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BERTScope BSA Series

The BSA Series is no longer available for purchase. The Tektronix BSX Series BERTScope® are recommended replacements. Information on these products is located at www.tek.com/bit-error-rate-tester/bsx-series-bertscope®-bit-error-rate-tester.

Perform bit error ratio detection more quickly, accurately and thoroughly by bridging eye diagram analysis with BER pattern generation. The BERTScope Bit Error Rate Tester Series enables you to easily isolate problematic bit and pattern sequences, then analyze further with seven types of advanced error analysis that deliver unprecedented statistical measurement depth.

Features

Benefits

Pattern Generation and Error Analysis, highspeed BER Measurements up to 28.6 Gb/sec. The combination of impairment modulation, signal generation and analysis in one instrument enables receiver BER compliance testing for today's 3rd Generation Serial and 100G standards like; IEEE802.3ba, OIF-CEI and 32GFC communications standards.
Integrated Stress Generator for stressed eye sensitivity (SRS) and jitter tolerance compliance testing. A test signal's data rate, applied stress, and data pattern can be changed on the fly, independent of each other; enabling a diverse set of signal variations for testing chipset/system sensitivity.
Integrated, BER correlated eye diagram analysis with pass/fail masks for PCI Express, USB, SATA and other communications standards. Enhances the debug experience unlike other BERT's by providing a familiar eye diagram of the test results to compare against a standards specific mask.
Error Location and BER contour analysis on PRBS 31 and other digital signals up to 28.6 Gb/sec. Provides a quick understanding of signal integrity in terms of BER. Error location provides detailed BER pattern sensitivities to speed up identification of deterministic vs. random BER errors.
Optional Jitter Map provides fast jitter decomposition, accurate stress calibration at the DUT input. Fast, effective method for determining long pattern PRBS31 jitter composition with triangulation. Graphical representation makes jitter analysis more thorough, yet simpler to follow.
Optional Digital Pre-emphasis Processor provides user controlled pre-emphasis on pattern generator supplied data. Enables testing with compliant signals for standards like OIF-CEI3.0, Infiniband EDR,  PCI Express, 10GBASE-KR, SATA, 40GBASE-KR4, 100GBASE-CAUI.
Optional Clock Recovery Units provide clock recovery up to 28.6 Gb/s. Enables compliant testing and accurate Eye Pattern Analysis for high-speed serial and communication system standards.
Accessory BSA12500ISI
Datasheet Description
View Datasheet Differential ISI Board
Accessory BSARACK
Datasheet Description
View Datasheet BSA-Rack Mount Kits, SAFETY CONTROLLED
Accessory PMCABLE1M
Datasheet Description
View Datasheet Precision Phase Matched Cable Pair, 1m
Datasheet Accessory Description
BSA12500ISI Differential ISI Board
BSARACK BSA-Rack Mount Kits, SAFETY CONTROLLED
PMCABLE1M Precision Phase Matched Cable Pair, 1m
View this demonstration of interoperability at OFC2013 using Tektronix DSA8300 Sampling Oscilloscope and BSA286C BERTScope. Tektronix assisted the Optical Internetworking Forum (OIF) and member …
4m 56s
In this video we look at a topic that is becoming increasingly important in the high-speed serial industry—how to perform embedded measurements at the IC or PCB level using probes.
4m 14s
Learn how to address the test and measurement challenges posed by PCIE Gen1-5 for both base silicon testing and CEM compliance testing. Gain insights and solutions for automation, validation, and …
41m
Watch our webinar to learn about characterization, compliance test and validation of new designs for USB 3.1 and the Type-C Connector. You’ll see how you can simplify your validation tasks and …
31m 46s
Python® is one of the preferred software environments to implement test strategy automation, due to its portability, ease of use, and scalability.  This webinar provides a good understanding of …
37m 53s
Get an overview of the optical solutions available from Tektronix. Learn about what we showcased at our OFC 2016 exhibit, then learn more about these solutions online.
1m 16s
Designing and developing 100G components, modules and systems requires the latest tools and techniques. In this video, you'll learn how to:Set up a complete system for active optical cable …
2m 7s
Anatomy of an Eye Diagram
This application note discusses different ways that information from an eye diagram can be sliced to gain more insight. It also discusses some basic ways that transmitters, channels, and receivers are tested. Download the PDF to read more:

Literature Number: 65W_26042_0
Application Note
USB 3.1 Receiver Compliance Testing
In this application note, all aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.        

Literature Number: 55W-26804-0
Application Note
Physical Layer Tests of 100 Gb/s Communications Systems
In this application note, learn how to prepare for compliance measurements on 100G standards including IEEE802.3ba/bj/bm and the tests for optical, electrical, or PAM4 transmitters and receivers that help diagnose noncompliant components and systems.

