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Korean (Korea)

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Double Pulse Testing Solution for Wide Bandgap Power Semiconductors

Double Pulse Testing for Wide Bandgap Flyer

Ensure precise measurements on wide bandgap devices and systems for faster, easier validation with this comprehensive oscilloscope-based solution consisting of software, probes, instruments, and service.


  • On-scope analysis conforming to JEDEC and IEC standards
  • 1 GHz of bandwidth for accurate analysis of fast-switching signals
  • Arbitrary Function Generator with built-in software for double-pulse testing waveforms
  • High-side and low-side probes with high common mode noise rejection


Learn more about this ideal system with this 2-page flyer.