Semiconductor and Component Test

Learn tips and techniques for solving today’s semiconductor device characterization challenges

Channel effective mobility technique
Monitoring oxide breakdown
Phase change memory
Bias temperature instability (BTI) for CMOS transistors
Lab-based wafer level automation

Get our e-Guide for a better understanding of these semiconductor device tests and more.

Semiconductor Device Characterization e-Guide

This guide offer applications information, example programs, and sample test scripts for semiconductor device test.

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Semiconductor Device Test Applications Guide

This guide offer applications information, example programs, and sample test scripts for semiconductor device test.

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Testing High Power Semiconductor Devices from Inception

This e-guide examines the life cycle of a power semiconductor device and the tremendous variety of test and characterization activities and measurement challenges faced by the engineers involved in each stage throughout the cycle.

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Library

Title
Performing Charge Pumping Measurements with the 4200A-SCS Parameter Analyzer This application note explains how to make charge pumping measurements using the 4200A-SCS with the optional 4225-PMU Ultra-Fast I-V Module (PMU) or 4220-PGU Pulse Generator Unit (PGU).
Protecting Parametric Test Systems and the Test Environment from Damaging Transient Overvoltages and Overcurrents Measuring breakdown parameters is increasingly required to predict a device’s safe region of operation. Sometimes, those breakdown conditions in reliability testing and breakdown test occur as a …

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Wide Bandgap Applications Wide Bandgap power devices (SiC and GaN) offer significant benefits and are smaller, faster and more efficient than their silicon counterpart. But they also present several validation challenges …
Current-Voltage Made Accurate and Simple In our webinar we look at ten common applications, from LEDs and Laser Diodes to measuring power efficiency of power management ICs and solar cells. Each case highlights how a Source Measure Unit (SMU …
SiC- GaN Components - 5 Key Tests This webinar presents techniques for high power characterization of Silicon Carbide (SiC) and Gallium Nitride (GaN) components. We look at power levels as high as 2000W and electrical levels of up to …