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Cấu hình điện trở siêu thấp Keithley Series 6200/2182A

Đo điện trở thấp đến micro ôm với nguồn cung cấp dòng điện được kiểm soát

Compare models. Request a quote.
Last Update: Thursday, April 20, 2023
Blog Entry
Measuring the resistivity of conductors is not rocket science!

Characterizing a metal’s resistivity requires you to measure very low resistances (and therefore, low voltages) accurately. Many techniques used for metals are applicable to other applications, such …

Last Update: Tuesday, August 1, 2023
Technical Document - Sách trắng
An Improved Method for Differential Conductance Measurements

Keithley's approach to differential conductance, a four-wire, source current/measure voltage technique, uses the 6220 and 6221 Current Sources and 2182A Nanovoltmeter. The current sources combine the DC and AC components into one source, with no need to do a secondary measure of the current, because its output is much less dependent on the changing device impedance

Date: Wednesday, March 16 2005
Blog Entry
MOSFETs Characterization in the Low Power Range

Introduction The Semiconductor Industry is always searching for new special materials, dielectric solutions, and new device geometries for scaling down the device size further and further. Lateral and …

Last Update: Tuesday, August 1, 2023
Technical Document - LƯU Ý ỨNG DỤNG
Keithley Instrumentation for Electrochemical Test Methods and Applications

This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve sourcing and measuring current and voltage and measuring capacitance with high accuracy.

1KW-60158-1 | Date: Wednesday, April 25 2018
Technical Document - Sách trắng
Hall Effect Measurements in Materials Characterization

Hall effect measurements have been valuable tools for material characterization since Edwin Hall discovered the phenomenon in 1879. Essentially, the Hall effect can be observed when the combination of a magnetic field …

Date: Wednesday, January 26 2011
Technical Document - Thông số kỹ thuật
Model DMM7510 7-1/2 Digit Graphical Sampling Multimeter Specifications

This document contains specifications and supplemental information for the Model DMM7510 7-1/2 Digit Graphical Sampling Multimeter instrument. Specifications are the standards against which the DMM7510 is tested. Upon leaving the factory, the DMM7510 meets these specifications.

SPEC-DMM7510C | Date: Thursday, July 14 2022
Technical Document - Bài viết kỹ thuật
AC Versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices

With modern current sources and nanovoltmeters, the DC reversal method requires less power while providing excellent low-noise results. This combination is optimal for low frequencies (0.1–24Hz,) allowing measurements to be made much faster than with a lockin amplifier. At resistances less than 100mΩ, they have much better rejection of lead resistances, and, at resistances greater than 1MΩ, they have much higher input impedance and less associated loading error

Date: Wednesday, February 07 2007
Technical Document - LƯU Ý ỨNG DỤNG
Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU

This application note explains the maximum capacitance specifications of an SMU, and describes several applications on which the 4201-SMU and 4211-SMU enables you to make stable low current measurements. The example applications describe include the following: OLED pixel device testing on a flat panel display, transfer characteristics of a MOSFET using long cables, FET testing through a switch matrix, nano-FET I-V measurements on a chuck, and capacitor leakage measurements. Details on calculating test system capacitance is also provided in this application note.

1KW-61609-0 | Date: Monday, October 07 2019
Technical Document - Bài viết kỹ thuật
Electrical Measurements on Nanoscale Materials

This tutorial explains the importance of electrical measurements to the science of nanotechnology, and presents practical considerations in making these measurements. Topics include material and structural characteristics that can be …

Date: Monday, July 11 2005