Read this whitepaper to learn considerations for determining the best pass/fail limits for a given PCI Express® Gen 3 or Gen 4 Device Under Test (DUT). You’ll see how the TMT4 Margin Tester offers unique insights into PCIe testing due to the TMT4’s ability to form a link with the DUT during testing. The white paper compiles data from roughly 100,000 eye diagrams from over 50 combinations of commercially available PCIe Gen 3 and Gen 4 devices. The resulting tables and charts provide a reference for use in establishing an appropriate pass/fail eye mask for a given device. Read it, then learn more about Tektronix solutions for PCI Express testing.
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