/O, Contact Check
• Rear panel Phoenix connectors for quick signal connections
• Use with KickStart Software

2634B, 2635B, 2636B System Sourcemeter SMU Instruments

The 2634B, 2635B, and 2636B are 30W DC / 200W Pulse SMUs with 10 A pulse, 1.5A to as low as 0.1 fA and 200 V to 100 nV DC capabilities, perfect for testing very sensitive, low current semiconductor devices and much more. The 2635B is a single model where the 2634B and 2636B are dual channel models.

IDDQ Testing and Standby Current Testing with Series 2600 System SourceMeter® Instruments

Highlights

• 0.015% basic measure accuracy with 6½-digit resolution
• Value priced 2634B does not include TSP-Link, Digital I/O, Contact Check, 1fA measure resolution
• Rear panel triax connectors for very low current measurements
• Up to 20,000 readings/second into memory

3D Sensing and Image Characterization

The growing demand for distance and velocity measurements in three-dimensional space is evident in many applications from autonomous driving in the automotive industry, augmented reality in gaming and consumer products, and human-machine interfaces and robotics in industrial applications. SMUs are deployed to test Vertical Cavity Surface Emitting Lasers (VCSELs) widely used for obtaining depth information in 3D applications.

2626 High Throughput DC Production Testing of Laser Diode Modules and VCSELs with the Model 2602B System SourceMeter Instrument

Enhancing Trigger Synchronization for High Volume Production Testing of VCSELs with Series 2600B System SourceMeter® Instruments

Highlights

• Programmable current source up to 10 A and 100 µs
• Voltage and current measure resolution at 100 nV and 0.1 fA
• Built-in TSP processing capability reduces PC-instrument bus communication

IDDQ Testing and Standby Current Testing

Keithley's 2634B/35B/36B models feature industry's best low currrent sensitivity designed for the throughput requirement of a production environment. It is ideal for measuring quiescent (standby)current, aka leakage currents or IDDQ for manufacturers of CMOS integrated circuits and electronic products in order to check for shorted gate oxide and other defects that may cause a failure over time.

IDDQ Testing and Standby Current Testing

Highlights

• 0.1 fA resolution
• 7x faster settling time than competition

Power Management Device Testing

DC-DC converters are widely used electronic components that convert DC power from one voltage level to another while regulating the output voltage. The output provides a constant voltage to a circuit, regardless of variations in the input voltage or the load current. Dual Channel 2600B SMUs and Scopes are used to test power management devices.

Simplifying DC-DC Converter Characterization

Highlights

• Dual channel SMU for testing Input/Output power
• AC tests include measuring the turn-on time, ripple, spectral analysis, and transient response.

Keithley IVy - Wireless I-V characterization on a mobile device

Keithley IVy is the fastest and easiest way to perform current-voltage characterization, troubleshoot your device under test (DUT), and share the measurement results without programming, while gaining a deeper understanding of your DUT!

How-to connect a 2600B SMU to your mobile device

Click here to download IVy app for iOS

Click here to download IVy app for Android

Highlights

• Compatible with Keithley Series 2600B SourceMeter SMU Instruments
• Visualize two-terminal devices in I-V mode
• View your device’s behavior in time mode
• Share your data instantly via e-mail, Dropbox, or Google Drive