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Semiconductor and Component Test
Learn tips and techniques for solving today’s semiconductor device characterization challenges
- Channel effective mobility technique
- Monitoring oxide breakdown
- Phase change memory
- Bias temperature instability (BTI) for CMOS transistors
- Lab-based wafer level automation
Get our e-Guide for a better understanding of these semiconductor device tests and more.
This guide offer applications information, example programs, and sample test scripts for semiconductor device test.
This guide offer applications information, example programs, and sample test scripts for semiconductor device test.
This e-guide examines the life cycle of a power semiconductor device and the tremendous variety of test and characterization activities and measurement challenges faced by the engineers involved in each stage throughout the cycle.