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  • 技術文件 文件類型 發行日期
    2470 高壓半導體裝置的崩潰和漏電流量測
    Keithley 長期以來在大功率半導體裝置測試中一直占有重要的地位。最近,Keithley 推出了 2470 1.1kV 圖形化 SourceMeter® 電源量測設備,以因應 SiC 和 GaN 裝置測試所面臨的各種挑戰性量測。本應用摘要中介紹了這種新型電源量測設備與 Keithley 的 KickStart 軟體在高壓半導體裝置測試中的應用。
    應用摘要
    Challenges in GaN HEMT Power Device DC Characterization
    GaN HEMT devices are very fast and efficient and have a unique structure and performance, but oscillation is one of the primary challenges with high frequency devices during the DC characterization. This application note discusses the oscillation …
    應用摘要
    Battery External Short Transport Safety Testing
    Introduction The electric vehicle market is one of the largest drivers of the increase in demand for rechargeable batteries. These batteries must meet not only tight performance specifications with regard to capacity and lifespan, but …
    應用摘要
    Battery Optimization using Keithley 2281S and 2380 and KickStart Battery Simulator App
    Introduction As battery-powered devices have become a staple of everyday life, battery performance has become a critical factor in device design. Single use, or primary, disposable batteries remain ubiquitous in their usage, often …
    應用摘要
    KickStart Software as a Bench Companion for Education
    The versatile Keithley KickStart Software platform meets a variety of different needs, which is incredibly beneficial for education applications due to the broad spectrum of topics covered in undergraduate and postgraduate studies.  This application …
    應用摘要
    Recommended Electronics Engineering Benches for Education
    Recommended Education Bench Configurations Start with one of these three configurations to create the bench best suited for your students Fundamental Teaching Lab Prepare …
    技術簡介
    DC I-V Characterization of MOSFET Devices Using KickStart Software
    Learn or review the details of some of the most common types of device transfer and characterization tests applied to metal oxide semiconductor field effect transistors (MOSFETs). This application note also presents itself as a graphic guide for how …
    應用摘要
    Analyzing Frequency Response Using the AFG31000, MDO3000, and Kickstart Software
    Frequency response of a circuit is a common method of analyzing a circuit’s behavior.  This application note details how Keithley’s Kickstart Software makes testing frequency response in a circuit simple, with apps for the AFG and oscilloscope and …
    應用摘要
    Supporting the Materials Research of the Future
    Advances in materials science are driving the future of many industries where the electrical properties of materials can reveal previously unknown materials characteristics.  This flyer highlights the Keithley instrumentation that is vital to helping …
    規格摘要表
    Wide Bandgap Device Reliability Testing with KickStart Software
    This application note discusses the purpose of reliability testing on wide bandgap semiconductor devices such as silicon carbide (SiC) and gallium nitride (GaN) and the test equipment needed for successful testing. Specifics are given on using …
    應用摘要
    Pulsed I-V Characterization of MOSFETs Using Keithley KickStart Software
    Introduction Manufacturers of transistor devices tend to start their design prototype evaluations to yield characteristic information, while still working in their research and design labs. While straight DC testing is …
    應用摘要
    Pulsed Characterization of HBLEDs Using Keithley KickStart Software
    This application note discusses the reasons why pulse-based testing might be beneficial for a semiconductor device and details the application of pulsed test for high-brightness LEDs. Specifics are provided for using Keithley KickStart Software to …
    應用摘要
    Measuring the Electrical Resistivity of Insulating Materials
    This application note explains how to make volume and surface resistivity measurements of insulators using the Keithley 6517B Electrometer/High Resistance Meter, 8009 Resistivity Test Fixture, and Kickstart High Resistivity Application that can be …
    應用摘要
    University of Oklahoma Case Study
    To get more students excited about engineering careers in RF and help them better understand Electromagnetics principles, University of Oklahoma Assistant Professor Jay McDaniel worked with Tektronix to devise a 10-workstation lab for experiential …
    個案研究
    Testing Laser Diode Modules and VCSELs with the 2601B-PULSE SMU and KickStart Software
    This application note examines the hardware and software tools that are required for testing laser diodes and vertical cavity surface emitting lasers in today's R&D labs.
    應用摘要