From the early stages of design to the point when it’s ready for market, a new power device undergoes a gamut of test and characterization activities, and you face many steps in bringing that device to market, including:
- Designing new devices to meet evolving needs
- Characterizing full performance of new designs
- Preparing the device for production
- Meeting reliability standards for commercial use
- Implementing the device in actual designs
- Evaluating existing devices and designs for new application requirements
Get our e-Guide and learn how to overcome the challenges posed by each stage of the power semi device life cycle.
Testing High Power Semiconductor Devices from Inception to Market
Methods for Efficient, Flexible Test and Characterization throughout the Life Cycle of a Power Semi Device
Creating Multi-SMU Systems with High Power System SourceMeter Instruments Application Note
The design and configuration of test systems for DC characterization of power semiconductor devices using high voltage and high current source measurement units
How to perform a simple breakdown test
How to perform a simple breakdown test on a high power, high voltage IGBT device - Using Keithley's NEW Model 2657A High Power System SourceMeter Instrument AND the Model 8010 High Power Device Test Fixture
|Simplify Component Selection with Robust DC Characterization|
Watch this webinar to get tips for measuring 2- and 3-terminal semiconductor devices and for using source measure unit instruments during the design process.