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Blog: #SMU

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Double pulse test with AFG31000
4 Key Testing Phases for Power Conversion Equipment Tuesday, February 14, 2023
While the types of electrical tests required during the design and production of power conversion equipment are similar to those required for previous generations of devices, the adoption of wide-bandgap materials like silicon carbide (SiC) or gallium nitride (GaN) requires added rigor and new test strategies. Bench testing continues to play an important role at every stage of the development of …
#4200a #AFG #Oscilloscope #Probes #SMU
Tektronix touchscreen oscilloscope.
Are You Keeping Pace with Wide-Bandgap Test Requirements? Tuesday, September 13, 2022
A new generation of wide-bandgap (WBG) materials such as silicon carbide (SiC) and gallium nitride (GaN) are becoming more prevalent. Electrically, these substances are closer to insulators than silicon and other typical semiconductor materials. Their adoption is an effort to overcome limitations of silicon that stem from it being a narrow bandgap material, which leads to undesirable conductive …
#Oscilloscope #SMU #SpectrumAnalyzer #TekExplains
An engineer using the Keithley touchscreen interface on a source measure unit (SMU).
Touchscreen User Interface for Keithley Instruments Friday, September 24, 2021
Keithley's Touchscreen User Interface Keithley’s Touch, Test, Invent® touchscreen products feature the same look and feel thanks to their UI, referred to as the TTI interface. This custom interface, developed by Keithley engineers, makes it incredibly simple to use the instruments and analyze data right in the box. The TTI interface can be found with Keithley’s Source Measure Units (SMUs), some …
#DAQ #DMM #SMU
Keithley source measure unit with I-V curve tracer functionality alongside the original I-V curve tracer system from 1955.
Curve Tracer vs. I-V Curve Tracer Software Tuesday, April 27, 2021

Tektronix introduced the industry’s first curve tracer in 1955 to display characteristic curves for vacuum tubes, followed over the years by models for testing transistors, diodes and other solid-state devices. Tektronix curve tracers such as the 576 (below) and 370A/370B went on to broad industry acceptance until production eventually stopped in the mid-eighties. Approximating a power supply and an oscilloscope packaged in the same box, curve tracers source voltage while plotting voltage vs. current.

#SMU #FailureAnalysis #Education
MOSFETs Characterization in the Low Power Range Wednesday, March 25, 2020
Introduction The Semiconductor Industry is always searching for new special materials, dielectric solutions, and new device geometries for scaling down the device size further and further. Lateral and vertical heterostructures of 2D materials, for instance, have led to new revolutionary tiny and low-power electronics. A 4200A Electrical Parameter Characterization system controlled from his …
#4200a #SMU #Semiconductors
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Are You Making the Big ‘Power’ Switch to SiC and GaN? Wednesday, May 15, 2019
Silicon Carbide and Gallium Nitride demand for 5G, automotive, and energy systems is rising. Design complexity is increasing; the time to market window continues to shrink. It’s increasingly harder to ensure that designs meet demanding specifications and compliance requirements. Does this sound all too familiar to you? While we take so much for granted, many engineers and scientists are working …
#Trends #SMU #Semiconductors
Low Resistance Measurement with a SourceMeter: Do I use Current Reversal, Offset Compensation or Delta Mode measurement methods? Friday, January 15, 2016
One of the questions we hear often from customers is to explain the difference between measuring low resistances using an offset compensation mode or a delta mode. What is current-reversal? Why do I need to use these techniques? Can I use these methods with a SourceMeter? This is a topic I would like to spend some time on so you can make the best choice of which technique to use. Why do I need to …
#SMU #TekExplains

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