Ready to make the switch from Silicon to Silicon Carbide? Join experts from Tektronix, Wolfspeed, and PE Systems for a 3-part webinar series featuring real-world demos, practical test strategies, and advanced tools for SiC power design and validation.
Webinar 2: Design-Driven Testing: Optimizing Power Systems with Real Measurements
In this second session, we move beyond signal capture to device-level testing and interpretation. Learn how to characterize SiC MOSFET dynamic performance using Double Pulse Testing (DPT) aligned with JEDEC and other industry standards. We’ll talk about evaluation kits and test automation software, and how they can accelerate the design process. We’ll cover best practices, how to identify measurement artifacts, and testing over temperature. We’ll show how parameters such as Eon, Eoff and overshoot can be used to guide device, gate driver and gate-resistor selection.
Watch other webinars in the series:
Webinar 1: Fundamentals of Power Measurement in SiC Systems
Webinar 3: Signals to Significance: Dynamic Device Characterization and Optimization
Duration 54m 55s
