Current Language
×
French (France)

Sélectionnez une langue :

Activer le menu
Current Language
×
French (France)

Sélectionnez une langue :

Contactez-nous

Chat en direct avec un représentant Tek. Service disponible de 9 h à 17 h, CET jours ouvrables.

Téléphone

Appelez-nous au

Disponible de 9 h à 17 h CET jours ouvrables.

Télécharger

Télécharger des manuels, des fiches techniques, des logiciels, etc. :

TYPE DE TÉLÉCHARGEMENT
MODÈLE OU MOT CLÉ

Feedback

Correlation of Measurement and Simulation Results using IBIS-AMI Models on Measurement Instruments (DesignCon 2014)


Increasing serial bus data rates have resulted in requirements for de-embedding measurement circuits, embedding compliance channels, and applying reference equalizers to open closed data eyes for signal integrity evaluations.  To assist in the design task on these high speed buses, S-parameter and IBIS-AMI models are often used in the simulation environment to model silicon-specific behavior; while in the measurement environment, S-parameters and reference equalizers have been used.  The two different methodologies have led to correlation mismatches between measurement and simulation results.  A new technique enabling IBIS-AMI support in the measurement environment permits the acquisition of real-time data from the DUT to be run directly through a modeled receiver, enabling the evaluation of true receiver performance and overcoming correlation issues.