Literature Number: 65W-28494-1
Application Note
High Speed Interface Standards
This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical resources that will help you understand design …

Literature Number: 55W-60038-1
How-to Guide
How do I use TekExpress to perform a USB 3.0 Device Transmitter Test?
USB 3 Tx Testing ScriptHello and welcome to Tektronix! Today I’m going to walk through a USB 3 Device Transmitter Test using TekExpress.A USB 3 Transmitter test consists of acquiring the signal from a USB 3 Device and running it through various tests …
Faq Id69376
I want to know how to view the .ram user pattern files on the BERT scopes. I used to be able to view them but cannot locate the process anymore.  I would like to view them in hex format.  If I recall correctly, the .RAM format includes repeats for sections of the data, and isn't directly readable.
For viewing of RAM files, use the Editor view.  Within the Editor view, press File, Open, Raw RAM Memory File.
Faq Id64856
Can Microsoft Remote Desktop be used with Windows based oscilloscopes?
Yes, the Remote Desktop feature of the Professional Editions of Windows can be used on Tektronix DPO/MSO/CSA Series Oscilloscopes running Windows XP or later operating systems. In order to use the Remote Desktop feature of Windows, you will need to …
Faq Id61606
I have lost or damaged one of the front panel signal connectors on my Tektronix BERT scope.  How do I obtain a replacement connector?
A replacement connector is Tektronix p/n 131906200.  These connectors are designed to be easily replaceable as they unscrew from the permant front panel input connector.  When damaged, you remove the damaged connector and replace with a new connector …
Faq Id64646
Tektronix BERTScope
BSA & BA Remote Control Guide Programmer Manual

This document describes remote control commands for BERTScope products.
Part Number: 077069605
Programmer
Tektronix BERTScope
BSA & BA Remote Control Guide Programmer Manual

This document describes remote control commands for BERTScope products.
Part Number: 077069604
Programmer
Tektronix BERTScope
Bit Error Ratio Analyzers & Pattern Generators Quick Start User Manual

Supports BSA Software Version 10 and above. This document provides high-level installation information, and instructions on using the Tektronix BERTScope
Part Number: 071286904
Primary User
Tektronix BERTScope
BSA & BA Remote Control Guide Programmer Manual

This document describes remote control commands for BERTScope products.
Part Number: 077069603
Programmer
Tektronix BERTScope
BSA & BA Remote Control Guide Programmer Manual

This document describes remote control commands for BERTScope products.
Part Number: 077069602
Programmer
Tektronix BERTScope
BSAPCI3 Instructions

Provides high-level installation instructions for BERTScope PCIe 3.0 Receiver Testing.
Part Number: 071304600
User
Tektronix BERTScope
Bit Error Ratio Analyzers & Pattern Generators Quick Start User Manual.

Supports BSA Software Version 10 and above. This document provides high-level installation information, and instructions on using the Tektronix BERTScope
Part Number: 071286903
Primary User
Tektronix BERTScope BSA Series
Declassification and Security Instructions

Provides instructions to declassify or cleanse Tektronix BERTscope instruments for security purposes.
Part Number: 077079100
Declassification
Tektronix BERTScope
BSA & BA Remote Control Guide Programmer Manual

This document describes remote control commands for BERTScope products.
Part Number: 077069601
Programmer
ITSRACK
Rackmount Instructions

Use these instructions to assemble and install the BSAITS125 instrument into an instrument rack.
Part Number: 071305100
User
Tektronix BERTScope
BSAITS125 Declassification & Securities Instructions

This document provides information to declassify, sanitize, or secure the BSAITS125 instrument for security purposes
Part Number: 077069500
Declassification
Tektronix BERTSCOPE
BSAITS Quick Start User Manual

This document provides user and setup information for the BSAITS125 interference test set.
Part Number: 071304500
Primary User
BERTScope
QSUM Start Guide BSA Quick Start User Manual

The Tektronix BERTScope BSA85C, BSA125C, BSA175C, and BSA260C Bit Error Ratio Analyzers support serial data interfaces from 1 Gb Ethernet to future 16x Fibre Channel and 4x 25.78 Gb/s 100 Gb Ethernet. BERTScope Bit Error Ratio Analyzers reduce your time to market by providing the most advanced and comprehensive combination of signal integrity analysis and test tools available in a single instrument.
Part Number: 071286901
Primary User
BERTScope Analyzers
BERTScope Bitalyzer Remote Control Guide Programmer Manual

This document describes how to interface with the BitAlyzer/BERTScope using the IEEE‐488 connection.
Part Number: 077067700
Programmer
BERTScope Analyzers
BERTScope Bitalyzer Remote Control Guide Programmer Manual

