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Component Characterization
Create and manage a wide variety of in-depths tests and measurement results for discrete semiconductor components such as MOSFETs, bipolar transistors, diodes, high-power IGBTs, and more. Explore Keithley’s wide range of “Measurement Capabilities” and corresponding descriptions below.
Measurement Capability
ACS Software ACS Basic Software 2600B System SourceMeter® SMU Instruments 2650A High Power System SourceMeter® SMU Instruments Parametric
Curve Tracer
Parameter Analyzer Model 4200-SCS S500 Integrated
Test Systems
Click on a Measurement Capability on the left to view it's Description
{C}{C}ACS Software
ACS supports a wide range of semi-automatic and fully automatic probers for semiconductor component measurements across an entire wafer. Or control the prober interactively for testing individual devices. Monitor testing progress with individual device results and multi-device statistics during run-time. Click here for more information.
ACS Basic Edition Software
ACS Basic Edition is primarily for semiconductor component testing with manual probe stations or test fixtures. Perform initial device characterization quickly and interactively with “Trace Mode”. Or create detailed parameter extraction tests using the GUI-based set-up screen and extensive measurement libraries. Quickly, ACS Basic leads to real-time results for analysis within ACS Basic or for export to other offline analysis tools. Click here for more information.
Series 2600B System SourceMeter® Source Measure Unit (SMU) Instruments
Series 2600B SourceMeter SMU Instruments include dual-channel units, optimal for testing multi-terminal semiconductors such as MOSFETs and BJTs. And Keithley’s TSP-Link® provides coordinated control and precise timing between SMU instruments. Choose from a wide variety of models from the Series 2600 family to meet specific voltage and current specifications. Click here for more information.
Series 2650A High Power System SourceMeter Source Measure Unit (SMU) Instruments
The Series 2650A High Power SourceMeter SMU Instruments can be used in a variety of test configurations. Source and measure 3kV or 50A pulse up to 2000W pulse or 200W DC. And best-in-class low current capability provides outstanding leakage measurements. Use Keithley’s TSP-Link® for integrated system configurations with lower power Series 2600B SourceMeter SMU Instruments. Click here for more information.
PCT Configurations
Keithley's Parametric Curve Tracer configurations are complete characterization solutions for power device characterization, including high performance instruments, cables, test fixturing, and software. Seven configurations are available, each providing both real-time trace mode for quickly checking fundamental device parameters like breakdown voltage and full parametric mode for extracting precise device parameters. Click here for more information.
Model 4200-SCS Parameter Analyzer
The 200V/1A SMU and 400V C-V capabilities of the Model 4200-SCS Parameter Analyzer are ideal for semiconductor component characterization. Configure the 4200-SCS with 2650A High Power SourceMeter SMU Instruments for testing up to 3kV or 50A. Create and execute tests across this range of Keithley capabilities with ACS Basic Edition software. Click here for more information.
S500 Integrated Test Systems
Experience full turnkey solutions from Keithley with S500 Integrated Test Systems. These highly configurable systems can incorporate a wide range of measurement capability for technology development test stations. Or use the automation of ACS with S500 systems for high throughput multi-device testing with automated wafer probers. Click here for more information.