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Suchergebnisse

1 - 10 aus 56
  • Products

    SourceMeter®-Hochleistungs-SMU der Keithley-Serie 2650

    Leistungshalbleiter GaN, SiC Solarmodul-Test Elektromigrationsstudien Charakterisierung der Temperatur von Halbleiterübergängen
    Compare models. Request a quote.

    Letzte Aktualisierung Thursday, June 5, 2025

  • Source-Measure-Unit-Series-2400-Source-Measure-Unit-Datasheet
    Datasheet

    Series 2400 SourceMeter SMU Instruments

    Keithley’s Series 2400 Source Measure Unit (SMU) Instruments are designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as …

    1KW-2798-4 | Date: Monday, October 07 2024

  • Measuring Low Resistance Devices with High Current Using the Model 2460 SourceMeter SMU Instrument
    Technical Document - Anwendungshinweis

    Measuring Low Resistance Devices with High Current Using the Model 2460 SourceMeter SMU Instrument

    Source Measure Unit (SMU) instruments or SourceMeter® instruments can simplify making low resistance measurements with high current stimulus. A SourceMeter instrument is capable of sourcing and measuring both current and voltage.

    1KT-60883-0 | Date: Friday, September 16 2016

  • 2470 Graphical SourceMeter SMU Instrument Datasheet
    Datasheet

    2470 Graphical SourceMeter SMU Instrument Datasheet

    1KW-61523-0 | Date: Monday, January 05 2026

  • ACS Wafer Level Reliability Edition Datasheet
    Datasheet

    ACS Wafer Level Reliability Edition Datasheet

    Keithley has taken the power of its Automated Characterization Suite (ACS) software and focused it on wafer level reliability (WLR) testing. ACS-WLRFL is an added functionality to ACS that leverages the measurement speed and system integration …

    1KW-56418-3 | Date: Monday, December 04 2023

  • Using the Arbitrary Waveform Capabilities of the Series 2600B and Series 2650A System SourceMeter SMU Instruments to Perform Ford EMC Power Cycling Testing
    Technical Document - Anwendungshinweis

    Using the Arbitrary Waveform Capabilities of the Series 2600B and Series 2650A System SourceMeter SMU Instruments to Perform Ford EMC Power Cycling Testing

    Learn how to use a Source Measure Unit (SMU) with high-current arbitrary waveform capability for automotive power cycling testing. This app note describes a detailed procedure for performing Ford EMC-CS-2009.1 CI 230 Power Cycling Testing using the Keithley Series 2600B or Series 2650A System SourceMeter SMU instruments. 

    Date: Wednesday, December 03 2014

  • Model 2657A 3D CAD Models
    Technical Document - CAD Files

    Model 2657A 3D CAD Models

    Access the 3D CAD models for the Model 2657A 3D CAD Models, designed to support integration into mechanical layouts of test setups and laboratory environments. These files provide precise dimensional representations of the Model 2657A, aiding in the …

    Date: Wednesday, December 17 2025

  • Model 2651A 3D CAD Models
    Technical Document - CAD Files

    Model 2651A 3D CAD Models

    Access the 3D CAD models for the Model 2651A 3D CAD Models, designed to support integration into mechanical layouts of test setups and laboratory environments. These files provide precise dimensional representations of the Model 2651A, aiding in the …

    Date: Wednesday, December 17 2025

  • Testing to 100A by Combining Keithley Model 2651A High Power SourceMeter Instruments (Application Note)
    Technical Document - Anwendungshinweis

    Testing to 100A by Combining Keithley Model 2651A High Power SourceMeter Instruments (Application Note)

    Introduction Source-measure units (SMUs), such as the Keithley Model 2651A High Power System SourceMeter instrument, are the most flexible and most precise equipment for sourcing and measuring current and voltage. Because of …

    Date: Tuesday, April 19 2011

  • Kirchhoff’s Law saves the day when you need more power!
    Blog Entry

    Kirchhoff’s Law saves the day when you need more power!

    You’re designing a new device/component and you just realized that the source measure unit (SMU) instrument that you have been using to perform I-V characterization doesn’t have enough power to test …

    Letzte Aktualisierung Tuesday, August 1, 2023