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Blog: #SMU

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KickStart software from Tektronix
Testing and Debugging PMICs with Ease Friday, September 22, 2023
Adaptive Power Optimization is Revolutionizing PMICs “There is no better way to save energy and cut bills than by turning all electronic devices off.” This basic piece of advice is the underlying principle and philosophy behind any form of energy management applied to energy consumption optimization, and in general in so-called adaptive power optimization. In the case of battery powered …
Double pulse test with AFG31000
4 Key Testing Phases for Power Conversion Equipment Tuesday, February 14, 2023
While the types of electrical tests required during the design and production of power conversion equipment are similar to those required for previous generations of devices, the adoption of wide-bandgap materials like silicon carbide (SiC) or gallium nitride (GaN) requires added rigor and new test strategies. Bench testing continues to play an important role at every stage of the development of …
Tektronix touchscreen oscilloscope.
Are You Keeping Pace with Wide-Bandgap Test Requirements? Tuesday, September 13, 2022
A new generation of wide-bandgap (WBG) materials such as silicon carbide (SiC) and gallium nitride (GaN) are becoming more prevalent. Electrically, these substances are closer to insulators than silicon and other typical semiconductor materials. Their adoption is an effort to overcome limitations of silicon that stem from it being a narrow bandgap material, which leads to undesirable conductive …
Different 2400 Graphical Series SMUs
Using Your Source Measure Unit as a Power Supply Friday, August 12, 2022
Keithley’s line of Touch Test Invent™ graphical Instruments have the ability to locally run custom scripts written in the Test Script Processor (TSP™) language. These scripts allow the instrument to execute code in real time written by you. The example script provided allows a 2400 Series Graphical SMU to function as a power supply by outputting a constant wattage. A traditional power supply …
Keithley 2280S DC Power Supply
Forming the Best Solution for Battery Formation and Aging Tuesday, July 12, 2022
Current markets are leading to high demand for battery cells. One way for manufacturers to increase throughput is to reduce the time spent making each battery. The formation and aging stage is the most time consuming part of the cell manufacturing process. Ensuring that the right equipment is used for the job can help with some of the challenges facing formation and aging. What is Formation and …
An engineer using the Keithley touchscreen interface on a source measure unit (SMU).
Touchscreen User Interface for Keithley Instruments Friday, September 24, 2021
Keithley's Touchscreen User Interface Keithley’s Touch, Test, Invent® touchscreen products feature the same look and feel thanks to their UI, referred to as the TTI interface. This custom interface, developed by Keithley engineers, makes it incredibly simple to use the instruments and analyze data right in the box. The TTI interface can be found with Keithley’s Source Measure Units (SMUs), some …
Keithley Source Measure Unit mit IV Kennlinienschreiber Funktion neben dem ursprünglichen IV Kennlinienschreiber System von 1955
Kennlinienschreiber vs. IV-Kennlinienschreiber-Software Tuesday, April 27, 2021

Tektronix führte 1955 den branchenweit ersten Kurvenschreiber ein, der charakteristische Kurven für Vakuumröhren anzeigte, gefolgt im Laufe der Jahre von Modellen zum Testen von Transistoren, Dioden und anderen Halbleiterbauelementen. Tektronix-Kurvenschreiber wie 576 (unten) und 370A/370B fanden breite Akzeptanz in der Industrie, bis die Produktion schließlich Mitte der 80er Jahre eingestellt wurde. Die Kennlinienschreiber sind wie ein Netzteil und ein Oszilloskop in einem Gehäuse vereint und können die Spannung und den Strom aufzeichnen.

Speeding up Failure Analysis using Lock-in Thermography Thursday, February 4, 2021
Semiconductor companies and semiconductor researchers are constantly looking for ways to make devices fail in the lab in order to prevent failures in the field. Countless hours are spent by failure analysis (FA) engineers trying to understand why a device failed and how it can be prevented in the future. This is vital as many devices are used in mission critical applications where “failure is not …
How Keithley’s New 2601B-PULSE Can Help VCSEL Designers Save More Lives Tuesday, April 21, 2020
It’s late at night and you’re driving home. You’re tired and just want to get to bed. But then, all of a sudden, you are faced with a big animal in the middle of the road. Immediately, your car slams on the brakes to prevent you from hitting the animal and from swerving off the road. Through the technology of light detection and ranging – better known as LIDAR, your vehicle has protected you from …
4200A Electrical Parameter Characterization system controlled from his touchscreen display
MOSFETs Characterization in the Low Power Range Wednesday, March 25, 2020
Introduction The Semiconductor Industry is always searching for new special materials, dielectric solutions, and new device geometries for scaling down the device size further and further. Lateral and vertical heterostructures of 2D materials, for instance, have led to new revolutionary tiny and low-power electronics. A 4200A Electrical Parameter Characterization system controlled from his …