Conformance and Characterization Solution for Sampling Scopes
IEEE 802.3bs (200GBASE-DR4/LR4/FR4 and 400GBASE-DR4/LR8/FR8) and IEEE 802.3cd (50GBASE-FR/LR and 100GBASE-DR) Optical Equivalent Time Transmitter Conformance and Characterization Solution
The Tektronix time instrument based characterization automation system provides turnkey testing and debugging for the industries most common optical interfaces. As the designers need to perform the validation of 50GBASE-FR/LR, 100GBASE-DR, 200GBASE-DR4/LR4/FR4 and 400GBASE-LR8/FR8/DR4 standards, these tools are brought together in a single 400G-TXO (Optical Transmitter Validation) package.
400G-TXO application package is an automated conformance and characterization solution for IEEE 802.3bs and IEEE 802.3cd specifications. This package operates on DSA8300 sampling instrument with 80C10C optical module. The 80S400G-TXO offers a selection of 50G, 100G, 200G, and 400G compliance tests according to IEEE 802.3bs and IEEE 802.3cd LR, DR and FR standards. It automatically populates the tests required and data rates for the selected standard. The unique lower noise levels of the DSA8300 sampling architecture in combination with the 80C10C optical sampling module offers a 56 GBaud PAM-4 solution, capable of meeting the 56G ORR standard requirement.
400G-TXO offers a streamlined and fully automated optical compliance and debug tool for TDECQ.
400G-TXO offers support for IEEE 802.3bs/cd LR, DR and FR standards.
Extends 80SJNB for analysis and debug of 50G, 100G, 200G, and 400GBase FR8/LR8/DR4 standards.
- Optical transmitter measurements for IEEE 802.3bs and IEEE 802.3cd specifications.
- Validation of 50GBASE-FR/LR, 100GBASE-DR, 200GBASE-DR4/LR4/FR4 and 400GBASE-LR8/FR8/DR4 standards.
|50G (26.5625 GBd)||50GBASE-FR|
|100G (53.125 GBd)||100GBASE-DR|
|200G (26.5625 GBd)||200GBASE-DR4|
|400G (26.5625 GBd)||400GBASE-FR8|
|400G (53.125 GBd)||400GBASE-DR4|
IEEE 802.3bs and IEEE 802.3cd Optical Transmitter fully automated measurements
|Test Point||Supported measurements||Specification reference|
|TP2||Transmitter and Dispersion Eye Closure (TDECQ)||IEEE 802.3bs or IEE802.3cd|
|Average Launch Power||IEEE 802.3bs or IEE802.3cd|
|Outer Optical Modulation Amplitude||IEEE 802.3bs or IEE802.3cd|
|Signaling Rate||IEEE 802.3bs or IEE802.3cd|
|Launch Power in OMA outer minus TDECQ||IEEE 802.3bs or IEE802.3cd|
|Extinction Ratio||IEEE 802.3bs or IEE802.3cd|
|Average Launch Power of Off Transmitter||IEEE 802.3bs or IEE802.3cd|
|RINxOMA||IEEE 802.3bs or IEE802.3cd|
|Test Point||Supported optical transmitter specifications||Specification reference|
|TP2||50GBASE-FR/LR||IEEE 802.3cd, section D1.0, table 139-6|
|100GBASE-DR||IEEE 802.3cd, section D1.0, table 140-6|
|200GBASE-DR4||IEEE 802.3bs, section D2.2, table 121-6|
|200GBASE-LR4/FR4||IEEE 802.3bs, section D2.2, table 122-9|
|400GBASE-LR8/FR8||IEEE 802.3bs, section D2.2, table 122-10|
|400GBASE-DR4||IEEE 802.3bs, section D2.2, table 124-6|
TDECQ is the penalty given by the ratio of the noise a receiver could add to an ideal transmitter and ideal channel to get a certain symbol error rate (SER) to the noise a receiver could add to the device under test (DUT) and worst case channel to get same SER.
TDECQ is measured on equalized PAM4 signal. Average optical power of the equalized eye diagram is determined and crossing points (0 UI and 1 UI) are determined by the average of eye diagram crossing times at Pave. Two vertical histograms are measured through the eye diagram, centered at 0.45 UI and 0.55 UI. Each of the histogram windows spans all of the modulation levels of the eye diagram.
Default histogram window width is 0.04 UI and it is configurable. Each histogram window has outer height boundaries which are set beyond the extremes of the eye diagram.
Instrument noise and equalizer gain are compensated while computing TDECQ.
The setup and test execution are simple with the 400G-TXO software. The oscilloscope acquisition and analysis are controlled through the 400G-TXO automation solution. The graphical User Interface (GUI) provides an intuitive and easily repeatable work-flow for setup and testing.
TekExpress® 400G-TXO measurement list
TekExpress 400G-TXO offers flexible control over the test configuration such as analysis windows and other parameters.
Users can select the standard and parameters to be tested. This supports characterization measurement in compliance with the standard and reduces the test time and complexity.