PatternPro® PPG Series Multi-channel Pattern Generator

The PatternPro® Pattern Generator Series is no longer available for purchase. The Tektronix BSX Series BERTScope® are recommended replacements. Information on these products is located at www.tek.com/bit-error-rate-tester/bsx-series-bertscope®-bit-error-rate-tester.

The Tektronix PPG line of high-performance pattern generators offer multi-channel configurations capable of data rates up to 40 Gb/s. With optional jitter insertion, the PPG line offers a flexible, cost effective and easy to use test solution supporting high speed applications such as 100 Gigabit Ethernet, DP-QPSK testing, multi-level (PAM) signaling and a broad range of receiver test applications. Create a full 40 Gb/s BERT system when combined with the Tektronix PatternPro® PED Series Error Detector.

PatternPro® PPG Series Multi-channel Pattern Generator

Features

Benefits

Pattern Generation on up to four pattern-independent channels. Supports multi-lane standards such as 100 GbE. Create victim/aggressor patterns for crosstalk testing. Multi-level signaling testing and parallel testing can reduce rest time over serial pattern generation solutions.
30, 32, and 40 Gb/s data rate Pattern Generation configurations. Provides the speed to address fast growing markets such as 100 GbE, CEI, 32G Fibre Channel and DP-QPSK.
Built-in sine, random, BUJ and PJ jitter insertion capability. A full complement of jitter sources covers a broad array of receiver test requirements.
Watch Tektronix experts as they provide a brief overview of test technologies being demonstrated on 100G components, transceivers and systems for the Datacom and Long Haul Networking Design Segmen...
2m 16s
See how to conduct PAM-4 Analysis using PPG3204 Pattern Generator and DSA8300 Sampling Oscilloscope on multi-level eye diagrams.
Get an overview of the optical solutions available from Tektronix. Learn about what we showcased at our OFC 2016 exhibit, then learn more about these solutions online.
1m 16s
2020 Tektronix and Keithley Product Catalog
We have the right products to ensure your success. Browse our new Tektronix and Keithley Product Catalog and explore our complete line of test and measurement solutions. You’ll find over 130 pages of key product details and specifications, applicat
Selection Guide 16 Jan 2020
16 Gb/s, 30 Gb/s, and 32 Gb/s PatternPro® Pattern Generator
The Tektronix PatternPro® series programmable pattern generators provide up to four channels of stressed pattern generation for high-speed Datacom testing.

Literature Number: 65W-28637-10
Datasheet 12 Jan 2020
PPG1251 PatternPro® Programmable Pattern Generator Datasheet

Literature Number: 65W-30272-5
Datasheet 12 Jan 2020
PPG4001 PatternPro® Programmable Pattern Generator Datasheet

Literature Number: 65W-30256-5
Datasheet 12 Jan 2020
PPG3000/PPG3200PED3200/PED4000 Series
Declassification & Security Instructions

Part Number: 077077601
Manual 26 Nov 2019
PPG4001
Series Pattern Generator User Manual

Part Number: 077108900
Manual 26 Nov 2019
PPG3000/PPG3200PED3200 Series
Declassification & Security Instructions

Part Number: 077077600
Manual 26 Nov 2019
PPG1600, PPG3000 & PPG3200
Series Pattern Generator User Manual

Part Number: 077109001
Manual 26 Nov 2019
PPG/PED Series Installation & Safety
Installation & Safety instructions document for PPG1600/3000/3200/4001/1250 and PED3200/4000 products Instructions

Part Number: 071341300
Manual 26 Nov 2019
PPG1251
Series Pattern Generator User Manual

Part Number: 077109101
Manual 26 Nov 2019
PPG1600, PPG3000 & PPG3200

Part Number: 077109000
Manual 26 Nov 2019
PPG4001
Series Pattern Generator User Manual

Part Number: 077108901
Manual 26 Nov 2019
Physical Layer Tests of 100 Gb/s Communications Systems
In this application note, learn how to prepare for compliance measurements on 100G standards including IEEE802.3ba/bj/bm and the tests for optical, electrical, or PAM4 transmitters and receivers that help diagnose noncompliant components and systems.

Literature Number: 65W-28494-1
Application Note 26 Nov 2019
Clock Recovery Primer, Part 2
Part 2 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.

Literature Number: 65W_26024_0
Primer 26 Nov 2019
Clock Recovery Primer, Part 1
Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.

Literature Number: 65W_26023_0
Primer 26 Nov 2019
Evaluating Stress Components using BER-Based Jitter Measurements
This primers describes how jitter measurements can be self-verified using a BER-based Jitter Peak measurement and how to simplify the jitter measurement challenge by using a pattern that does not contribute pattern-dependent effects, and finally sho

Literature Number: 65W_26050_0
Primer 26 Nov 2019