BSA Series BERTScope® Bit Error Rate Tester

The Confidence of a BERT with the Insight of an Oscilloscope

Perform bit error ratio detection more quickly, accurately and thoroughly by bridging eye diagram analysis with BER pattern generation. The BERTScope Bit Error Rate Tester Series enables you to easily isolate problematic bit and pattern sequences, then analyze further with seven types of advanced error analysis that deliver unprecedented statistical measurement depth.

Price starting from
Max Data Rate

Bit Error Ratio Analyzer

12.5 Gb/s

Max Data Rate

Bit Error Ratio Analyzer

17.5 Gb/s

Max Data Rate

Bit Error Ratio Analyzer

28.6 Gb/s



Pattern Generation and Error Analysis, highspeed BER Measurements up to 28.6 Gb/sec. The combination of impairment modulation, signal generation and analysis in one instrument enables receiver BER compliance testing for today's 3rd Generation Serial and 100G standards like; IEEE802.3ba, OIF-CEI and 32GFC communications standards.
Integrated Stress Generator for stressed eye sensitivity (SRS) and jitter tolerance compliance testing. A test signal's data rate, applied stress, and data pattern can be changed on the fly, independent of each other; enabling a diverse set of signal variations for testing chipset/system sensitivity.
Integrated, BER correlated eye diagram analysis with pass/fail masks for PCI Express, USB, SATA and other communications standards. Enhances the debug experience unlike other BERT's by providing a familiar eye diagram of the test results to compare against a standards specific mask.
Error Location and BER contour analysis on PRBS 31 and other digital signals up to 28.6 Gb/sec. Provides a quick understanding of signal integrity in terms of BER. Error location provides detailed BER pattern sensitivities to speed up identification of deterministic vs. random BER errors.
Optional Jitter Map provides fast jitter decomposition, accurate stress calibration at the DUT input. Fast, effective method for determining long pattern PRBS31 jitter composition with triangulation. Graphical representation makes jitter analysis more thorough, yet simpler to follow.
Optional Digital Pre-emphasis Processor provides user controlled pre-emphasis on pattern generator supplied data. Enables testing with compliant signals for standards like OIF-CEI3.0, Infiniband EDR,  PCI Express, 10GBASE-KR, SATA, 40GBASE-KR4, 100GBASE-CAUI.
Optional Clock Recovery Units provide clock recovery up to 28.6 Gb/s. Enables compliant testing and accurate Eye Pattern Analysis for high-speed serial and communication system standards.


Data SheetAccessoryDescription
BSA12500ISI Differential ISI Board
PMCABLE1M Precision Phase Matched Cable Pair, 1m
Data SheetSoftware Package / Software OptionDescriptionConfigure and Quote
BSAPCI3 Stressed Eye Calibration Application Software Configure & Quote
Clock Recovery Primer, Part 2

Look at clock recovery from a practical point of view, Part 2.

Comparing Jitter Using a BERTScope® Bit Error Rate Testing

Comparison of DCD and F/2 Jitter.

Application Note
Dual-Dirac+ Scope Histograms and BERTScan Measurements

Introduction to Dual-Dirac.

Evaluating Stress Components using BER-Based Jitter Measurements

Self-verified jitter measurements using a BER-based Jitter Peak measurement.

PCI Express® Transmitter PLL Testing — A Comparison of Methods

Overview of significant methods for performing PLL Testing

Stressed Eye: “Know What You’re Really Testing With”

Using BER-based analysis to improve stress calibration measurements.

Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester

Using Six Sigma for citical insight.

Application Note
USB 3.1 Receiver Compliance Testing

All aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.

Application Note
Anatomy of an Eye Diagram

Description of an eye diagram, how it is constructed, and common method for generating one.

Application Note
Clock Recovery’s Impact on Test and Measurement

This application note discusses the outside influences that can disturb the relationship between data and how it is clocked.

Application Note
2017 Tektronix and Keithley Product Catalog

Browse the new Tektronix and Keithley Product Catalog and explore our complete line of test and measurement solutions. You will find over 130 pages of key product details and specifications, application information, quick-reference selection guides and more for our complete line of products.

Selection Guide
In this video we look at a topic that is becoming increasingly important in the high-speed serial industry—how to perform embedded measurements at the IC or PCB level using probes.
0h 4m 13s
Get an overview of the optical solutions available from Tektronix. Learn about what we showcased at our OFC 2016 exhibit, then learn more about these solutions online.
0h 1m 15s
Designing and developing 100G components, modules and systems requires the latest tools and techniques. In this video, you'll learn how to:Set up a complete system for active optical cable…
0h 2m 7s
View this demonstration of interoperability at OFC2013 using Tektronix DSA8300 Sampling Oscilloscope and BSA286C BERTScope. Tektronix assisted the Optical Internetworking Forum (OIF) and member…
0h 4m 55s
Python® is one of the preferred software environments to implement test strategy automation, due to its portability, ease of use, and scalability.  This webinar provides a good understanding of…
0h 37m 53s

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