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You’re Invited! Booth #511
Join us at IEEE Applied Power Electronics Conference, March 22-26, 2026, at the Henry B. Gonzalez Convention Center to experience the latest power testing solutions and connect with our experts. Our team look forward to seeing you there.
Explore Our Showcased Solutions
Enable High Channel Count Parallel Testing
- Mix & match SMU/PSU modules in one mainframe
- Minimize downtime with easy module removal & swapping
- Precisely measure low currents down to picoamps (pA)
- Maintain measurement integrity across channels with synchronized sourcing and measurement
- Scale test capacity through a modular architecture without redesigning the test rack
Correlate 3-Phase Inverter Performance with Robotic Motion
- Perform 3-phase electrical and mechanical measurements to correlate inverter behavior with robotic joint motion
- Enable fast, reliable test setups with robust triggering and phasor diagrams
- Use mixed domain analysis to correlate speed and directional changes with electrical performance and impacts on EMI
- Capture dynamic behavior using measurement trend plots
- Stream and analyze synchronized waveforms from multiple oscilloscopes in TekScope PC
Power the Next Generation of AI Servers with Confidence
- Design, measure, and validate high performance PDNs for AI and datacenters
- Optimize AI and datacenter PDN designs with precise measurement of ultra-low voltage, ultra-high currents and nanosecond scale transient events
- Assess the stability of time- variant PDN systems using advanced techniques such as SEPIA, without breaking the control loop
- Validate ultra-low impedance performance under real-world, high-speed load conditions
Simplify Double-Pulse Testing for Production and Validation
- Configure turnkey double pulse test systems for production and validation needs
- Test modules and discrete silicon, SiC, and GaN devices on a single flexible platform
- Reduce setup time using reusable test code
- Apply test voltages up to 2 kV, 4.5 kV and 10 kV, and currents up to 6.5 kA
- Integrate with existing manufacturing and lab infrastructure
Ensure Accurate, Repeatable Double-Pulse Testing for SiC and GaN Designs
- Meet JEDEC and IEC standards using integrated oscilloscope-based double-pulse test software
- Measure high-bandwidth gate and drain current accurately with isolated shunt probing
- Capture isolated high-side gate-voltage waveforms without compromising measurement integrity
- Calculate switching losses precisely using patented deskew algorithms
- Extract dynamic RDS(on) without external clamping circuitry
Unlock 3-Channel High-power Bidirectional Testing
- Maximize performance with three isolated DC channels, each up to 10 kW, supporting up to 920 V or up to 340 A
- Consolidate multiple testing setups reducing cost, equipment needs and test time
- Program and get your data faster with faster than 1 ms response time
- Deliver full power across a wide operating range with autoranging, which automatically adjusts voltage or current to handle diverse combinations with a single unit
- Boost efficiency with 96% energy recovery with regenerative DC loads
Come Hear Tek Experts
| Date | Presentation | Time | Location |
| Tuesday, March 24, 2026 | Trends in Wide Bandgap Double Pulse Testing and the Role of AI in Accelerating Automation | 11:30 AM - 11:55 AM CT | 123 |
| Tuesday, March 24, 2026 | Fast Out of the Gate: Measuring Gate Driver Performance in SiC Systems | 14:15 PM – 14:45 PM CT | 214A |
Reach out to sales for product questions, to get a quote, or with inquiries about purchases.