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Technische Dokumente	Dokumenttyp	Veröffentlichungsdatum
9139B Probe Card Adapter Board Files This zip file contains files for fabrication of a 9139B-PCA (Probe Card Adapter) probe card. Files include a fabrication print and Gerber files.	Technische Daten	19 Jan 2022
High Voltage 1 kV Capacitance-Voltage Measurements with the Keithley S530-HV Parametric Test System Due to the complexities typically associated with high voltage (1 kV) capacitance wafer-level testing, 1 kV C-V testing is usually limited to characterization labs or manual benchtop setups that are separate from a fab’s standard production workflow …	Anwendungshinweis	21 Oct 2021
Making Microsecond Pulse and AC Measurements with the S530 Parametric Test System by Integrating 4200A-SCS Parameter Analyzer Applications This application note describes how to generate microsecond pulsed I-V sweeps and tests, as well as make AC impedance measurements, with the S530 Parametric Test System by calling built-in user libraries from the 4200A-SCS Parameter Analyzer in the …	Anwendungshinweis	23 Sep 2020
Protecting Parametric Test Systems and the Test Environment from Damaging Transient Overvoltages and Overcurrents Measuring breakdown parameters is increasingly required to predict a device’s safe region of operation. Sometimes, those breakdown conditions in reliability testing and breakdown test occur as a result of unexpected behaviors, such as a second …	Anwendungshinweis	21 Sep 2020
Programming and Erasing Flash Memory Devices Using the Keithley S530 Pulse Generator Option Introduction and Background Normally, in parametric test, the instrument used most is the Source Measurement Unit (SMU). The SMU allows supplying a DC voltage or current to the device under test (DUT) and …	Anwendungshinweis	21 Jul 2022
Performing van der Pauw Sheet Resistance Measurements Using the Keithley S530 Parametric Tester Accurate low voltage measurements are essential to many semiconductor tests. Often, test structures such as contact chains, vias, and metal structures have resistances on the order of tens to hundreds of milliohms. Measuring such small …	Anwendungshinweis	21 Jul 2022