MOST50 and MOST150 Compliance Solution

Option MOST launched from Tektronix oscilloscope Analyze menu and provides both MOST50 and MOST150 measurements.

Features and Benefits

• Automated DPOJET MOST Setup Library reduces the complexity of executing MOST50 and MOST150 tests, significantly saves test time and resource costs, and enables you to test devices faster

• Automates 100% normative compliance test coverage for all test points of both MOST50 and MOST150 specifications. In addition, it includes informative tests for MOST150-SP3 test points

• Seamless debug allows pausing on each automated test, and switching to configurations for detailed analysis and debug on all tests

• Automated setups ensure better accuracy and repeatability of results, and avoids requiring the test engineer to be an expert on MOST50 and MOST150 testing procedures

• Single oscilloscope setup enables signal integrity tests for both electrical and optical test points of MOST150, using optical-to-electrical converter probes

• Flexible Setup Library allows modifying the setting and limits of the temperature oven and other environmental testing conditions

• Fully customizable Setup Library allows adding additional measurements to the test suite for comprehensive characterization

Applications

• MOST50 host and device silicon characterization, debug, and validation
• MOST150 host and device silicon characterization, debug, and validation
• MOST system integration and validation
• MOST manufacturing test

MOST50 and MOST150 Validation with MOST Essentials

DPOJET software with automated MOST Essentials Setup Library provides a complete set of measurements required for MOST50 and MOST150 compliance testing. MOST Essentials enables characterization, debug analysis, and conformance testing according to the MOST base specification and conformance specifications.

Location of MOST50 specification test points.

Location of MOST150 specification test points.

Test setup diagram of MOST50-SP3E test point.

MOST Automated Testing -- Save Time and Resources

There is no longer a need to be an expert on MOST testing procedures. Remembering the exact steps to take each measurement is time consuming and often requires going back to the MOST specifications. MOST Essentials takes the guesswork out of conducting MOST50 and MOST150 compliance testing. Even if you remember how to use the test equipment, it is common for even the most experienced operators to forget steps in the procedure or to set up the correct parameters, such as applying the correct record length and sampling rates.

Test setup diagram of MOST50-SP4E test point.

Test setup diagram of MOST150-SP2 test point.

The automated DPOJET Setup Library for MOST provides standard-specific details and predefined scope settings for each measurement, so the user does not need to be an expert. MOST Essentials minimizes the setup initialization problems, reduces the complexity of executing MOST tests, and enables you to test devices faster.

DPOJET Opt. MOST provides 100% test coverage of normative tests for both MOST50 and MOST150, and includes informative tests at MOST150-SP3 test points.

Optical undershoot mask using Opt. MOST Essentials.

100% Test Coverage

MOST Essentials provides a complete set of normative and informative measurements to be performed across all four test points, for both MOST50 and MOST150 compliance testing. Some of the measurements include Eye Mask Hits, Alignment Jitter, Transfer Jitter, B0/B1, Overshoot, and Undershoot.

Eye Diagram measurement

Eye diagram testing for MOST requires testing mask hits at different segment portions of an eye mask, across different test points for both MOST50 and MOST150.

Overshoot and Undershoot measurements

Measurement of the optical overshoot and undershoot is required to ensure proper operation of the optical receiver. The optical pulse shape is tested with a parameterized mask. The mask parameters are based on the measured optical logic levels b0 and b1 (High Ref and Low Ref). Optical transmitting devices must produce an optical signal complying with the defined mask, when driven with a compliant electrical signal.

Seamless Debug or Setup Customization with Opt. MOST – Example of modifying clock recovery settings for MOST50 and MOST150.

Transferred Jitter and Alignment Jitter measurements

Jitter is the phase deviation between an edge of the waveform and the correlating transition of the recovered UI clock. For transferred jitter, only phase variations coming with rising edges of the waveform are relevant, because only these deviations are tracked by the PLL and impact the recovered clock’s phase.

Alignment Jitter is the phase deviation between any edge of the waveform and the correlating transition of the recovered UI clock. Calculating the misalignment between clock and data for each data transition and drawing the successive phase deviations over run time in a graph results in an “AJ-Track” which is the base for further evaluations.

Extinction Ratio measurement

Extinction Ratio is calculated based on the measured optical levels for b1 and b0 (High Ref and Low Ref) by using a high-precision DC-coupled O/E converter.

Seamless debug and analysis with MOST Essentials

MOST Essentials helps perform step-by-step debugging on failures. MOST Essentials helps debug faster and discover sources of jitter and signal integrity issues more quickly.

Flexible and customizable for characterization

The MOST Essentials Setup Library is highly flexible, and fully customizable. It allows modification of the measurement settings, oscilloscope configurations, limits, and other parameters, and then saving the customized setup. For example, when testing a MOST50 or MOST150 DUT in an automotive temperature chamber setup or when using optical cables or remote XL cables in the setup, a user can define additional filter files and custom limits to fine-tune the setup conditions.

Results for MOST50 and MOST150.

Report for MOST150 on an Overshoot and Undershoot measurement with Pass/Fail summary and oscilloscope waveform screen shots.

Plots and Results

The DPOJET Plot feature for MOST Essentials helps characterize MOST devices with detailed visual representations. The Result section helps design engineers to look at the test results quickly and clearly. The Report section includes details of each test including Limits, Measured Value, Pass/Fail Results, etc.

Report for MOST150-SP4 test point with Pass/Fail status.

Report for MOST150-SP1 test point with Pass/Fail status, margin details, eye diagram, and other statistics.

Detailed reports

The MOST Essentials application generates thorough HTML/MHT reports that capture the performance, status, and test results of your device. It also captures eye diagrams, oscilloscope waveform screen captures, and test waveforms optionally. The report generation tool also provides features such as Report Appending, Auto-Incrementing Report Naming, Inserting User Comments, Listing Complete Configuration Details, etc. The Report Appending feature enables adding results from each of the four test points for both MOST50 and MOST150, and creating a single, printable report for sharing the results.