有線通訊設備

加快 PCIe、SAS 和 SATA 測試，透過包含自動化和除錯能力的單一測試解決方案。加速您的 400G 產品發展 PAM4 測試以有效驗證您的技術進展。更快相容於您的 Type-C 裝置。

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400G PAM4 測試

加快 400G 產品的開發速度
更快速地進行驗證並增加產出

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相干性光學

無需試驗並排除錯誤
自動降低校驗時間並精確量測

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PCIe、SAS、SATA
測試和除錯

自動化校驗
關閉回送除錯迴路
優異的訊號完整性和除錯

Type-C 的消費性電子產品標準

更快相容於下一代 USB、DisplayPort、HDMI
建立裝置邊限信心
避免過度設計造成成本上揚

有線通訊設備的更多應用：

有線通訊設備的趨勢

連線的裝置和我們使用的資料類型，正在改變我們存取、儲存和移動資料的方式。閱讀更多有關塑造資料中心和有線通訊設備市場的廣泛趨勢的資訊。

「這會是您需要快速取得的常用資料。因此，我認為我們將看到更多規模較小的資料中心，並更靠近服務端點。」

Sarah Boen, Tektronix

Title
PCIe Gen 5 Tx Tech Brief Get an overview of PCI Express 5.0, testing, the challenges associated with that, and learn about the Tektronix PCIe 5.0 Transmitter Test Solution.
DDR5 Measurement Challenges A historically dominant form of high performance, quick access memory, has been Double Data Rate Synchronous Dynamic Random Access Memory (DDR SDRAM). The industry is transitioning to the next …

Title
Solving 400G Data Center Interconnect Measurement Challenges This webinar will equip you to address the challenges posed by the forthcoming interoperability standards. OIF standards for interoperability of 400G coherent links for Data Center Interconnects (DCI) …
Addressing PCIe Gen1-5 Test and Debug Challenges with Confidence Learn how to address the test and measurement challenges posed by PCIE Gen1-5 for both base silicon testing and CEM compliance testing. Gain insights and solutions for automation, validation, and …
PCI Express Gen 5 Reference Clock Webinar This webinar presents an overview of reference clock jitter requirements as they have evolved and offers techniques for making these low femtosecond measurements using a real time oscilloscope.
PCI Express Gen 5 Update Webinar Cloud-based computing power, storage capacity, and network bandwidth have led to the development of the PCI Express 5.0 specification for 32.0 GT/s. This webinar starts with an overview of 5.0 …