This document describes how to interface with the BitAlyzer/BERTScope using the IEEE‐488 connection.
Part Number: 077055400
Programmer
BERTScope Analyzers
BERTScope Bit Error Ratio Analyzer Instructions Quick Start User Manual

This document provides Instructions for initial set up, checkout and basic operation of the BERTScope Bit Error Ratio Analyzer
Part Number: 077055200
User
Tektronix BERTScope
Bit Error Ration Analyzers & Pattern Generators Quick Start User Manual

The Tektronix BERTScope BSA85C, BSA125C, BSA175C, and BSA260C Bit Error Ratio Analyzers support serial data interfaces from 1 Gb Ethernet to future 16x Fibre Channel and 4x 25.78 Gb/s 100 Gb Ethernet. BERTScope Bit Error Ratio Analyzers reduce your time to market by providing the most advanced and comprehensive combination of signal integrity analysis and test tools available in a single instrument.
Part Number: 071286900
User
Tektronix Receiver Test Application Software for USB3.1 Gen1 and Gen2 - V2.3.0
USB 3.1 Gen1 and Gen2: Testing is described in the USB-IF Compliance Test Specification (CTS) document. Receiver testing is accomplished by connecting the output of a BERT pattern generator as an input to the DUT, through a specialized set of …

Part Number: 066195002
Application
BERTScope Application Software, V11.02.1903
BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 28.6 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER …

Part Number: 066165804
Application
BSAUSB31 USB 3.1 Receiver Test Application Software, V1.1.1907
The BERTScope USB 3.1 Receiver Test Automation Software runs on a BERTScope or PC, and connects to the BERTScope, DPP, CR, and Instrument Switch test equipment via LAN. It uses remote control automation protocols to fully automate USB 3.1 calibration …

Part Number: 066171100
Application
BERTSCOPE APPLICATION SOFTWARE, V11.02.1886
BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 28.6 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER …

Part Number: 066165802
Application
BSAPCI3 PCIe 3.0 Receiver Test Application Software, V1.1.1449
The PCIe 3.0 Receiver Test Automation Software (BSAPCI3) runs on a BERTScope or peripheral PC, and connects to a BERTScope and DPP (Digital PreEmphasis Processor) test equipment via LAN. It uses remote control automation protocols to fully automate …

Part Number: 066156501
Application
BERTScope Software Release, V 10.15.1284
BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 28.6 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER …

Part Number: 066148402
Firmware
BERTScope Software Release
BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 26 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER pattern …

Part Number: 066123808
Application
BERTScope Driver for LabVIEW V1.0.2
BERTScope? and BERTScope? S Driver for LabVIEW Version 1.0.2 Release Date: June 1, 2006

Part Number: 066130500
Driver
BERTScope Software Release V 10.11.1006
BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 26 Gb/s. They are the industry's first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER pattern …

Part Number: 066123802
Firmware
Bertscope SAS Support files V1.0
The compressed file has the BERTScope User patterns and Jitter Tolerance files for the Bertscope SAS application.

Part Number: 066124900
Application
Bertscope Software Support - Jitter Tolerance Template files V1.0
BERTScope Template files to be used with the Jitter Tolerance applications.

Part Number: 066125000
Waveform
Bertscope USB 3.0 Support files V1.0
The compressed file has the User patterns, Mask, JTOL and Configuration files for the Bertscope USB 3.0 application.

Part Number: 066124700
Waveform
Bertscope PCI Express Support Files V 1.0
The compressed file has BERTScope User patterns, Mask Files and Jitter Tolerance files for the Bertscope PCI Express Application.

Part Number: 066124600
Waveform
Bertscope SATA Support files V1.0
The compressed file has the BERTScope User patterns and JTOL files for the Bertscope SATA application.

Part Number: 066124800
Waveform
Clock Recovery Primer, Part 2
Part 2 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.

Literature Number: 65W_26024_0
Primer
Clock Recovery Primer, Part 1
Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.

Literature Number: 65W_26023_0
Primer
Clock Recovery’s Impact on Test and Measurement
As clock recovery becomes increasingly common in more systems and test setups, its effects on measurements must be considered. Many outside influences can disturb the relationship between data and how it is clocked. By understanding the relationship …

Literature Number: 65W_26074_0
Application Note
Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces. Included is a test and characterization example using a Single Mode 1310 nm laser SFP+ …

Literature Number: 65W_25908_0
Primer
Comparing Jitter Using a BERTScope® Bit Error Rate Testing
Comparison of DCD and F/2 Jitter.

Literature Number: 65W_26040_0
Application Note
Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester
Six sigma is a form of mask testing that provides for critical insight when mask testing depth specification are important for pass/fail testing or deeper evaluation on high-speed signaling standards to provide a significantly more complete picture …

Literature Number: 65W_26046_0
Application Note
Signal Integrity of Reference Clock Bleed-Through in an IC
This application note examines some signal integrity examples related to AMB testing, but also with wider applicability. Clock bleed-through is examined, as well as the effect of a lowered supply voltage on error performance.

