Kontaktaufnahme
Live-Chat mit Tektronix-Vertretern. Verfügbar von 9 bis 17 Uhr CET Geschäftstage.
Anrufen
Kontaktieren Sie uns telefonisch unter
Verfügbar von 9 bis 17 Uhr CET Geschäftstage.
Download
Laden Sie Handbücher, Datenblätter, Software und vieles mehr herunter:
Feedback
Produktsupport und Downloads
Willkommen beim Tektronix-Produktsupport
Wir freuen uns, den ganzen Tag mit Ihnen über Technik zu sprechen, aber wir wissen, dass Sie es eilig haben. Daher haben wir es Ihnen leicht gemacht, Handbücher, Datenblätter und Software für alle unsere aktuellen Produkte und viele nicht mehr verfügbare Produkte herunterzuladen. Sagen Sie uns einfach, welches Produkt Sie verwenden, und wir zeigen Ihnen alles, was wir haben.
Das von Ihnen ausgesuchte Produkt kann derzeit gekauft werden. Außerdem stehen die folgenden Supportinformationen zur Verfügung.
-
Handbücher Handbuchtyp Teilenummer Veröffentlichungsdatum Keithley Instruments Safety Precautions
Safety Precautions PABenutzer 071341102 Model 6220 DC Current Source Model 6221 AC and DC Current Source User's Manual
Hauptbenutzer 622X-900-01C Model 6220 DC Current Source Model 6221 AC and DC Current Source Reference Manual
Benutzer 622X-901-01C
-
Technische Dokumente Dokumenttyp Veröffentlichungsdatum Four Step Error Checker Poster
This printable poster offers insight into errors commonly made when measuring low voltage, low current, low resistance, high resistance, or voltage from a high resistance source. Learn what can cause these errors, and get tips on how to avoid them.Poster Keithley Low Level Measurements Handbook - 7th Edition
The Keithley Low Level Measurements Handbook is a reference and guide for anyone looking to perform sensitive DC electrical measurements. Scroll down to find the section you need, or download the entire book as a PDF above. Once you click on each of …Produktartikel Electrical Measurements on Nanoscale Materials
This tutorial explains the importance of electrical measurements to the science of nanotechnology, and presents practical considerations in making these measurements. Topics include material and structural characteristics that can be …Technischer Artikel Pulse Testing for Nanoscale Devices
Technischer Artikel New dG Measurement Methods Reveal Nanodevice Characteristics Faster, at Lower Cost
Technischer Artikel AC Versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices
AC versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices Sensitive Measurement Needs Researchers today must measure mate-rial and device characteristics that involve very small currents and voltages. …Technischer Artikel Unraveling Fuel Cell Electrical Measurements
Technischer Artikel Low-Voltage Measurement Techniques
Introduction Electronics are continuing to shrink as consumers demand faster, more feature-rich products in ever-smaller form factors. Because of their small sizes, these electronic components usually have limited power handling …Technischer Artikel Hall Effect Measurements Essential for Characterizing High Carrier Mobility
The Hall effect can be observed when the combination of a magnetic field through a sample and a current along the length of the sample create an electrical current perpendicular to both the magnetic field and the current, which in turn …Technischer Artikel Problem: Noisy Readings in Low Resistance Measurements
Technischer Artikel Problem: Reading Drift in Low Resistance Measurements
Technischer Artikel Problem: Noisy Readings in High Resistance Measurements
Technischer Artikel Characterizing Nanoscale Devices with Differential Conductive Measurements
As modern electronics continue to shrink, researchers increasingly look to nanotechnology for breakthroughs in device size and power consumption. In these nanoscale devices, electrical characteristics are affected by quantum behavior …Technischer Artikel High Impedance Semiconductor Resistivity and Hall Effect Test Configurations
Broschüre The Emerging Challenges of Nanotechnology Testing
Nanotechnology is an important new area of research that promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. …Technischer Artikel
-
Software Dokumenttyp Teilenummer Veröffentlichungsdatum 6220/6221 Firmware Revision D04
Model 6220/6221 D04 Firmware Release.DO NOT install revision D firmware on instruments with revision A firmware.Firmware 6221-801D04 Keithley I/O Layer version C10 (Windows 10, 8, 7 Compatible)
Keithley I/O Layer version C10 (KIOL-850C10 adds support for Windows 10 Operating System and installs NI-VISA Runtime 17.5 and NI-ICP 17.0. This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL-850C05 …Anwendungsgebiet KIOL-850C10 Keithley I/O Layer - version C07 (Windows 8, 7, Vista, and XP Compatible)
Keithley I/O Layer version C07 (KIOL-850C07 adds a change to only send the :syst:rem command to RS-232 connections This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL-850C05, KIOL-850C06). This version …Anwendungsgebiet KIOL-850C07 6220/6221 Firmware Revision D03
6220/6221 D03 Firmware Installation Package (READ RELEASE NOTES FIRST)Firmware 6221-801D03 6220/6221 IVI Driver for Visual Basic (VB), VC/C++, Labview (LV) and LabWindows CVI, Rev. B01.1 (6.4Mb) - Requires Installation of Keithley I/O Layer (KIOL-850)
6220/1 IVI Driver Rev. B01.1Treiber 622X-855B011 Install v2.7 of the Free Example Software for the Models 6220/6221. (UNSUPPORTED)
Install v2.7 of the Free Example Software for the Models 6220/6221.Anwendungsgebiet 6220-EXMPL-2.7 6220/6221 Firmware Revision A05
6220/6221 A05 Firmware Installation PackageFirmware 6221-801A05 622x Native LabView 2009 Driver version 1.0.0 - Project Style
6220 & 6221 Native LabView 2009 Driver version 1.0.0 - project style.Treiber 622X-LV-1.0.0 6220/6221 Firmware revision A04
6220/6221 Firmware revision A04Firmware 6221-801A04
-
FAQs – Häufig gestellte Fragen FAQ-ID How can I measure hall mobility of 2D materials?
Hall mobility, or electron mobility, of a 2D material is best measured by utilizing the Hall effect. There are several different Keithley solutions for making Hall effect measurements. A Keithley 4200A-SCS Parameter Analyzer with 4 Source Measure …71221
