2606B High Density SourceMeter® SMU Instrument

2606B High Density SourceMeter® SMU Instrument

The 2606B High Density System SourceMeter (SMU) Instrument offers four 20-watt SMU channels in a 1U high form factor chassis. As manufacturers need to optimize plant floor space and reduce test time and costs, the 2606B improves density by 3 times, increases throughput, and minimizes the need to add additional racks of test equipment. This SMU is the perfect solution for production testing of Laser Diodes, LEDs, 2- and 3-terminal semiconductors and much more.

CHANNELS

4

V/I RANGE

100fA - 3A
100nV - 20V

ACCURACY

0.015%
6.5 digits

MAX SPEED

20k readings/s to buffer

Improves channel density by 3 times

When production test rack space comes at a premium and you need to minimize adding new test racks, the 2606B enables you to add more channel capacity in the same rack area compared to traditional 2U form factor SMUs.

  • Easy to stack and rack
  • No additional 1U thermal spacing required
  • Get 3 times more channels occupying the same amount of rack space
  • Get the same number of channels and occupy 3x less space

Incorporates the capabilities of two 2602B's

Experience the same superior measurement integrity, synchronization, speed, and accuracy as the industry leading Keithley 2602B System SourceMeter, but in a 1U form factor. The 2606B also uses the same analog, digital I/O, and TSP Link connectors as the 2602B, enabling seamless migration.

  • 0.015% basic measure accuracy
  • 6 1/2 digits resolution
  • 100nA low current range with 2pA sensitivity
  • 8-pin Phoenix analog and 25-pin digital I/O connectors

System performance for unmatched production throughput

Test Script Processor (TSP®) technology embeds and executes complete test programs inside the SMU instrument to deliver industry-best performance. TSP-Link® technology enables expansion up to 64 channels for high-speed, SMU-per-pin parallel testing without a mainframe. All channels are simultaneously and independently controlled at a tight <500 ns.

  • Eliminates time-consuming bus communications to and from the PC
  • TSP script code compatible with Instrument 2602B SourceMeter
  • Connect up to 32 TSP-Link nodes or 64 independent SMU channels
  • Reconfigure easily as test requirements change

Models

Model Channels Max Current Source/Measure Range Max Voltage Source/Measure Range Measurement Resolution (Current / Voltage) Power List Price
2606B

4

3A

20V

100fA / 100nV

20 W

-
Configure & Quote
Model 2606B
ChannelsMax Current Source/Measure RangeMax Voltage Source/Measure Range

4

3A

20V

Measurement Resolution (Current / Voltage)Power

100fA / 100nV

20 W

Model Channels Max Current Source/Measure Range Max Voltage Source/Measure Range Measurement Resolution (Current / Voltage) Power List Price
2606B

4

3A

20V

100fA / 100nV

20 W

-
Configure & Quote
Model 2606B
ChannelsMax Current Source/Measure RangeMax Voltage Source/Measure Range

4

3A

20V

Measurement Resolution (Current / Voltage)Power

100fA / 100nV

20 W

Laser Diode (VCSEL) Production Test for 3D Sensing Applications

Industry's best DC test system for Laser Diode (LD) production test uses high speed and high accuracy SMUs for both current sourcing and voltage-current monitoring of laser diode modules, photodiode current. SMUs are the most cost-effective LIV instrumentation with high system synchroization and throughput.

  • Programmable current source up to 3 A and 100 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 0.1 fA
  • Built-in TSP processing capability reduces PC-instrument bus communication

High Volume Production Test of LEDs

The 2606B SMU is an industry leading instrument for LED DC characterization and production test. It's configurable to source current or voltage coupled with voltage and current measurement at 0.015% basic measure accuracy for a variety of test needs. In addition, the Test Script Processor (TSP®) technology provides throughput advantages.

