Today’s automobiles feature more sophisticated and sensitive electronic components and systems than ever. These advances have resulted in much safer, more efficient, and more connected vehicles. They have also created new challenges for testing and verification like:
- Debugging and verifying CAN FD, CAN, LIN, FlexRay, BroadR-Reach and MOST networks
- High power testing for hybrid/electric vehicles
- Verifying in-car wireless systems
- Evaluating new components, such as MEMS sensors, LED drivers, and LEDs
- EMI troubleshooting and testing
Your roadmap for reliable, efficient, and comprehensive automotive testing starts here.
P7700 Series TriMode Probes
BroadR-Reach® Automotive Compliance Test
Source Measure Units (SMU)
USB Spectrum Analyzers
|Physical Layer Compliance Testing for 100BASE-TX|
This application note describes various physical layer tests including amplitude domain, return loss, jitter and duty cycle-distortion and compliance testing using TDSET3 software.
|High Amplitude Arbitrary/Function Generator Simplifies Measurement in Automotive, Semiconductor, Scientific and Industrial Applications |
This application note describes the conventional approach of generating high amplitude signals with an external amplifier. It then discusses typical applications and shows the benefits of using a novel arbitrary/function generator with integrated high amplitude stage. Applications described in this note include measuring the timing and switching characteristics of power semiconductors for automotive applications and the characterization of amplifiers for gas chromatography detectors.
|Debugging CAN, LIN and FlexRay Automotive Buses with an Oscilloscope|
Explains the physical layer basics of CAN, LIN, and FlexRay serial buses to troubleshoot bus problems or system issues. Learn how to use automated decoding, triggering, and search on an oscilloscope equipped with automotive bus analysis capability.
|Fundamentals of Signal Integrity Primer|
This primer is to provide some insight into signal integrity-related problems in digital systems, and to describe their causes, characteristics, effects and solutions.
|Debugging Serial Buses in Embedded System Designs|
Learn the basics of the hardware protocols of the most common serial buses. Find out how to use the protocol trigger, decode and search capabilities of oscilloscopes to solve serial bus integration and debug challenges.
|Using the Arbitrary Waveform Capabilities of the Series 2600B and Series 2650A System SourceMeter SMU Instruments to Perform Ford EMC Power Cycling Testing|
Learn how to use a Source Measure Unit (SMU) with high-current arbitrary waveform capability for automotive power cycling testing. This app note describes a detailed procedure for performing Ford EMC-CS-2009.1 CI 230 Power Cycling Testing using the Keithley Series 2600B or Series 2650A System SourceMeter SMU instruments.
|MOST Essentials – Electrical Compliance and Debug Test Solution for MOST50 and MOST150 (MOI)|
This document provides the Methods of Implementation for making MOST measurements with Tektronix oscilloscopes enabled with option DJA, option MOST.