Literature Number: 65W_26045_0
Application Note
2020 Tektronix and Keithley Product Catalog
We have the right products to ensure your success. Browse our new Tektronix and Keithley Product Catalog and explore our complete line of test and measurement solutions. You’ll find over 130 pages of key product details and specifications …
Selection Guide
Practices for Measurements on 25 Gb/s Signaling
This application note describes the measurement practices for the characterization and compliance test of the transmitter and receiver for 25+ Gb/s signaling in 100 G systems. Focus is on oscilloscope measurements, with some comments on BERTs.

Literature Number: 86W-29118-1
Application Note
Tektronix Unveils Comprehensive USB 3.1 Compliance Test Solutions
Tektronix USB 3.1 Testing Capabilities include Automated 10 Gb/s Transmitter, Receiver Testing, USB Power Delivery, USB Type-C Cable Test SolutionsBEAVERTON, Ore. - Jan. 20 2015 - Tektronix, Inc., the world's leading manufacturer of oscilloscopes …
News Release
Evaluating Stress Components using BER-Based Jitter Measurements
This primers describes how jitter measurements can be self-verified using a BER-based Jitter Peak measurement and how to simplify the jitter measurement challenge by using a pattern that does not contribute pattern-dependent effects, and finally …

Literature Number: 65W_26050_0
Primer
Exploring Power Supply Voltage Sensitivity in an IC with a BERTScope® Bit Error Rate Tester
Eye diagrams alone may not be as effective in showing major system issues and should be coupled with BER-based measurements for deeper insight and problem resolution.

Literature Number: 65W_26044_0
Application Note
Exploring Power Supply Voltage Sensitivity in an IC with a BERTScope® Bit Error Rate Tester
Eye diagrams alone may not be as effective in showing major system issues and should be coupled with BER-based measurements for deeper insight and problem resolution.

Literature Number: 65W_26044_0
Application Note
Stress Calibration for Jitter >1UI
While measuring the amount of jitter present on a signal is relatively straight forward conceptually; when the levels of jitter are small, amounts above a bit period (1 unit interval or UI) can be more difficult. This has practical consequences for …

Literature Number: 65W_26047_0
Application Note
Stressed Eye Primer
In addition to an introduction to stressed eye testing, this primer discusses some of the high-speed standards that use it, and how a receiver test using stressed eye is constructed.

Literature Number: 65W_26049_0
Primer
Stressed Eye: “Know What You’re Really Testing With”
BER-based measurements can provide a better view of the stress eye opening down at the deep BER levels that the receiver will be expected to operate at when it is tested.

Literature Number: 65W_26048_0
Primer
Bridging the Gap Between BER and Eye Diagrams — A BER Contour Tutorial
BER Contour Measurement - What it is, how it is constructed, and why it is a valuable way of viewing parametric performance at gigabit speeds.

Literature Number: 65W_26019_0
Application Note
BSA Series BERTScope Bit Error Rate Testers Fact Sheet
This BERTScope Fact Sheet contains key specs and ordering information for the BSA Series BERTScope Bit Error Rate Testers.

Literature Number: 65W-25456-0
Fact Sheet
D.C. Blocks, a Trap for the Unwary When Using Long Patterns
It is obvious to focus on ensuring that the upper frequency of the range is adequate to pass the desired data signal; while it is less obvious to worry about the low end frequency specification, this application note discusses that it can be equally …

Literature Number: 65W_26043_0
Application Note
BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood”
Delve into jitter problems in new ways, such as examining Random Jitter on each edge of the data pattern, separating out the jitter caused by transmitter pre-emphasis, and performing jitter decomposition on long patterns such as PRBS-31.  

Literature Number: 65W_25907_0
Application Note
Dual-Dirac+ Scope Histograms and BERTScan Measurements
This primer discusses how the dual-Dirac relates to practical measurements that can be made with sampling scopes and BER-based instruments.

Literature Number: 65W_26041_0
Primer
PCI Express® Transmitter PLL Testing — A Comparison of Methods
There are several methods of measuring PLL loop response, based on the type of test instrumentation used. As expected, the various methods trade off test accuracy, test speed (throughput), ease of use, ease of setup, and initial cost. In addition …

Literature Number: 65W_25911_0
Primer
M-PHY Receiver Solution Datasheet
GRL’s MIPI MPhy Receiver Calibration and Test Application Software for the Tektronix BERTScope™ BSA(GRL-MIPI-MPHY-RX) provides an automated, simple, and efficient way to test MIPI MPhy Receiver to the Jitter Tolerance and other test requirements of …
Datasheet