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2450

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SMU SourceMeter® série 2650 haute puissance de Keithley

Semi-conducteur de puissance GaN, SiC Test de panneaux solaires Études d'électromigration Caractérisation de la température de jonction des semiconducteurs

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Dernière mise à jour : Thursday, June 5, 2025
Datasheet
2461 SourceMeter SMU Instrument

The Model 2461 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips.

1KW-60288-2 | Date: Monday, January 05 2026
Datasheet
Series 2400 SourceMeter SMU Instruments

Keithley’s Series 2400 Source Measure Unit (SMU) Instruments are designed specifically for test applications that demand tightly coupled sourcing and measurement. All SourceMeter models provide precision voltage and current sourcing as well as …

1KW-2798-4 | Date: Monday, October 07 2024
Technical Document - Note d'application
Measuring Low Resistance Devices with High Current Using the Model 2460 SourceMeter SMU Instrument

Source Measure Unit (SMU) instruments or SourceMeter® instruments can simplify making low resistance measurements with high current stimulus. A SourceMeter instrument is capable of sourcing and measuring both current and voltage.

1KT-60883-0 | Date: Friday, September 16 2016
Datasheet
2470 Graphical SourceMeter SMU Instrument Datasheet

1KW-61523-0 | Date: Monday, January 05 2026
Technical Document - Note d'application
Re-Inventing High Power Semiconductor Device Characterization

This selection guide provides the information you need to select the best hardware and software for your power device characterization requirements.

1KW-29154-0 (Keithley Number 3216) | Date: Wednesday, March 20 2013
Datasheet
ACS Wafer Level Reliability Edition Datasheet

Keithley has taken the power of its Automated Characterization Suite (ACS) software and focused it on wafer level reliability (WLR) testing. ACS-WLRFL is an added functionality to ACS that leverages the measurement speed and system integration …

1KW-56418-3 | Date: Monday, December 04 2023
Technical Document - Note d'application
Using the Arbitrary Waveform Capabilities of the Series 2600B and Series 2650A System SourceMeter SMU Instruments to Perform Ford EMC Power Cycling Testing

Learn how to use a Source Measure Unit (SMU) with high-current arbitrary waveform capability for automotive power cycling testing. This app note describes a detailed procedure for performing Ford EMC-CS-2009.1 CI 230 Power Cycling Testing using the Keithley Series 2600B or Series 2650A System SourceMeter SMU instruments.

Date: Wednesday, December 03 2014
Technical Document - CAD Files
Model 2657A 3D CAD Models

Access the 3D CAD models for the Model 2657A 3D CAD Models, designed to support integration into mechanical layouts of test setups and laboratory environments. These files provide precise dimensional representations of the Model 2657A, aiding in the …

Date: Wednesday, December 17 2025
Technical Document - CAD Files
Model 2651A 3D CAD Models

Access the 3D CAD models for the Model 2651A 3D CAD Models, designed to support integration into mechanical layouts of test setups and laboratory environments. These files provide precise dimensional representations of the Model 2651A, aiding in the …

Date: Wednesday, December 17 2025