2600B Series SMU

Meet all your production test needs with two completely isolated channels of wide dynamic source and measure within the same footprint. Each 40 W channel provides 6½-digit precision resolution source and measure from 10 A pulse to 0.1 fA and 200 V to 100 nV at less than 100 µs pulse width and within 0.1% of settled value.

Simplifying FET Testing with 2600B

Highlights

• Up to 2 channels in the same footprint
• Widest dynamic range of voltage and current
• Highly accurate 100 µs pulse expanding DC production test capabilities

TSP-Link® technology enables expansion up to 64 channels for high-speed, SMU-per-pin parallel testing without a mainframe. All channels are simultaneously and independently controlled at a tight <500 ns.

Increasing Production Throughput of Multi-pin Devices with Keithley Series 2600B

Highlights

• Supports <500 ns channel-to-channel synchronization
• Up to 32 SMUs or 64 independent SMU channels
• Reconfigure easily as test requirements change

Source Measure Unit Tutorial Learning Center brings together a wealth of information on Keithley SMUs and other products in an all-in-one, convenient location. We provide links to a wide variety of content related to the applications and industries we serve.

See all SMU tutorials

Industry's best DC test system for Laser Diode (LD) production test uses high speed and high accuracy SMUs for both current sourcing and voltage-current monitoring of laser diode modules, photodiode current. SMUs are the most cost-effective LIV instrumentation with high system synchroization and throughput.

High Throughput DC Production Testing of Laser Diode Modules and VCSELs

Highlights

• Programmable current source up to 10 A and 100 µs
• Voltage and current measure resolution at 100 nV and 0.1 fA
• Built-in TSP processing capability reduces PC-instrument bus communication

Keithley's 2636B/35B models feature industry's best low currrent sensitivity designed for the throughput requirement of a production environment.  It is ideal for measuring quiescent (standby)current, aka leakage currents or IDDQ for manufacturers of CMOS integrated circuits and electronic products in order to check for shorted gate oxide and other defects that may cause a failure over time.

IDDQ Testing and Standby Current Testing

Highlights

• 0.1 fA resolution
• 7x faster settling time than competition

Making measurements is easy with KickStart.  Characterize your devices and materials quickly and easily without programming.   Visualize real-time results in graphical and tabular format.  Export data tables or graphs for quick reporting or additional analysis in Excel.

Download a 60-Day Trial version of Keithley KickStart

Keithley KickStart Datasheet

Highlights

• GPIB, USB, Ethernet connectivity on Windows OS
• I-V characterization application to support up to 4 source measure unit (SMU) instruments
• Generate linear, log, list, and dual sweeps of voltage and current source with simultaneous measurement

Test Script Builder (TSB) is a software tool that simplifies building test scripts for Keithley’s Test Script Processor (TSP®)-enabled instruments.

Download TSB Software

Highlights

• Send commands and receive responses from the instrument
• Create, manage, and run user scripts
• Debug scripts
• Import factory scripts to view or edit and convert to user scripts