BSA Series BERTScope® Bit Error Rate Tester

BSA Series BERTScope® Bit Error Rate Tester

The BSA Series is no longer available for purchase. The Tektronix BSX Series BERTScope® are recommended replacements. Information on these products is located at www.tek.com/bit-error-rate-tester/bsx-series-bertscope®-bit-error-rate-tester.

Perform bit error ratio detection more quickly, accurately and thoroughly by bridging eye diagram analysis with BER pattern generation. The BERTScope Bit Error Rate Tester Series enables you to easily isolate problematic bit and pattern sequences, then analyze further with seven types of advanced error analysis that deliver unprecedented statistical measurement depth.

Features

Benefits

Pattern Generation and Error Analysis, highspeed BER Measurements up to 28.6 Gb/sec. The combination of impairment modulation, signal generation and analysis in one instrument enables receiver BER compliance testing for today's 3rd Generation Serial and 100G standards like; IEEE802.3ba, OIF-CEI and 32GFC communications standards.
Integrated Stress Generator for stressed eye sensitivity (SRS) and jitter tolerance compliance testing. A test signal's data rate, applied stress, and data pattern can be changed on the fly, independent of each other; enabling a diverse set of signal variations for testing chipset/system sensitivity.
Integrated, BER correlated eye diagram analysis with pass/fail masks for PCI Express, USB, SATA and other communications standards. Enhances the debug experience unlike other BERT's by providing a familiar eye diagram of the test results to compare against a standards specific mask.
Error Location and BER contour analysis on PRBS 31 and other digital signals up to 28.6 Gb/sec. Provides a quick understanding of signal integrity in terms of BER. Error location provides detailed BER pattern sensitivities to speed up identification of deterministic vs. random BER errors.
Optional Jitter Map provides fast jitter decomposition, accurate stress calibration at the DUT input. Fast, effective method for determining long pattern PRBS31 jitter composition with triangulation. Graphical representation makes jitter analysis more thorough, yet simpler to follow.
Optional Digital Pre-emphasis Processor provides user controlled pre-emphasis on pattern generator supplied data. Enables testing with compliant signals for standards like OIF-CEI3.0, Infiniband EDR,  PCI Express, 10GBASE-KR, SATA, 40GBASE-KR4, 100GBASE-CAUI.
Optional Clock Recovery Units provide clock recovery up to 28.6 Gb/s. Enables compliant testing and accurate Eye Pattern Analysis for high-speed serial and communication system standards.
Data SheetAccessoryDescription
BSA12500ISI Differential ISI Board
BSARACK BSA-Rack Mount Kits, SAFETY CONTROLLED
PMCABLE1M Precision Phase Matched Cable Pair, 1m
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Selection Guide 09 Sep 2019
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Literature number: 55W-60038-1
How-to Guide 04 Mar 2019
USB 3.1 Receiver Compliance Testing
All aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.
Literature number: 55W-26804-0
Application Note 04 Mar 2019
BSA Series BERTScope Bit Error Rate Testers Fact Sheet
This BERTScope Fact Sheet contains key specs and ordering information for the BSA Series BERTScope Bit Error Rate Testers.
Literature number: 65W-25456-0
Fact Sheet 12 Nov 2018
Tektronix BERTScope
Supports BSA Software Version 10 and above. This document provides high-level installation information, and instructions on using the Tektronix BERTScope
Part number: 071286903
Primary User
Signal Integrity of Reference Clock Bleed-Through in an IC
Signal integrity examples related to AMB testing is examined.
Literature number: 65W_26045_0
Application Note 12 Nov 2018
Stressed Eye: “Know What You’re Really Testing With”
Using BER-based analysis to improve stress calibration measurements.
Literature number: 65W_26048_0
Primer 11 Nov 2018
D.C. Blocks, a Trap for the Unwary When Using Long Patterns
How important is it to focus on low end frequency specifications.
Literature number: 65W_26043_0
Application Note 11 Nov 2018
ITSRACK
Use these instructions to assemble and install the BSAITS125 instrument into an instrument rack.
Part number: 071305100
User
Tektronix BERTScope
Provides high-level installation instructions for BERTScope PCIe 3.0 Receiver Testing.
Part number: 071304600
User
Tektronix BERTScope This document describes remote control commands for BERTScope products.
This document describes remote control commands for BERTScope products.
Part number: 077069604
Programmer
Tektronix BERTScope
This document describes remote control commands for BERTScope products.
Part number: 077069601
Programmer
Tektronix BERTScope
This document describes remote control commands for BERTScope products.
Part number: 077069602
Programmer
Tektronix BERTScope
This document describes remote control commands for BERTScope products.
Part number: 077069603
Programmer
Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester
Using Six Sigma for citical insight.
Literature number: 65W_26046_0
Application Note 10 Nov 2018
BERTScope Analyzers
This document provides Instructions for initial set up, checkout and basic operation of the BERTScope Bit Error Ratio Analyzer
Part number: 077055200
User
Stressed Eye Primer
Introduction to stressed eye testing.
Literature number: 65W_26049_0
Primer 10 Nov 2018
Tektronix BERTScope
This document provides information to declassify, sanitize, or secure the BSAITS125 instrument for security purposes
Part number: 077069500
Declassification
Tektronix BERTScope BSA & BA Remote Control Guide Programmer Manual
This document describes remote control commands for BERTScope products.
Part number: 077069605
Programmer
BERTScope Analyzers
This document describes how to interface with the BitAlyzer/BERTScope using the IEEE‐488 connection.
Part number: 077055400
Programmer
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