BERTScope® Clock Recovery

Versatile Precision Clock Recovery and Analysis

The BERTScope Clock Recovery CR Series advanced architecture measures and displays the PLL frequency response from 100 kHz to 12 MHz; the highest loop bandwidth available for jitter testing on the market today. The first clock recovery instruments to allow full control of parameters including loop bandwidth, peaking/damping, and roll off.

Price starting from
CR125A
Description
Max Data Rate

Clock Recovery Instrument

12.5 Gb/s

CR175A
Description
Max Data Rate

Clock Recovery Instrument

17.5 Gb/s

CR286A
Description
Max Data Rate

Clock Recovery Instrument

28.6 Gb/s

Features

Benefits

Data Rate Range up to 28.6 Gb/s Continuous data rate coverage for next generation I/Os including PCIe 3.0, 10GBASE-KR, 16xFC, 25 & 28G CEI and 100GBASE-LR-4 & ER-4.
Independent control, measurement, and display of phase lock loop (PLL) BW, JTF (jitter transfer function) and peaking. Provides accurate "Golden PLL" response for transmitter jitter compliance testing and stressed receiver sensitivity test calibration. Provides full flexibility for device characterization.
Clock Recovery Input Equalization Enables clock recovery on high ISI signals without impacting the data stream under test. Recovered clock enables other analysis including "clean eye", application of FIR filtering to signal, and BER testing.
Edge Density Measurement Allows instant determination of the mark density of the signal under test.
Jitter Spectral Analysis and Frequency Gated Integrated Jitter Measurements Provides 200 Hz to 90 MHz display of jitter vs frequency with cursor based measurements of jitter peaks' amplitude and frequency. Frequency gated integrated jitter measurements PCIe 2.0 compliance testing.
Optional 24 MHz PLL BW Meets the JTF bandwidth requirements of USB 3.0, 6 G SATA, and PCIe-Gen 3.
Extensive set of subrate (recovered) clock outputs. Frequently needed for device reference clocks.

 

Data SheetAccessoryDescription
100PSRTFILTER 100 ps Rise Time Filter
CR125ACBL HIGH PERFORMANCE DELAY MATCHED CABLE SET (REQUIRED FOR BERTSCOPE & CRU IN SSC APPLICATIONS)
PMCABLE1M Precision Phase Matched Cable Pair, 1m
SMAPOWERDIV SMA Power Dividers
TitleType
Stressed Eye: “Know What You’re Really Testing With”

Using BER-based analysis to improve stress calibration measurements.

Primer
Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester

Using Six Sigma for citical insight.

Application Note
Anatomy of an Eye Diagram

Description of an eye diagram, how it is constructed, and common method for generating one.

Application Note
Clock Recovery’s Impact on Test and Measurement

This application note discusses the outside influences that can disturb the relationship between data and how it is clocked.

Application Note
BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood”

A New Methodology for Jitter Separation

Application Note
Bridging the Gap Between BER and Eye Diagrams — A BER Contour Tutorial

Introduction to the BER Contour measurement.

Application Note
Clock Recovery Primer, Part 1

Look at clock recovery from a practical point of view, Part 1.

Primer
Clock Recovery Primer, Part 2

Look at clock recovery from a practical point of view, Part 2.

Primer
Comparing Jitter Using a BERTScope® Bit Error Rate Testing

Comparison of DCD and F/2 Jitter.

Application Note
Dual-Dirac+ Scope Histograms and BERTScan Measurements

Introduction to Dual-Dirac.

Primer
2017 Tektronix and Keithley Product Catalog

Browse the new Tektronix and Keithley Product Catalog and explore our complete line of test and measurement solutions. You will find over 130 pages of key product details and specifications, application information, quick-reference selection guides and more for our complete line of products.

Selection Guide
Get an overview of the optical solutions available from Tektronix. Learn about what we showcased at our OFC 2016 exhibit, then learn more about these solutions online.
0h 1m 15s
Downloads
Download

Download Manuals, Datasheets, Software and more:

Go to top