  • Programmable current source up to 3 A and 100 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 0.1 fA
  • Built-in TSP processing capability reduces PC-instrument bus communication
  • Daisy-chain up to 64 channels for high volume parallel test

Transistor Characterization with Multi-Channel SMU Instruments

With its integrated source and measure, voltage or current, precision and accuracy, a 2606B System SourceMeter SMU instrument is ideal for testing transistors on wafer or in packaged parts including capturing drain family of curves, threshold voltage, gate leakage and transconductance.

  • Programmable current source up to 3 A and 100 µs pulse widths
  • Voltage and current measure resolution at 100 nV and 0.1 fA
  • Best accuracy 0.015% with 6½-digit resolution
  • Built-in TSP processing capability reduces PC-instrument bus communication
Data Sheet Accessory Description
View Datasheet 2600-BAN BANANA TEST LEADS/ADAPTER CABLE
View Datasheet 2600-FIX-TRX CABLE CONNECTING 2600 SMU TO HI AND LO TRIAX
View Datasheet 2600-KIT 2600 SERIES SCREW TERMINAL CONNECTOR KIT
View Datasheet 2600-TLINK 2600 SERIES TRIGGER I/O TO TLINK INTERFACE CABLE
View Datasheet 2600-TRIAX TRIAX ADAPTER FOR 2600 SERIES
View Datasheet 7078-TRX-1 3 SLOT TRIAX CABLE, 1 FT
View Datasheet 7078-TRX-10 3 SLOT TRIAX CABLE, 10FT
View Datasheet 7078-TRX-12 3 LUG TRIAX CABLE, 12FT
View Datasheet 7078-TRX-20 3 SLOT TRIAX CABLE, 20FT
View Datasheet 7078-TRX-3 3 SLOT TRIAX CABLE, 3FT
View Datasheet 7078-TRX-5 3 SLOT TRIAX CABLE, 5FT
View Datasheet 7078-TRX-GND 3-SLOT MALE TRIAX TO BNC ADAPTER (GUARD REMOVED)
7079-308A Digital I/O Connector (model specific)
174710700 CAT5 crossover cable for TSP-Link and direct Ethernet connections
View Datasheet 8606 MODULAR PROBE KIT
CA-126-1A Digital I/O and trigger cable, 1.5m
How to clear a function without having to recycle power on the 2600B series.
The easiest way to delete a function is to set it equal to nil, e.g. myfunc = nil. You should then call the collectgarbage() function to free up the memory. Garbage collection will actually occur automatically, but it can take up to a few seconds to…
FAQ ID: 729091 06 Dec 2018
Source Measure Units - Save Time, Space and Money and Make Multiple Measurements Accurately Using a Single Instrument
Learn how the integrated five-in-one functionality of just one source measure unit (SMU) instrument eliminates many of the issues associated with using multiple instruments, including workspace clutter, measurement insight delays and much higher costs.…
Literature number: 1KW-61419-0
Brochure 13 Nov 2018
Model 2606B System SourceMeter Declassification and Security Instructions

Part number: 077143300
Declassification
Model 2606B System SourceMeter Instrument Reference Manual The Model 2606B Reference Manual is a complete reference that…This manual includes advanced operation topics and maintenance information. Programmers looking for a command reference, and users looking for an in-depth description of the way the instrument works (including troubleshooting and optimization), should…
Part number: 2606B-901-01B
Primary User
Model 4299-13 Rack Mount Kit Installation Instructions
These instructions describe how to use the Model 4299-13 to mount a 1U full-rack Keithley Instrument in a standard 48.3 cm (19 in.) rack.
Part number: 071357400
User
Modèle 2606B Liste d'avertissements
Les points suivants correspondent aux avertissements utilisés dans le Manuel de référence du système 2606B.
Part number: 077143100
User
Test Script Builder Software Suite Version J02 (Windows 10, 8, 7, Vista Compatible)
"""Keithley Instruments Test Script Builder (TSB) is a software tool that simplifies building and creating test scripts. It includes built-in color coding, debugging tools, and error handling. You can use TSB to perform the following operations:- Send…
Part number: KTS-850J02
Application
Source Measure Unit (SMU) Instruments Selector Guide

Literature number: 1KW-61458-0
Product Selector Guide 09 Nov 2018
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