Visual Trigger Model Construction with TriggerFlow for MP5000 Test Systems

High-demand semiconductor testing requires scalable, synchronized automation without sacrificing precision. The MP5000 Series Modular Precision Test System enables high-density parallel testing, but coordinating multiple channels traditionally requires complex trigger model programming.

This application note introduces the TriggerFlow feature in TSP Toolkit, which simplifies trigger model development by allowing users to visually construct and manage synchronized test flows through an intuitive drag-and-drop interface.

This application note:

• Explains the role of trigger models in synchronized parallel testing
• Introduces TriggerFlow visual workflow creation within TSP Toolkit
• Describes trigger model block types and how they control instrument behavior
• Demonstrates how to generate TSP code automatically from visual flows
• Provides a MOSFET family of curves example using synchronized trigger models
• Outlines required configuration steps for fully functional automated test scripts

Using visual model construction, built-in templates, and auto-generated code, engineers can significantly reduce development time while maintaining precise timing and synchronization across channels.