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產品規格表 文件編號： 發行日期 4200A-SCS Parameter Analyzer Datasheet
1KW-60780-7
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技術文件 文件類型 發行日期 使用 4215-CVU 電容電壓設備進行 Femtofarad (1e-15F) 電容量測
本應用摘要介紹如何使用 4215-CVU 電容電壓設備進行 Femtofarad 電容量測。其中包括進行正確的連接，以及在 Clarius 軟體中使用正確的測試設定以獲得最佳量測結果。應用摘要 使用 4200A-SCS 參數分析儀進行 MOSFET 閘級電荷量測
簡介 功率 MOSFET 用於多種應用，並可作為高速開關使用。裝置的開關速度受內部電容影響，內部電容通常在產品規格表中以 Ciss 和 Coss 指定，其從輸入閘級和汲極電容 Cgs 和 Cgd 得出。除了指定電容以外，閘級電荷 (Qgs 和 Qgd) 也可用於評估 MOSFET 的開關效能。 JEDEC JESD24-2 標準「閘級電荷測試方法」中說明了一種測量 MOSFET 閘級電荷的方法。透過此方法可強制施加閘級電流，同時將閘級至源極電壓測量為時間的函數。從產生的閘級電壓波形中 …應用摘要 Making Three-Terminal Capacitance-Voltage Measurements Up to 400 V Using the 4200A-CVIV Multi-Switch Bias Tee Capability
This application note explains how the CISS, COSS and CRSS measurements are made using the bias tee capabilities in the 4200A-CVIV Multi-Switch. This application note also shows how the instrument DC output voltage was doubled from 200 V to 400 V for …應用摘要 Making Low Current Pulse I-V Measurements
This application note defines ultra-fast I-V, explains the fundamental limits of current measurements as a function of time and measure window, and describes the techniques for making ultra-fast I-V low current measurements.應用摘要 DC I-V and AC Impedance Testing of Organic FETs
This application note outlines how to optimize DC I-V and AC impedance measurements on OFETs using the 4200A-SCS Parameter Analyzer. Timing parameters, noise reduction, shielding, proper cabling, and other important measurement considerations for …應用摘要 Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU
Introduction The source measure unit (SMU) is an instrument that can source current or voltage, and measure both current and voltage. The SMU is used for I-V characterization of a wide variety of devices and materials, and is designed …應用摘要 Making Optimal Capacitance and AC Impedance Measurements with the 4200A-SCS Parameter Analyzer
Introduction Capacitance-voltage (C-V) and AC impedance measurements are commonly performed on many types of devices for a wide variety of applications. For example, C-V measurements are used to determine these device parameters: Gate oxide …應用摘要 Using the 4200A-CVIV Multi-Switch to Make High Voltage and High Current C-V Measurements
This application note explains the implementation of the bias tee modes of the 4200A-CVIV to make high voltage C-V measurement. It assumes the reader is familiar with making C-V measurements with the Keithley 4200A-SCS using the CVIV.應用摘要 1 ns Pulsing Solutions for Non-Volatile Memory Testing
Until recently, floating gate (FG) NAND flash memory technology has been successful in meeting the demand for non-volatile memory (NVM) devices for tablets and smartphones. However, there is increasing concern in the …技術簡介 Switching Between C-V and I-V Measurements Using the 4200A-CVIV Multi-Switch and 4200A-SCS Parameter Analyzer
Introduction Full parametric characterization of a semiconductor device usually requires an array of tests to gather all of the device's important parameters. Current-voltage (I-V) tests are used to determine device …應用摘要 Making van der Pauw Resistivity and Hall Voltage Measurements Using the 4200A-SCS Parameter Analyzer
This application note provides an overview of the van der Pauw and Hall effect measurement methods and how to use the built-in applications that are included with the 4200A-SCS Parameter Analyzer to perform these measurements.應用摘要 Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer
Introduction The continuing push for more devices on each chip and faster clock speeds is driving the demand for shrinking geometries, new materials, and novel technologies. All of these factors have a tremendous impact on the lifetime and …應用摘要
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軟體 文件類型 零件編號： 發行日期 4200A-SCS Clarius+ Software Suite V1.14.1
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer.If installing on a …應用 4200A-CLARIUS-V1.14.1 4200A-SCS Clarius+ Software Suite V1.14
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer.If installing on a …應用 4200A-CLARIUS-V1.14 4200A-SCS Clarius+ Software Suite V1.13
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer. If installing on a …應用 4200A-CLARIUS-V1.13 4200A-SCS Clarius+ Software Suite V1.3 (Legacy – Unsupported)
This legacy version of Clarius is made available for Windows 7 computers. For the latest version of Clarius+ please visit the 4200A-SCS Product Support page ( Product Support and Downloads | Tektronix ) and select Software. The 4200A-SCS Clarius+ …應用 4200A-CLARIUS-V1.3
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常見問答集 常見問答集 ID How can I measure hall mobility of 2D materials?
Hall mobility, or electron mobility, of a 2D material is best measured by utilizing the Hall effect. There are several different Keithley solutions for making Hall effect measurements. A Keithley 4200A-SCS Parameter Analyzer with 4 Source Measure …71221