C-V Testing for Semiconductor Components and Devices - Applications Guide

Capacitance-Voltage (C-V) testing is widely used to determine a variety of semiconductor parameters, such as doping concentration and profiles, carrier lifetime, oxide thickness, interface trap density, and more. This C-V testing applications guide features a collection of application notes focused on C-V testing methods and techniques using the 4200A-SCS Parameter Analyzer. The 4200A-SCS provides three C-V methods: Multi-frequency C-V (1 kHz – 10 MHz), Very Low Frequency C-V (10 mHz – 10 Hz,) and Quasi-static C-V measurements.