ACS Basic Edition Semiconductor Parametric Test Software for Component and Discrete Devices Datasheet

Optimized for parametric testing of component and discrete (packaged) semiconductor devices, ACS Basic Edition maximizes the productivity of technicians and engineers in research and development. The versatile architecture of this software allows it to meet the wide ranging and ever changing requirements of semiconductor device testing. It supports Keithley’s source and measure instrument products, including Series 2600B, Series 2400, and Series 2400 Touchscreen SourceMeter® Source Measure Unit (SMU) instruments, 2651A and 2657A SourceMeter (SMU) instruments, DMM6500 and DMM7510 Digital Multimeters, and 4200A-SCS SMUs and capacitance voltage units (CVUs).